MiCon Contactor

Proven Cantilever Technology for MCUs and ASICs

  • Features

    • matches existing spring pin test boards for an easy and cost-efficient conversion
    • extended compliance window
    • contact motion decoupled from the test board
    • proven self-cleaning wipe
    • durable one piece design
    • low and stable contact resistance
    • high current carrying capability
    • extended temperature range
  • Benefits

    • boosted first pass yield
    • enhanced production reliability
    • testing at full specification values
    • improved Overall Equipment Efficiency (OEE)
    • extended maintenance intervals
    • reduced cost of test