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Enhancing Test Floor Performance and Quality: New options for the MT2168 XT

Xcerra’s MT2168 XT Semiconductor Test Handler now available with advanced Double Device Detection and Automatic Temperature Calibration

Xcerra has added two new optional features to the MT2168 XT pick-and-place handler. Both options target optimization of test floor processes, allowing the customer to deliver enhanced quality: the Double Device Detection (DDD) option increases binning integrity; the Automatic Temperature Calibration enables the customer to meet quality standards by calibrating as scheduled without time consuming manual processes.

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Testing Modules and Multi-Chip Packages in the Full Temperature Range

Xcerra’s MT2168 XT Semiconductor Test Handler installed as a flexible and efficient alternative to dedicated module test solutions

The Xcerra MT2168 XT pick-and-place handler was installed for a tri-temp module test application at a major player in global semiconductor manufacturing.  With its innovative features and highly flexible design the MT2168 XT meets the growing demand in high volume production for reliable and cost-efficient tri-temp test handling of multi-chip packages and modules in the automotive and consumer markets.

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Over-the-Air (OTA) Integrated Test Solution for Antenna in Package (AiP) 5G, Auto Radar, and WiFi Devices to > 80 GHz

Xcerra combines innovative contacting technology with reliable test handling solution

Multitest recently delivered a production interface solution to a customer for OTA testing of a 60 GHz UltraGig single-chip integrated Antenna in Package (AiP). The solution integrates the xWave OTA Contactor with xWave patch antenna in the MT2168XT leadbacker.

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Enhancing IC Production Quality: Multitest MT2168 Pick-and-Place Handler option for avoiding ESD pre-damages

The Multitest MT2168 pick-and-place handler now offers a ground fault monitoring option. The ground fault monitoring option is part of a feature set that will enhance the value of the production output at the customer site. Ground fault monitoring is an important feature for meeting advanced quality standards. Read more

Relying on Leading Test Handling Know-How: Rapid Acceptance of the New MT2168 XT Handler by the Market

Four majors IDMs decide for the MT2168 XT

Multitest has received multiple orders for the new tri-temp pick and place handler, the MT2168 XT. Shortly after its official introduction to the market four global IDMs have chosen the MT2168 XT for their volume production.

After comprehensive demos or onsite evaluations customers have chosen the MT2168 XT because of its temperature performance, high multisite capabilities, flexibility, and small floor space requirements. The MT2168 XT is considered a platform not only to address today’s requirements for highly reliable and cost-efficient test handling, but also because it offers great flexibility and an innovative architecture to support future needs.

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Small Packages on Multitest Pick and Place Handlers

Multitest MT2168 and MT9510: Ready for Packages below 3 x 3 mm

Multitest expanded the package range for both pick and place handler platforms – the MT9510 and MT2168 to devices smaller than 3 x 3 mm. The expanded package portfolios of the MT9510 and MT12168 go beyond the typical ranges of established pick and place systems.

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Combining Leading Temperature Performance with Highest Flexibility for Pick and Place Handling

Multitest has shipped the first MT2168 XT for ambient/hot/cold applications

Multitest shipped the first MT2168 XT tri-temp pick and place handler to a major IDM. The MT2168 XT combines the innovative architecture of the MT2168 ambient/hot handler with leading temperature test performance, for which Multitest has been known for decades. The MT2168 XT offers greatest flexibility and best performance for highest return on investment and lowest cost of test.

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Ensuring Temperature Accuracy for Testing of High Pin Count Packages

Multitest MT2168 Pick-and-Place Handler offers advanced temperature control features

The Multitest MT2168 pick-and-place handler now offers an optional active socket purge (ASP). The ASP completes the portfolio of advanced temperature control features of the MT2168, which include Active Temperature Control (ATC), Cold Test for Characterization on the ambient / hot base handler version and now the ASP.

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One Insertion for Testing at Multiple Set Temperatures

Multitest MT2168 Pick-and-Place Handler offers multi-temperature testing within one plunger cycle

The Multitest MT2168 pick-and-place handler now offers multi-temperature test with only one insertion. The highly dynamic temperature control allows for testing at multiple set temperatures within one plunger cycle. This new feature particularly addresses the requirements in design and engineering sites.

The fast and accurate changes of the set temperatures are based on the chamberless soaking solution in the contact unit of the MT2168. This design allows for exact thermal measurements and prompt temperatures adjustments for each device under test.

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Cost-efficient and Flexible Solution for Managing Power Dissipation

Multitest ATC for the MT2168 Pick-and-Place Handler

The Multitest ATC option for the MT2168 pick-and-place handler offers a most cost-efficient and flexible solution for managing low to medium range power dissipation at multisite test cells with up to 16 sites. Multitest ATC is an easy add-on to the standard MT2168, which can be mounted and demounted effortless. Multitest ATC is an affordable, reliable and flexible solution for test development and high volume production.

In the past power dissipation was recognized as an issue for high performance server, processor and graphic applications. Today package density and integration increases more and more to achieve higher speed and save space particularly in mobile applications. The power dissipation here is significantly less than in the high performance applications. However, thermal stress may damage the packages, temperature test may be distorted and test repeatability and yield lost. Additionally, there is a higher cost pressure for this market, which requires best cost of test configurations.

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