Nexus Contactor – WLCSP Probe Head

Advanced Performance for WLCSP Test

  • Features

    • high bandwidth for next generation devices
    • extra strength 3D MEMS tip
    • short signal path for low-noise, high-fidelity contacting
    • single piece conductor for two point for improved Rc repeatability
    • excellent contact resistance repeatability over hundreds of thousands of insertions
    • high frequency >12 GHz @ -1 dB
    • highly integrated devices
    • high frequency requirement
    • high volume parallelism
    • automated and manual test
  • Benefits

    • lab and volume production test
    • single site and multisite
    • bumped die, bumped wafer
    • low interconnect induced jitter
    • long uninterrupted test runs
    • site-to-site consistency on a global scale
    • low and stable R reduces measurement variability in test