Everett Charles Technologies to exhibit at AmCon Expo 2016

Leading Connector and Probe Solutions Meeting the Requirements of Challenging Applications

Everett Charles Technologies (ECT) will exhibit its leading Electronic Interconnect Solutions at the upcoming AmCon Expo taking place September 21 – 22 at the Rochester Riverside Convention Center, NY.

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InGyro Test Cell Solution Supports MEMS Test for the Chinese Market

Xcerra and Spirox collaborate to provide advanced technology to support the China MEMS market with the new tri-temp gyroscope test cell

Xcerra has shipped the first complete fully tri-temp capable MEMS test cell for gyroscope test and calibration to SITRI, the Shanghai Industrial µTechnology Research Institute. The complete test cell solution includes an LTX-Credence Diamondx tester, Multitest InStrip handler, the Multitest InGyro sensor test module and a functional test program. The system is the first shipment of the new InGyro module to support testing at temperatures from -40°C to +125°C. Spirox Corporation, Xcerra’s business partner in Taiwan and China, worked closely with SITRI to define this new solution, which supports the MEMS growth strategy of the Chines government.

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Multitest Triton 080 Contactor: New Tip for Significant OEE Improvements

Multitest recently introduced a new version of the well-established high performance Triton contactor. The new TRN080 delivers reduced cleaning needs, which directly contribute to higher test cell availability and better Overall Equipment Efficiency (OEE).

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Everett Charles Technologies Non Magnetic

Probes for Reliable Sensor Testing with Full Temperature Range

Everett Charles Technologies (ECT) expands its product portfolio with non-magnetic spring probes for test applications, which are based on the measurement of the earth′s magnetic field in the full ambient/hot/cold temperature range. ECT non-magnetic probes ensure accurate, reliable and repeatable measurement of the earth′s magnetic field and the yaw rate movement in any of the three axes without interference from the test probes.

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