Bringing MEMS Testing to the Next Level

Installation of first complete Xcerra turn-key test cell for MEMS in Asia

Xcerra finalized the installation of a complete test cell for 3/6DOF inertial and navigation MEMS applications at an Asian customer. The test cell leverages proven Xcerra expertise in highly parallel test of sensor devices, delivered through the LTX-Credence and Multitest semiconductor test brands. The customer benefits from the pre-validated test cell set-up, with integrated test program and optimization support, to rapidly realize outstanding test efficiency and target yield performance.

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