Entries by Daniela

Everett Charles Technologies: Change in VG Brand of ATE Mass Interconnect Products

Everett Charles Technologies (ECT) has some important information to share related of the VG brand on ATE Mass Interconnect products. The management of this brand and product family will transition from the ECT Fixture and Service Group (FSG) to the ECT Contact Products Group (CPG). This transition will allow improved focus on the affected products, […]

Meeting the Test Needs of Next Generation Application Processors

Xcerra introduces HSI1x 12.8 Gbps SerDes test instrument with industry-leading channel density and performance The new Xcerra HSI1x instrument for the well-established Diamondx platform features 32 transmit lanes and 24 receive lanes with up to 12.8 Gbps data rate. The instrument can be used for protocol and physical layer testing of leading edge SerDes ports, such […]

Testing of LED Devices with Superior Temperature Performance

Xcerra’s MT9510 XP pick and place handler proven as reliable solution for tri-temperature testing of LED devices in volume production The Xcerra MT9510 XP pick-and-place handler successfully passed the onsite buy-off for an automotive LED test application at a leading lighting manufacturer. The MT9510 XP solution enables the customer to test high volumes of LED […]

Testing Modules and Multi-Chip Packages in the Full Temperature Range

Xcerra’s MT2168 XT Semiconductor Test Handler installed as a flexible and efficient alternative to dedicated module test solutions The Xcerra MT2168 XT pick-and-place handler was installed for a tri-temp module test application at a major player in global semiconductor manufacturing.  With its innovative features and highly flexible design the MT2168 XT meets the growing demand […]

ECT General Purpose Probes for Board, Module and Final Assembly Testing:

Combining the advantages of a comprehensive off-the-shelf portfolio with in-house design and manufacturing Everett Charles Technologies (ECT) offers a comprehensive portfolio of off-the-shelf probes for board, module and final assembly test, which are available at short lead times. For applications, in which ECT’s vast selection of off-the-shelf probes doesn’t meet the requirements of the specific […]

Over-the-Air (OTA) Integrated Test Solution for Antenna in Package (AiP) 5G, Auto Radar, and WiFi Devices to > 80 GHz

Xcerra combines innovative contacting technology with reliable test handling solution Multitest recently delivered a production interface solution to a customer for OTA testing of a 60 GHz UltraGig single-chip integrated Antenna in Package (AiP). The solution integrates the xWave OTA Contactor with xWave patch antenna in the MT2168XT leadbacker.

Substantial Yield Improvements with ECT’s LFRE Probes for PCBA Testing

ECT probes with proprietary Lead-free plating passed extensive qualification at a major US based OEM Everett Charles Technologies’ (ECT’s) LFRE plated probes successfully passed an extensive qualification testing with an incumbent probe at a major US based OEM for power infrastructure equipment. ECT’s LFRE proprietary plated spring probes demonstrated a significant improvement in first pass […]