Cohu Completes Acquisition of Xcerra

POWAY, Calif.–(BUSINESS WIRE)–Oct. 1, 2018– Cohu, Inc. (NASDAQ: COHU) today announced the completion of its acquisition of Xcerra Corporation. The combination creates a global leader in back-end semiconductor equipment and services, and printed circuit board test with a breadth of products that are unmatched in the industry.

“The acquisition of Xcerra accelerates our strategy to diversify our product offerings and customer base, expanding Cohu’s addressable market to approximately $5 billion across semiconductor test and handling equipment, thermal subsystems, test contacting, vision inspection, MEMS and PCB test. This combination also further strengthens our ability to fully capitalize on the growth opportunities in our key target markets of automotive, industrial, IoT and communications,” said Luis Müller, Cohu’s President and CEO. “Although softening in the mobility market combined with current geopolitical uncertainty are creating near-term headwinds, we remain confident about the long-term growth opportunities in these markets as well as our ability to deliver on our synergy goals and to profitably grow Cohu in the years ahead,” added Müller.

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atg Luther & Maelzer to exhibit at TPCA Show 2018

Leading test solutions for bare boards and substrates

atg Luther & Maelzer will exhibit the A8a flying probe test solution at the upcoming TPCA Show scheduled to take place October 24 – 26, 2018 at the Nangang Exhibition Center in Taipei, Taiwan.

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Innovative Impedance Controlled Test Contactor for Maximized RF Power Transfer

Xcerra receives first high volume order for ICON Coaxial Contactor

Xcerra’s new ICON contactor is designed specifically for maintaining the native impedance of the device-under-test (DUT) through the contactor to the test system. Functional and AC parametric testing of high speed devices requires a high and bandwidth low noise interconnect to maintain the quality and/or fidelity of the test signal. As an impedance controlled contactor the ICON maximized high frequency power transfer by minimizing signal reflections (Return Loss).

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The World’s First 75 dB SNR Microphone Test Cell

Xcerra successfully introduced high parallel complete test cell solution for high-quality microphones

Xcerra successfully installed three microphone test cells for high parallel testing of high-end microphones featuring a signal-to-noise ratio (SNR) of 75 dB. This solution ideally supports microphone testing for mobile phones, tablets, other state-of-the-art consumer applications.

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Diamondx Well Positioned to Ride the TDDI Wave

Xcerra’s flagship test platform brings flexibility and scalability to display driver test

Xcerra’s highly flexible Diamondx test platform can scale up to over 5000 display driver digitizers, supporting aggressive multi-site production strategies. With a wide range of general purpose and specialized instruments, the Diamondx platform meets the current and future test requirements of display driver devices, as well as the complete spectrum of multimedia ICs.

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ECT Adds to Its Growing Portfolio of RF Coaxial Spring Probes for High Frequency Test:

CSP-40A-024 and CSP-40G-021 probes bring performance and ease-of-use to the next level

Everett Charles Technologies (ECT) recently launched 2 new high frequency test probes for the PCBA test market. The CSP-40A-024 and CSP-40G-021 radio frequency probes are designed to mate to a variety of industry standard connectors such as MMCX, Fakra, SMB and U.FL.

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Enhancing Test Floor Performance and Quality: New options for the MT2168 XT

Xcerra’s MT2168 XT Semiconductor Test Handler now available with advanced Double Device Detection and Automatic Temperature Calibration

Xcerra has added two new optional features to the MT2168 XT pick-and-place handler. Both options target optimization of test floor processes, allowing the customer to deliver enhanced quality: the Double Device Detection (DDD) option increases binning integrity; the Automatic Temperature Calibration enables the customer to meet quality standards by calibrating as scheduled without time consuming manual processes.

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Enhancing the Portfolio of Board Marker Probe for Reliable PCB Testing

ECT introduces BMP-5 board marker probe

ECT adds the next generation board marker probe to its industry proven portfolio of ICT / FCT probes. BMP-5 incorporates innovative and industry-leading features that result in superior performance, ease of use and maintainability. It is also compatible with other 12 mm diameter BMP’s now on the market.

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Everett Charles Technologies: Change in VG Brand of ATE Mass Interconnect Products

Everett Charles Technologies (ECT) has some important information to share related of the VG brand on ATE Mass Interconnect products.

The management of this brand and product family will transition from the ECT Fixture and Service Group (FSG) to the ECT Contact Products Group (CPG). This transition will allow improved focus on the affected products, and ultimately an improved experience for our customer base.

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Xcerra Announces Microchip Technology as the Recipient of the 500th Diamondx Test System

Diamondx Semiconductor Test System Used in Testing a Broad Range of Device Types for the Automotive, Consumer, Industrial and Mobility markets

Xcerra announced that is has shipped the 500th Diamondx test system reaching a critical milestone for Xcerra’s flagship system-on-a-chip (SOC) test system. The 500th test system was delivered to Microchip Technology, the number three supplier of microcontrollers in the world. Microchip will add to their installed base of Diamondx testers in support of high volume production test of devices supplied into the automotive, consumer and industrial markets.

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