Diamondx Instruments

  • For testing today´s

    • 8/16/32-bit MCUs
    • consumer ICs
    • cellular baseband
    • applications processors
    • integrated RF ASSP and SiP
  • Diamondx Instrumentation

    • ATMPx – Analog Time Measurement Processor
    • AT1x – Automotive Test Composite Pin
    • DCTMx: Precision Data Converter Test Module
    • DPIN-96 – High-Value Solution for Testing Digital and Mixed-Signal Devices
    • DPS16  – Device Power Supply
    • DPS1x – High Performance Device Power Supply
    • Dragon RF – RF Test Solution for the Complete Spectrum of Connectivity and Mobility Standards
    • FPVIx – High Voltage, High Current Floating Programmable Power Supply
    • GX1x – General-Purpose Digital Instrument for Digital ASSP, Analog ASSP and MCU Digital Testing
    • HDVI – High Density Voltage/Current Floating Programmable Power Supply
    • HPVIx – High Power Voltage/Current Programmable Power Source
    • HS1x – Scalable, Cost-Efficient Solution for High Performance SerDes Test
    • HSIO: 8 Lane SerDes Instrument for Testing of High Speed Serial Interfaces
    • MP1x – Optimized Solution for LVDS Port and DDR Memory Port Test
    • Multi-Wave – Highly Integrated Mixed-Signal Instrument for Multisite and Concurrent Testing
    • Nighthawk CT – Ultra Compact RF Instrument
    • PD1x / PD2x – Test Solution for Ultra High Definition Display Driver ICs
    • PMVIx – Voltage/Current Source for Mobile Power Management, ASSP, Automotive and MCU ICs
    • VIS16 – Precision Voltage/Current Source and Measurement with Advanced Features

A variety of instruments make the Diamondx suitable for testing today’s cellular baseband, applications processors and integrated RF ASSP and SiP.

Composite Instrumentation

AT1x
Automotive Test Composite Pin

  • Composite Pin Instrument allowing for testing CAN and LIN, that conforms to SAE standards required for these automotive products
  • reduced loadboard complexity through CAN and LIN loads and LIN driver, along with integrated switch paths for multiple resouces to DUT pin connections
  • transient detect capability to capture pertubations at the device in program development or production test

download the product brochure here

DC and Power Instrumentation

DPS16 Device Power Supply
16-Channel Device Power Supply Instrument

  • continuous voltage source
  • voltage and current measurement
  • Diamond software support

download the product brochure here

DPS1x
High Performance Device Power Supply

  • multisite testing of multi-core application processors and other high current, low voltage devices
  • drop-in replacement for DPS16 with enhanced capabilities

download the product brochure here

FPVIx:
High Voltage, High Current Floating Programmable Power Supply

  • fast throughput with high power pulsed mode operation
  • transient detect capability to capture pertubations at the device in program development, or production test
  • reduced loadboard complexity using the SmartMux for high voltage and current signal routing
  • expert mode to maximize energy efficiency of the instrument

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HDVI:
High Density Voltage Current Instrument for Massive Multisite Test

  • highest V/I pin density in the industry
  • voltage/current supply (VIS) mode
  • precision analog source (PAS) mode
  • flexible triggering options
  • external input matrix

download the product brochure here

HPVIx:
High Power Voltage/Current Programmable Power Source

  • fast throughput with high power pulsed mode operation
  • transient detect capability to capture pertubations at the device in program development, or production test
  • reduced loadboard complexity using the SmartMux for high voltage and current signal routing

download the product brochure here

PD1x / PD2x
Test Solution for Ultra High Definition Display Driver ICs

  • integrated display drivers for mobile and tablet applications, including touch and display driver integration (TDDI)
  • large panel television and monitor applications, including ultra-high definition and 240Hz refresh rate
  • industrial and automotive display drivers

download the product brochure here

PMVIx:
Voltage/Current Source for Mobile Power Management, ASSP, Automotive and MCU ICs

  • meets the test challenges of integrated mobile power management devices with dozens of DC-DC and linear regulators ranging from under 100 mA to several amps.

download the product brochure here

VIS16:
Precision Voltage/Current Source and Measurement with Advanced Features

  • V/I source mode
  • AWG and digitizer functions
  • time measurement
  • differential voltage measurement
  • timers, triggers and gates
  • alarms

download the product brochure here

Digital Instrumentation

DPIN-96:
High-Value Solution for Testing Digital and Mixed-Signal Devices

  • flexible timing
  • reconfigurable pattern memory
  • deep capture memory
  • high-precision PMU
  • built-in time measurement
  • super voltage
  • comprehensive software tools

download the product brochure here

GX1x:
General-Purpose Digital Instrument for Digital ASSP, Analog ASSP and MCU Digital Testing

  • flexible pattern memory allocations
  • multiple pattern generation
  • transmit and receive of digitized waveforms
  • pattern synchronization and control of DC and AC analog test instruments

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MP1x:
Optimized Solution for LVDS Port and DDR Memory Port Test

  • matching the interface structure and requirements of a DDR memory controller for simplified DUT boards
  • supporting built-in memory protocol support
  • same cycle match capability to support for data latency of up to 8 cycles

download the product brochure here

Mixed Signal / DSP Instrumentation

Multi-Wave:
Highly Integrated Mixed-Signal Instrument for Multisite and Concurrent Testing

  • wide bandwidth analog source
  • wide bandwidth analog capture
  • flexible triggering
  • high-precision PMU
  • protected I/O channels
  • simpler test boards
  • mixed-signal software support

download the product brochure here

DCTMx:
Precision Data Converter Test Module

  • precision linearity to 1 ppm
  • single-ended, differential, and pseudo-differential connection
  • testing ADCs and DACs, and class-D amplifiers with a single instrument

download the product brochure here

RF Instrumentation

DragonRF:
RF test solution for the complete spectrum of connectivity and mobility standards

  • extensive suite of new capabilities designed to provide the lowest cost of test without any compromise in RF test performance
  • innovative flexible architecture enables lower priced configurations without trade off in test coverage or test time

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Nighthawk CT:
Ultra compact RF instrument

  • comprehensive set of RF features at a fraction of the price of traditional RF ATE systems
  • highest throughput
  • low operating cost
  • portable between Xcerra test systems

download the product brochure here

SerDes Instrumentation

HS1x
Scalable, Cost-Efficient Solution for High Performance SerDes Test

  • physical layer testing with built in PRBS BERT TX/RX
  • BIST/DFT testing using high bandwidth drive/compare memory
  • protocol level and mixed-signal testing using deep send pattern memory

download the product brochure here

HSIO:
8 Lane SerDes Instrument for Testing of High Speed Serial Interfaces

  • physical layer testing with built in  PRBS BERT TX/RX
  • BIST/DFT testing using high bandwidth drive/compare memory
  • protocol level testing using deep send and receive pattern memories

download the product brochure here

Time Measurement Instrumentation

ATMPx
Analog Time Measurement Processor

  • flexible timing measurements through per-pin programmable comparator levels and programmable hysteresis
  • reduced loadboard complexity using the SmartMux for high voltage timing measurements

download the product brochure here