Over-the-Air (OTA) Integrated Test Solution for Antenna in Package (AiP) 5G, Auto Radar, and WiFi Devices to > 80 GHz

Xcerra combines innovative contacting technology with reliable test handling solution

Multitest recently delivered a production interface solution to a customer for OTA testing of a 60 GHz UltraGig single-chip integrated Antenna in Package (AiP). The solution integrates the xWave OTA Contactor with xWave patch antenna in the MT2168XT leadbacker.

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Smart Maintenance Mechanics Ensure Significantly Higher Uptime: Multitest Quick Lock for Test Sockets

Multitest’s Quick Lock Contact Unit Holder (CUH) for ecoAMP and DuraKelvin Plunge-to-Board set-ups on the MT9928 gravity feed handler has been adopted as the standard mounting solution by one of Multitest’s largest automotive customers. Quick Lock demonstrated substantial reductions in maintenance, debugging, and repair times. Read more

Enhancing IC Production Quality: Multitest MT2168 Pick-and-Place Handler option for avoiding ESD pre-damages

The Multitest MT2168 pick-and-place handler now offers a ground fault monitoring option. The ground fault monitoring option is part of a feature set that will enhance the value of the production output at the customer site. Ground fault monitoring is an important feature for meeting advanced quality standards. Read more

Multitest High Voltage Contactors: Proven Solutions for Automotive Test Applications

Multitest’s customized high voltage contacting solutions have been well accepted for volume production. Multitest receive a significantly increased order volume from automotive customers for it Blue Line Cantilever Technology sockets: nanoKelvin, Dura Kelvin, and ECON. Multitest high voltage contactors have proven best performance for reliable high voltage tests at full specification values.

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Multitest Contactors for Greatest Flexibility and Best Performance for Testing Wafer Level Chip Scale Packages

Expanding the range of Gemini Kelvin from WLCSP 0.3 mm pitch to 0.5 mm pitch

Multitest adding the Gemini Kelvin 050 for 0.5 mm pitch contacting continues to address the expanding requirements of its customers for reliable interface solutions for testing packages with continuously shrinking dies, which are needed for smaller, lower current, and faster end-user devices. The Gemini Kelvin contactor solutions are known for being the most reliable cost effective solution for increasing OEE in test.

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Multitest ecoAmp Kelvin: Approved Contactor for Automotive High Volume Production

Major IDM selects ecoAmp Kelvin Contactor for high power testing

Multitest’s ecoAmp Kelvin Contactor successfully passed an in-depth evaluation phase at a major IDM. Based on the performance, which was demonstrated in a challenging high power application, the customer decided to make the Multitest ecoAmp Kelvin Contactor their strategic test interface product for existing and future high power test applications at high volume production.

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Multitest Sensor Test Modules Ready for Increased Productions Needs

Optimizing 6DOF Gyro Test of Singulated Packages

Multitest has been the market leader for MEMS/sensor test and calibration equipment for more than 15 years. Multitest has now launched the next generation of its 6DOF gyro test module for singulated packages, which provides significant production benefits resulting in even lower cost of test, enhanced test accuracy and higher daily output.

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Increasing Test Cell Throughput:

Multitest adds “Super-Sharp” option to Quad Tech probes

Multitest’s Super-Sharp Option for Quad Tech probes provides an increase in test cell throughput and maintains the fidelity of the test signal over longer uninterrupted run times for higher yields. Multitest makes these advantages available to customers at no additional cost.

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Multitest’s Unique Interface Solution for High Frequency Testing Delivers Unprecedented Life-Time in Volume Production

mmWave customer case presented at Test Vision

Multitest’s mmWave contactor is a proven broadband production solution for RF applications up to 100 GHz. In a presentation by Jeffrey Finder, Senior Product and Test Engineering Manager at NXP, named “Building a Test Ecosystem for High Volume Manufacturing of 76-81 GHz Semiconductor Radar Sensors” the repeatable and stable performance of mmWave contactor was highlighted for an Automotive Radar Sensor Chipset application. This presentation was given at the Test Vision 2020 workshop at Semicon West in July 2017.

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WLCSP Test: Efficient High Volume Solution for Post-Saw Testing

Multitest InWaferX for final test of singulated WLCSPs

Multitest’s new InWaferX final test solution for singulated WLCSPs addresses the increased quality demand for automotive applications as these quality requirements are expanding to cost sensitive, high volume consumer applications. Based on the production proven InCarrier technology, InWaferX ensures highest efficiency and yield for lowest cost of test.

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