Entries by Daniela

ECT Adds to Its Growing Portfolio of RF Coaxial Spring Probes for High Frequency Test:

CSP-40A-024 and CSP-40G-021 probes bring performance and ease-of-use to the next level Everett Charles Technologies (ECT) recently launched 2 new high frequency test probes for the PCBA test market. The CSP-40A-024 and CSP-40G-021 radio frequency probes are designed to mate to a variety of industry standard connectors such as MMCX, Fakra, SMB and U.FL.

Enhancing Test Floor Performance and Quality: New options for the MT2168 XT

Xcerra’s MT2168 XT Semiconductor Test Handler now available with advanced Double Device Detection and Automatic Temperature Calibration Xcerra has added two new optional features to the MT2168 XT pick-and-place handler. Both options target optimization of test floor processes, allowing the customer to deliver enhanced quality: the Double Device Detection (DDD) option increases binning integrity; the […]

Everett Charles Technologies: Change in VG Brand of ATE Mass Interconnect Products

Everett Charles Technologies (ECT) has some important information to share related of the VG brand on ATE Mass Interconnect products. The management of this brand and product family will transition from the ECT Fixture and Service Group (FSG) to the ECT Contact Products Group (CPG). This transition will allow improved focus on the affected products, […]

Xcerra Announces Microchip Technology as the Recipient of the 500th Diamondx Test System

Diamondx Semiconductor Test System Used in Testing a Broad Range of Device Types for the Automotive, Consumer, Industrial and Mobility markets Xcerra announced that is has shipped the 500th Diamondx test system reaching a critical milestone for Xcerra’s flagship system-on-a-chip (SOC) test system. The 500th test system was delivered to Microchip Technology, the number three supplier […]

Meeting the Test Needs of Next Generation Application Processors

Xcerra introduces HSI1x 12.8 Gbps SerDes test instrument with industry-leading channel density and performance The new Xcerra HSI1x instrument for the well-established Diamondx platform features 32 transmit lanes and 24 receive lanes with up to 12.8 Gbps data rate. The instrument can be used for protocol and physical layer testing of leading edge SerDes ports, such […]

Testing of LED Devices with Superior Temperature Performance

Xcerra’s MT9510 XP pick and place handler proven as reliable solution for tri-temperature testing of LED devices in volume production The Xcerra MT9510 XP pick-and-place handler successfully passed the onsite buy-off for an automotive LED test application at a leading lighting manufacturer. The MT9510 XP solution enables the customer to test high volumes of LED […]

Testing Modules and Multi-Chip Packages in the Full Temperature Range

Xcerra’s MT2168 XT Semiconductor Test Handler installed as a flexible and efficient alternative to dedicated module test solutions The Xcerra MT2168 XT pick-and-place handler was installed for a tri-temp module test application at a major player in global semiconductor manufacturing.  With its innovative features and highly flexible design the MT2168 XT meets the growing demand […]