ECT has transitioned it’s Quality Management System from ISO 9001:2008 to ISO 9001:2015. ECT’s Quality Management System (QMS) has been rooted in ISO 9001 requirements since 1995. This means all of ECT’s internal processes are geared toward fully satisfying customer requirements while giving additional assurance that ECT’s internal systems are being constantly evaluated to reduce risk and waste while increasing product quality and consistency.
Xcerra to deliver a complete and fully integrated test cell for barometric pressure sensors
Xcerra, with its recognized industry-leading suite of flexible and cost-effective MEMS test cell offerings, announced today that a leading global manufacturer of high-quality electronic components located in Japan, has placed an order for a complete test cell for barometric pressure sensors. The business represents the first test cell solution sold into Japan and further validates the value customers see in the test cell solution approach for this high volume market. The Xcerra test cell solution includes the LTX-Credence Diamondx tester, a Multitest InStrip handler based on InCarriers and a Multitest InBaro test module.
The customer chose the Xcerra TCI solution, because it offers faster time to volume, cost-efficiency and high throughput, all of which are mandatory for being successful in the high volume customer market. Combining its expertise in ATE, test handling and interface solutions, Xcerra is able to provide a fully integrated and prevalidated test cell for highly accurate test of barometric pressure sensor devices. The test cell solution includes the InBaro module, a proven solution for accurate barometric sensor test with high throughput and stability, the Diamondx test platform, a flexible SOC tester which provides for cost-effective and high efficiency multisite test and the InCarrier which offers high parallelism and reliable handling for sensitive and challenging packages.
In addition to this new business in Japan Xcerra has already delivered complete test cell solutions to IDMs and OSATs in Asia, Europe and North America.
To learn more about the Xcerra Test Cell Innovation, please visit https://xcerra.com/tci
Xcerra Corporation is pleased to announce the establishment of a direct presence in Taiwan with the opening of our Xcerra development center (XDC) in Zhubei City. The XDC will provide prompt, high level technical support for customers in the region and beyond. When fully staffed it will include qualified persons for performing activities such as production engineering and interfacing, advanced applications support, technical product marketing, and business development. The XDC will also provide support to Spirox Corporation, our distributor in Taiwan, who remains the primary conduit for the sale and service of Xcerra semiconductor test products in Taiwan.
XDC will work closely with the product engineering groups to help align Xcerra’s product roadmaps with local customers’ future high-volume production test requirements. There will be an accelerated response time to support our customers and Spirox because we no longer will need to fly support in from other regions. A local Xcerra team will enable us to be engaged in business development activities day to day to help us grow the customer base. There will be more technical resources that are aligned with international drivers into the region. It allows Xcerra to improve communications between customers and Xcerra engineering and support teams, resulting in i) expediting response times, ii) shortening the “time-to-resolution” factor, iii) providing heightened skill set in region with direct access to Xcerra, and iv) providing a path for customers to learn more about our test systems from same-language experts and having a local apps force that can guide customers in maximizing the architectural benefits of Xcerra products.
The facility is located in Zhubei City close to Hsinchu Park and the HSR Station, and includes a test engineering lab featuring Xcerra’s Diamondx and X Series testers. The facility is operational and ready to support customers in a wide range of technologies including automotive radar, IoT, mobility and display driver ICs.
Xcerra Development Center (XDC)
No. 108, Sec. 2, Wenxing Rd, Zhubei City,
Hsinchu Country 30274, Taiwan, R.O.C.
ECT works with GrabCAD to facilitate access to product drawings
Everett Charles Technologies, the leader in Contact Spring Probes, is providing its customers another solution to find and download their CAD model drawings. ECT has joined GrabCAD, the largest online community of professional engineers, designers and manufacturers. GrabCAD.com is a secure and convenient platform with over 4 million members sharing CAD files and professional tips. Read more
Multitest adds “Super-Sharp” option to Quad Tech probes
Multitest’s Super-Sharp Option for Quad Tech probes provides an increase in test cell throughput and maintains the fidelity of the test signal over longer uninterrupted run times for higher yields. Multitest makes these advantages available to customers at no additional cost.
Search Competitor Parts, Download Specs, CAD drawings, ISO and Order Probes
In the past 12 months ECT has provided multiple new tools to its e-commerce website (shop.ect-cpg.com) including: a competitor cross reference tool; revamped search functionality; the ability to download ISO, mechanical, CAD drawings, and probe/tip replacement instructions; and a new shopping cart to make a purchase or request a quote.
ECT switch probes are cost effective and reliable solutions for non-destructive testing to verify the presence of components or contact leads within a connector assembly. ECT offers proven off-the-shelf options and a large portfolio of custom switch probes. ECT’s experience and design standards combined with its knowledge of materials and platings allows for the quick alignment of probe features with project requirements. ECT switch probes are replaceable by using of one of many receptacle termination options. Customers can choose from gold or nickel plated plungers.
New Generation Flying Probe Test and Innovative Grid Test Equipment
atg Luther & Maelzer will exhibit its leading test solutions for PCBs at the upcoming HKPCA & IPC 2017 show scheduled to take place on December 6 – 8, 2017 at the Shenzhen Convention & Exhibition Center, China.
mmWave customer case presented at Test Vision
Multitest’s mmWave contactor is a proven broadband production solution for RF applications up to 100 GHz. In a presentation by Jeffrey Finder, Senior Product and Test Engineering Manager at NXP, named “Building a Test Ecosystem for High Volume Manufacturing of 76-81 GHz Semiconductor Radar Sensors” the repeatable and stable performance of mmWave contactor was highlighted for an Automotive Radar Sensor Chipset application. This presentation was given at the Test Vision 2020 workshop at Semicon West in July 2017.
Multitest InWaferX for final test of singulated WLCSPs
Multitest’s new InWaferX final test solution for singulated WLCSPs addresses the increased quality demand for automotive applications as these quality requirements are expanding to cost sensitive, high volume consumer applications. Based on the production proven InCarrier technology, InWaferX ensures highest efficiency and yield for lowest cost of test.