Spring Probes

  • Expanding the Limits of Test

    • for in-circuit test and functional test. OEM and industrial
    • higher quality, longer life, and better performance
    • innovation through technology

  • CSP-30 RF Product Line

    • precisely-controlled physical and electrical characteristics
    • high bandwidth up to 20 GHz @ -1 dB
  • LFRE Product Line

    • for RoHS compliant boards
    • for lead-free solder test points
  • POGO® Product Line

    • high performance ICT /FCT probe
    • features the POGO® Plus Bias Ball design
  • BRUTE High Current Product Line

    • up to 150 Amp
    • optimized materials and design parameters

Everett Charles Technologies Contact Product Group has been a leader in the development of advanced test products since 1965. The line of products includes signature POGO® Spring Contact Probes, loaded and bare board probes, battery interconnects, RF and high current test probes and semiconductor test products. ECT continues to expand the limits of test technology with innovative probe designs that deliver higher quality, longer life, and better performance.

The ICT/FCT product line, which includes LFRE, POGO® Plus, Pylon® and long travel probes, addresses the unique demands of loaded board and vacuum fixture applications. ECT developed various features to optimize the probe performance: bias-ball design, proprietary plating processes and the precision MicroSharp™ tip.

To read more about ECT‘s spring probes visit https://ect-cpg.com/spring-probes