Efficient and reliable solutions for best cost of test
- contactors for the HED, RF, mixed signal and automotive market
Contactors
for best cost of test by optimizing yield, lifespan and cleaning cycles
The most comprehensive portfolio combines Cantilever and Vertical Probe Solutions
- kelvin test
- RF test
- wafer-level test
- test of 3D packages
To read more about Multitest contactors visit http://www.multitest.com/contactors
Multitest contacting solutions leverage the long term experience in spring probe and Cantilever pins to ensure best cost of test by optimizing yield, life span and cleaning cycles.
Multitest contactors are well-established for Kelvin, RF, mixed signal and automotive applications. They are deployed for test of standard ICs, MEMS and 3D packages. Multitest has developed leading edge solutions for high power requirements as well as for fine pitch packages.
To read more about Multitest contactors visit
