Seamless switch to higher-yield probes
Multitest recently passed an evaluation of new-super-sharp Gemini Kelvin (GMK) probes. The evaluation took place at an OSAT testing devices for a major customer. Although the customer was not experiencing issues with the original GMK probes, they were encouraged to try the super-sharp probes and saw a measurable improvement in both test yield and probe life. The OSAT plans to order all super-sharp probes going forward to help reduce costs and increase throughput.
As Multitest designed and fabricated finer-pitch probes over the last few years, those probes were made super sharp in order to provide adequate pressure at the contact point with the lower force developed by the smaller springs. The super-sharp probes were released to the field after the standard, rigorous internal testing. They have been in high-volume production test for several years now, and have demonstrated excellent performance.
Since then, Multitest has updated the designs of some probes to have super-sharp tips for applications where it was difficult to maintain low and consistent contact resistance (RC). The super-sharp probes exhibited the anticipated improvement in performance and continue to perform well in these applications, extending the useful life of the probes. Based on internal testing and this field data, Multitest is encouraging customers to make the seamless switch to sharp-tip styles at no increase in cost.
Senior Product Manager Bert Brost says “While the GMK product was doing a good job, we decided to make it better without any incremental cost for the customer. Making it better means increasing the customer’s throughput, increasing the customer’s system run times between cleaning, and increasing the customer’s first pass yields.”
To learn more about the Gemini Kelvin contactor, please visit http://multitest.com/geminikelvin