Most Reliable and Maintenance-Free Fixtures for PCBA Testing

Everett Charles Technologies introduces the ECT Pneumatic Dual Stage Fixture

Everett Charles Technologies (ECT) introduces a new vacuum actuated test mechanism: the ECT Pneumatic Dual Stage Fixture. This new test fixture ensures predictable and reliable operation in high volume production, cycle after cycle.

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Meeting the Requirements of Lead Free PCBA Testing

Everett Charles Technologies Enhances LFRE Product Line: Lead Free Long Travel Probes (LFLT)

Everett Charles Technologies (ECT) extended the probe offering (LFRE probes) for lead free PCB in-circuit and functional test applications to include long-travel probes (LFLT probes). ECT LFLT probes have almost twice the compliance as standard length probes. The new long-travel probes meet the need for reliable contact solutions for lead free dual-stage in-circuit test fixtures.

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atg Luther & Maelzer releases the A8a

A new generation of automated highs speed flying probe PCB testers

The new A8a test system combines the flexibility of flying probe testers with high throughput. The A8a provides significant cost advantages compared to fixture testers for small and medium batches and fully meets the requirements in its main application field: The electrical test of HDI products for smart phones, tablet and PC motherboards.

The A8a ensures best productivity, most efficient operation and best test quality and accuracy. It is equipped with eight test heads and four cameras for optical alignment. The A8a is able to test pad sizes down to 35 micron. Testing HDI products for smart phones, tablet and PC motherboards up to a test area of 18.0” x 12.0” on the A8a, it also eliminates limitations of test point density or fine-pitch contacts.

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Reliable Probes for Most Challenging High Current Testing

Everett Charles Technologies Introduces H375 High Current Probes

Everett Charles Technologies (ECT) introduces the latest addition to our versatile family of high current probes; the HC375. The HC375 is rated at 100 Amps DC and is designed for the most challenging applications in a broad range of industrial test including transportation, automotive, power grid, military and PCB test.

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atg Luther & Maelzer to exhibit at HKPCA Show 2014

Comprehensive Portfolio of Leading Solutions for Bare Board Test

atg Luther & Maelzer will exhibit its advanced PCB test solutions at the upcoming HKPCA show, scheduled to take place December 3-5, 2014 at the Shenzhen Convention & Exhibition Centre, Shenzhen, China.

At HKPCA, atg Luther & Maelzer will showcase their leading product portfolio of flying probe and universal grid test systems.

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Multitest’s MEMS and Sensor Test and Calibration Portfolio Supports the Increasing Functionalities of Mobile Phones

Multitest meets performance and cost requirements of today‘s mobile applications

The Multitest has been providing MEMS and sensor test and calibration equipment for more than ten years. Originally driven by the automotive market Multitest continuously expanded the product offering to meet the needs of consumer and mobility applications. Today Multitest provides solutions for accelerometers, gyroscopes, pressure and gas sensors, humidity sensors, magnetometers, microphones, optical sensors and oscillators. The set-ups cover test of singulated packages, high-parallel testing up to multi-DOF test.

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MT2168: Package Characterization at Cold Conditions

Leveraging the benchmark for ambient/hot test for tri-temp qualification

The Multitest MT2168 pick and place handler now offers the ability to characterize devices at cold conditions. This addresses the evolving requirements for temperature performance driven by applications in the end markets. Whereas final test of the respective devices in high volume production will only be done at ambient/hot, they need to get qualified for cold conditions before they ramp. The “Cold for Characterization” option of the MT2168 allows for using the one platform for qualification and final test without the need to invest in more complex and more expensive tri-temp test equipment.

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ECT Improving Performance and Reliability for PCBA Test and Industrial Applications

Everett Charles Technologies Launches l40 Tip Style

Everett Charles Technologies (ECT) launches the new l40 tip style. The innovative geometry of the l40 tip ensures best yield and reliability and overcomes the challenges of contacting lead free solder or OSP treated copper.

Lead free solder and OSP treated copper present a harder or more abrasive contact surface causing excessive plating and probe tip wear. The l40‘s advanced off axis tip geometry machining methodology was designed to improve tip wear and resistance to tip fracturing. l40 tip style offers a more robust probe design and a longer tip life. The l40‘s straight shaft lance with a 40° facet combines the penetration capability of a sharp tip probe while providing added material behind the tip to increase strength.

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atg Luther & Maelzer to exhibit at TPCA Show 2014

Leading Bare Board PCB Test Solutions – Testing the Limits

atg Luther & Maelzer will exhibit its leading PCB test solutions at the upcoming TPCA show, scheduled to take place October 22-24, 2014 at the Nangang Exhibition Center Taipei, Taiwan.

At the show, atg Luther & Maelzer will showcase the latest product of their industry leading flying probe product line: A8-8 Flying Probe Tester

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ECT Launches Versatile RF Probes Semiconductor Test

Z1 and Z0 Probes leverages ECT‘s flat technology to achieve the next level performance

Everett Charles Technologies (ECT) launches two new members of the ZIP™ probe family designed to meet signal integrity challenges driven by the ever increasing speed of semiconductors devices. Z0 and Z1 probes are a cost effective solution that provide excellent mechanical reliability and electrical performance.

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