Entries by Daniela Klostermeier

Enhancing Test Floor Performance and Quality: New options for the MT2168 XT

Xcerra’s MT2168 XT Semiconductor Test Handler now available with advanced Double Device Detection and Automatic Temperature Calibration Xcerra has added two new optional features to the MT2168 XT pick-and-place handler. Both options target optimization of test floor processes, allowing the customer to deliver enhanced quality: the Double Device Detection (DDD) option increases binning integrity; the […]

Xcerra Announces Microchip Technology as the Recipient of the 500th Diamondx Test System

Diamondx Semiconductor Test System Used in Testing a Broad Range of Device Types for the Automotive, Consumer, Industrial and Mobility markets Xcerra announced that is has shipped the 500th Diamondx test system reaching a critical milestone for Xcerra’s flagship system-on-a-chip (SOC) test system. The 500th test system was delivered to Microchip Technology, the number three supplier […]

Meeting the Test Needs of Next Generation Application Processors

Xcerra introduces HSI1x 12.8 Gbps SerDes test instrument with industry-leading channel density and performance The new Xcerra HSI1x instrument for the well-established Diamondx platform features 32 transmit lanes and 24 receive lanes with up to 12.8 Gbps data rate. The instrument can be used for protocol and physical layer testing of leading edge SerDes ports, such […]

Testing of LED Devices with Superior Temperature Performance

Xcerra’s MT9510 XP pick and place handler proven as reliable solution for tri-temperature testing of LED devices in volume production The Xcerra MT9510 XP pick-and-place handler successfully passed the onsite buy-off for an automotive LED test application at a leading lighting manufacturer. The MT9510 XP solution enables the customer to test high volumes of LED […]

Testing Modules and Multi-Chip Packages in the Full Temperature Range

Xcerra’s MT2168 XT Semiconductor Test Handler installed as a flexible and efficient alternative to dedicated module test solutions The Xcerra MT2168 XT pick-and-place handler was installed for a tri-temp module test application at a major player in global semiconductor manufacturing.  With its innovative features and highly flexible design the MT2168 XT meets the growing demand […]

Superior Cantilever Contacting Solution for High Parallel QFP Testing

New HD Kelvin Contactor passed evaluation for volume production Xcerra’s new HD Kelvin contactor successfully passed a long term evaluation at a major IDM. The application deploys the HD Kelvin for a multisite Kelvin test of a QFP 100 package for the automotive market. Xcerra’s HD Kelvin fully supported the customer’s target to double the […]

Over-the-Air (OTA) Integrated Test Solution for Antenna in Package (AiP) 5G, Auto Radar, and WiFi Devices to > 80 GHz

Xcerra combines innovative contacting technology with reliable test handling solution Multitest recently delivered a production interface solution to a customer for OTA testing of a 60 GHz UltraGig single-chip integrated Antenna in Package (AiP). The solution integrates the xWave OTA Contactor with xWave patch antenna in the MT2168XT leadbacker.

Smart Maintenance Mechanics Ensure Significantly Higher Uptime: Multitest Quick Lock for Test Sockets

Multitest’s Quick Lock Contact Unit Holder (CUH) for ecoAMP and DuraKelvin Plunge-to-Board set-ups on the MT9928 gravity feed handler has been adopted as the standard mounting solution by one of Multitest’s largest automotive customers. Quick Lock demonstrated substantial reductions in maintenance, debugging, and repair times.

Enhancing IC Production Quality: Multitest MT2168 Pick-and-Place Handler option for avoiding ESD pre-damages

The Multitest MT2168 pick-and-place handler now offers a ground fault monitoring option. The ground fault monitoring option is part of a feature set that will enhance the value of the production output at the customer site. Ground fault monitoring is an important feature for meeting advanced quality standards.

Multitest High Voltage Contactors: Proven Solutions for Automotive Test Applications

Multitest customized high voltage contacting solutions have been well accepted for volume production. Multitest receive a significantly increased order volume from automotive customers for it Blue Line Cantilever Technology sockets: nanoKelvin, Dura Kelvin, and ECON. Multitest high voltage contactors have proven best performance for reliable high voltage tests at full specification values.