Professional Test Fixture Maintenance Ensures Premium Performance

Everett Charles Technologies offers Test Fixture Maintenance Guide

Everett Charles Technologies’ (ECT) offers a detailed maintenance guide for both ICT and FCT fixtures and probes, which provides best practice techniques and processes. Maintaining the test fixture at optimum levels ensures the best test performance.

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MicroLink: Miniaturization of Link Technology for Small Pitches and Advanced Electrical Requirements

Multitest leverages the innovative and field proven Link technology to develop MicroLink – a probe which addresses advanced electrical test requirements for lower inductance and better signal integrity.

The MicroLink probe offers enhanced performance in all major electrical categories: impedance, insertion loss, inductance, contact resistance, and signal integrity. The signal path has been shortened to 0.373 mm. MicroLink supports RF applications with 60GHz and higher.

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MacroLink: Making Link Technology Footprint Compatible to Existing Set-Ups

Multitest offers the field proven Link technology as a replacement option for existing solutions. MacroLink combines full foot print compatibility with production proven electrical and mechanical performance.

MacroLink particularly addresses board wear issues, which customer faced with competitor’s solutions. The MacroLink facilitates the replacement by keeping full compatibility to existing test handler conversion kits and load boards.

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Link Contactor Family: Offset Vertical Probe with Wipe Design for Best Mechanical and Electrical Performance

Multitest’s Link Contactor family line for analog, mixed signal, and RF applications applies innovative vertical probe design. Link Contactors combine advantageous mechanical features – such as self-cleaning and scrub – with superior electrical performance and an architecture that eliminates wear on test interface board pads.

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ECT’s ZIP™ Z0 RF Spring Probe for Semiconductor Test Exceeds Customer Expectations

ZIP probes built from HyperCore™ base material provides superior performance in high volume production

Everett Charles Technologies (ECT) successfully won a head-to-head evaluation of ZIP probes with the HyperCore™ material option in a high volume production environment at a large Chinese OSAT. The Z0 probes reached 450k insertions more than doubling the life of the competitor’s spring probe while exceeding first pass yield expectations.

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NEW Double Sided Flying Probe Tester for Substrate Test from atg Luther & Maelzer

S3-8 Double Sided High Speed Substrate Tester with 8 Test Heads for Structures Down to 10 µm             

atg Luther & Maelzer has added a double sided flying probe system for substrate test to its line of flying probe testers. The S3-8 10 µm substrate tester is the latest model of a new atg Luther & Maelzer product line launched last year with the introduction of the single sided S3. The single sided S3 and the double sided S3-8 both meet the challenging requirements of high end substrate test such as positioning accuracy and high number of contact points by applying the advanced flying probe technology of atg Luther & Maelzer.

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