Innovative technology and a comprehensive product range for best cost of test
standard ICs and MEMS/sensor test and calibration
singulated packages and strip test
tri-temp range and ambient test
Fully integrated solutions
Test cell integration and validation
The process to continuous optimization:
Plug & Yield Test Cell
The Connected Test Cell
The Smart Test Cell
With leading technology and expertise in all critical elements of the test cell, Xcerra Corporation is able to provide our customers fully-integrated, pre-validated solutions including the tester, handler, device under test (DUT) interface board and contactors, which will take semiconductor test to the next level.
When conventional approaches for cost of test optimization – like capex reduction or increasing multisite – reach their limits, Xcerra TCI provides further gains in productivity.
Xcerra TCI ’pin to pin signal ownership’ ensures that test cells are able to significantly shorten time-to-volume and meet the requirements of fast ramping and fluctuating demands.
Exploiting the opportunities from new packaging trends and disruptive technologies require fastest adaptation. Xcerra TCI integration and pre-validation services will free-up customers‘ in-house resources and help them to strengthen their market position.
Xcerra TCI provides a process for continuous optimization.
Based on the well-accepted Multitest Plug & Yield® program, the “Plug & Yield Test Cell” is a complete, pre-qualified and pre-validated test cell combining performance optimized elements for faster time-to-volume and improved yield.
Looking ahead, the Connected Test Cell will focus on OEE and yield improvement, enabled by real-time data collection and analysis, predictive maintenance and fail-safe set-up features.
The Smart Test Cell will increase the automation level of final test operations based on an adaptive, self-learning system.
Learn more about Xcerra‘s offerings for semiconductor test:
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