Diamondx Test System

The Next Generation Test Platform for ASSP And MCUs

  • Highlights

    • low cost of operations
    • high throughput
    • proven test capabilities
    • universal slot architecture
  • Key Features

    • small footprint
    • energy efficient, air cooled infrastructure and instruments
    • compliance with Integrated Multi-system Architecture (IMA) technology
    • extremely high speed data bus, based on PCI-Express-2 Industry Standard
  • Diamondx Architecture and Instrumentation

    • universal slot architecture supports 20-slot, 40-slot and 60-slot configurations
    • concurrent test support, enabling the testing of multiple digital ports, SerDes, analog and RF in parallel
    • PCI-Express2 Data Bus configured for up to 80 Gpbs bi-direction transfer between system CPU and test-head
    • IMA compliance; the ability to integrate multiple Diamondx test heads on-site, bringing the ability to scale the test head slot count up to meet pin count requirements of

Diamondx, the Low Cost-of-Test Solution for the Most Challenging Applications

The Diamondx test platform extends Xcerra’s low-cost, high-throughput production test solution platforms to high pin count, higher site count wireless, mobility, consumer ASSP and microcontrollers. Designed to meet the cost drivers IC companies face, Diamondx extends Xcerra’s leadership in lowering the cost of operations. Proven test capability from the widely accepted Diamond10 and X-Series test platforms bring high-density digital, DC, analog instruments as well as technology leading precision analog, SerDes and RF test to the Diamondx test system, making it suitable for testing today’s cellular baseband, applications processors and integrated RF Transceivers & RF-SOC ASSP and SiP.

Capable of Testing a Broad Range of Device Types

Additionally, the Diamondx will continue to be the low cost test provider for testing consumer ASSP; BlueRay DVD player/recorder, High Definition DTV and STB demodulators and decoders, baseband and applications processor devices, PC peripherals ASSP, RF Connectivity ICs as well as 8/16/32-bit microcontrollers, with an architecture to also support increasing test process complexity, like adaptive test, unit level traceability and concurrent test.

Flexible Architecture Provides for High Parallel Test Capability

Diamondx is a universal slot architecture that allows for 20-slot, 40-slot and 60-slot configurations which can be upgraded on the production floor, using Xcerra’s IMA (Integrated Multi-System Architecture) technology. In addition, Diamondx can accommodate over 10,000 pins and can be configured with a variety of instruments.