BlueLine – Cantilever

Highest Performance at Best Cost of Test for Microcontroller & Analog

  • Benefits

    • boosted first pass yield
    • enhanced production reliability
    • testing at full specification values
    • improved Overall Equipment Efficiency (OEE)
    • extended maintenance intervals
    • reduced cost of test
  • Key Features

    • contact motion decoupled from the test board
    • proven self-cleaning wipe
    • durable one piece design
    • low and stable contact resistance
    • high current carrying capability
    • extended temperature range
    • large compliance window
  • Applications

    • microcontroller & analog – non Kelvin
    • high volume production
    • engineering characterization
    • peripherally-leaded: QFP, SO, SOT and TO
    • pad contact: QFN and DFN
    • singulated devices and strip test

Concept

The BlueLine cantilever contactors are developed and optimized for microcontroller and analog applications with the objective to reduce cost of test and to enable testing at full specification values.

Advantages

All BlueLine cantilever contactors are durable one piece contact springs, which shows a great advantage in cost of test and testing at full specification values. Moreover the concept of a one piece contactor enables an extreme current carrying capability and improved overall equipment efficiency (OEE).

A further advantage is the proven self-cleaning wipe to break through oxide and debris and to clean the tip with each insertion to maintain a low and stable contact resistance.

In addition the large compliance window means less sensitivity against tolerances on package and setup in order to improve first pass yield and enhance production reliability.

Features

The durable one piece design combined with the proven self-cleaning wipe enable a low and stable contact resistance, a high current carrying capability and an extended temperature range.

Benefits

The BlueLine cantilever contactors are developed and optimized to reduce cost of test. This is the result of a boosted first pass yield, enhanced production reliability, improved OEE and extended maintenance intervals.

Moreover testing at full specification values like high current and tri-temp with extreme temperature ranges are no longer a limitation.