PogoPins – Radial

High-Performance, Cost-Effective Contactors for High-Volume Production Test

  • Benefits

    • low initial cost
    • long probe life
    • easy field maintenance
    • high electrical performance
    • high test yields
    • low overall cost of test
  • Key Features

    • traditional single and double ended design
    • high current carrying capacity
    • excellent RF performance
    • low contact resistance
    • excellent compliance – up to 0.76 mm
    • electrical performance for engineering characterization
    • mechanically robust for long life in high-volume production test
  • Applications

    • area arrays: BGA devices down to 0.4 mm pitch
    • pad contact: QFN, DFN, LGA devices down to 0.4 mm pitch
    • peripherally-leaded: QFP, SO devices down to 0.4 mm pitch
    • singulated devices, strip test, and wafer-level test

Established an Industry Standard

ECT’s PogoPlus(POGO®) pins revolutionized the probe industry when they were developed over three decades ago to meet demand for high performance test contactors at a lower price point. Since their initial development, ECT’s Pogo series has undergone constant optimization and refinement in tip shape and pitch reduction and now includes probes for specialized applications involving Kelvin contact and high RF performance. These high quality, reliable probes, combined with Xcerra’s worldwide customer support resources, ensure maximum OEE for customers.

Features

External springs (Bantam) provide excellent force and compliance characteristics in short probes. Proprietary designs can handle higher current, in parallel with low contact resistance and inductance.

Advantages

The features described above result in several advantages. High forces provide the pressure necessary to penetrate oxides and debris to make low-resistance contact to solder or other plating on device contact points. Short probes are more capable of efficiently transmitting high-frequency signals. Excellent plating quality means low internal resistance, lubricity of internal contact points, and long probe life.

Benefits

There is really only one benefit: Low cost of ownership. The advantages listed above result in low initial cost, high test yields, and long probe life – all the necessary ingredients for low cost of ownership.

And these benefits are available in contactors that support a huge variety of device types, plating, pitches and application requirements.