X-Series Platform

Configurations for Optimal Testing of DSP, Power, Automotive, Mixed Signal, & RF Applications

  • Key Features

    • market leading 0 pin infrastructure costs designed for mixed signal testing
    • cost effective, incremental investment
    • program and DUT site compatibility across the entire platform
    • RF port scalability to 40 ports and 8GHz (18GHz with Scalar Frequency Extender)
    • full featured mixed signal digital pins, up to 1024
    • tester-independent feature-rich software environment
    • broad range of DC instruments
    • DSP instruments support both modulation and DUT-centric testing
  • X-Series Solutions include

    • power & power management
    • automotive switches & sensors
    • audio: CODECS, amplifiers
    • printer drivers & motor controllers
    • automotive microcontrollers
    • DSP: digital, MS, analog
    • converters: precision, high speed, embedded and audio
    • WLAN, WiMAX, DVB, LTE, CDMA, Edge, WCDMA, bluetooth & other emerging standards
    • multiband RF power amplifiers, RF front end modules
    • highly integrated mobility devices, including SiP, SoC and single chip cell phones
    • application processor
    • wireless baseband

The X Series - the Solution for High Volume Mixed Signal Devices

The X-Series is a comprehensive semiconductor test platform, with industry leading mixed signal and digital instrumentation and configurations that range from 20 to 80 instrument slots. The X-Series test platform offers a range of configurations designed to provide low-cost testing of a broad range of devices used in mobile, power, automotive, industrial and instrumentation markets.  The X-Series has been designed to meet the challenges of testing a broad range of advanced mixed signal device technologies used in these markets.  It offers a large suite of DC, power, DSP, RF and digital instrumentation that can be configured into a true mixed signal infrastructure.

Tester Configurations to Match Your Requirements

The X-Series is offered in four different configurations, all based off the same instrumentation, software, system architecture and DUT interface.

The major difference between the various configurations is the slots available for instrumentation. The following summarizes the differences between the X-Series configurations:

  • LX 20 slot
  • MX 40 slot system
  • EX 80 slot system
  • PAx / PAx-ac; specialized configuration for RF PA and FEM testing

The X-Series allows selecting the ideal configuration for your specific requirements, providing a flexible solution with the right test performance and the right cost of test for each device in your portfolio.  Each configuration offers a comprehensive portfolio of DSP, DC and power instruments.

Learn more about the X-Series configurations

Learn more about the X-Series instruments