Everett Charles Technologies to exhibit at BIOMEDevice Show 2015

Leading Connector Solutions Meeting Challenging Requirements

Everett Charles Technologies (ECT) will exhibit its leading Compliant Connector Solutions at the upcoming BIOMEDevice Show scheduled to take place December 2 -3, 2015 at the San Jose Exhibition Center, California.

ECT offers a comprehensive portfolio of compliant connectors including customized solutions. ECT’s “standard connectors” are based on a highly flexible architecture, which facilitates cost-efficient configurations for customer requirements. ECT compliant connectors meet the highest quality standards and have proven superior durability in high life cycle applications.

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LFRE Plated Probes: Substantial Improvement of Test Cell Uptime on PCBA In-circuit Test Applications

ECTs proprietary LFRE plating has been proven to significantly extend probe life and time between cleaning cylces

Everett Charles Technologies (ECT) has proven the exceptional performance of LFRE spring probe products in a challenging evaluation at a major automotive electronics supplier with global manufacturing facilities. The ECT LFRE probes, which were used in an in-circuit test fixture, tripled insertion life and reduced cleaning frequency by a factor of 10 compared to the original set up.

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New ECT Accordion™ Technology Provides Reliable Contact in Harsh Environments

Patented interconnect solution offers unprecedented cost and reliability advantages for high insertion count applications

Everett Charles Technologies (ECT) has been supplying spring probes for over 50 years. ECT leverages this industry leading experience for unique, customer focused solutions to the most challenging connector requirements. Accordion™ is a patented contact technology from ECT that targets high reliability applications. It’s well suited for demanding environments found in the military, aerospace and medical markets. Recently the ECT Accordion contact has been selected as interconnect platform solution for a critical signal and power transmission application by a tier one military contractor.

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Meeting the Challenges of Cost-Efficient Testing High-End Digital Devices

Everett Charles Technologies introduces new member of the ZIP probes family: Z-080YHJ

Everett Charles Technologies (ECT) launched a new member of the versatile ZIP™ semiconductor test probe family. The Z-080YHJ is designed to meet the many challenges associated with testing High End Digital (HED) devices. ZIP probes are a cost effective solution that provide excellent mechanical reliability and electrical performance.

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Reliable Probes for Most Challenging High Current Testing

Everett Charles Technologies Introduces HC500F High Current Probe

Everett Charles Technologies (ECT) introduces the latest addition to our versatile family of high current probes; the HC500F. The HC500F is rated at 150 Amps DC and is designed for the most challenging applications in a broad range of industrial test applications including transportation, automotive, power grid, military and PCB test.

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ECT’s Launches New Probe Family for RF Signal Testing of PCBAs and Industrial Applications

CSP-40 significantly reduces cost per insertion with best best electrical performance at competitive pricing

Everett Charles Technologies (ECT) recently launched a new line of high frequency test probes for the PCBA and industrial test markets. The
CSP-40 high frequency probe family offers high reliability and excellent electrical performance at competitive pricing and significantly reduces the cost per test insertion.

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ECT’s ZIP™ Probe for Semiconductor Test Exceeds Customer Expectations

ZIP probes built from HyperCore™ base material proved superior performance in high volume production

Everett Charles Technologies (ECT) successfully passed a two month evaluation of ZIP probes using the HyperCore material option in a high volume production environment at a large OSAT in Singapore. The ZIP probe exceeded the critical first pass yield expectations and beat the target for a 500 k insertions life time by over 20%.

ZIP is one of several semiconductor test probe families offered by ECT. For this evaluation the ZIP probe was deployed in a quad-site test set-up for a 250 BGA package with 0.8 mm pitch for an Ethernet/MoCA (Multimedia over Coax Alliance) end application. The test was done at ambient and hot (85°C) conditions.

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Meeting the Requirements of Lead Free PCBA Testing

Everett Charles Technologies Enhances LFRE Product Line: Lead Free Long Travel Probes (LFLT)

Everett Charles Technologies (ECT) extended the probe offering (LFRE probes) for lead free PCB in-circuit and functional test applications to include long-travel probes (LFLT probes). ECT LFLT probes have almost twice the compliance as standard length probes. The new long-travel probes meet the need for reliable contact solutions for lead free dual-stage in-circuit test fixtures.

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Reliable Probes for Most Challenging High Current Testing

Everett Charles Technologies Introduces H375 High Current Probes

Everett Charles Technologies (ECT) introduces the latest addition to our versatile family of high current probes; the HC375. The HC375 is rated at 100 Amps DC and is designed for the most challenging applications in a broad range of industrial test including transportation, automotive, power grid, military and PCB test.

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ECT Improving Performance and Reliability for PCBA Test and Industrial Applications

Everett Charles Technologies Launches l40 Tip Style

Everett Charles Technologies (ECT) launches the new l40 tip style. The innovative geometry of the l40 tip ensures best yield and reliability and overcomes the challenges of contacting lead free solder or OSP treated copper.

Lead free solder and OSP treated copper present a harder or more abrasive contact surface causing excessive plating and probe tip wear. The l40‘s advanced off axis tip geometry machining methodology was designed to improve tip wear and resistance to tip fracturing. l40 tip style offers a more robust probe design and a longer tip life. The l40‘s straight shaft lance with a 40° facet combines the penetration capability of a sharp tip probe while providing added material behind the tip to increase strength.

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