LTX-Credence – Supplier of Choice for Testing IoT Devices

Nordic Semiconductor Selects the Diamondx for IoT Device Testing

LTX-Credence today announced that Nordic Semiconductor, a company that specializes in ultra-low power (ULP) 2.4GHz transceivers, notably for the Bluetooth Smart and wearables segments, has selected Xcerra’s LTX-Credence Diamondx for high volume production test of their Internet of Things (IoT) products. Nordic will use the Diamondx in combination with NighthawkCT, an industry leading instrument for low cost RF test of connectivity devices.

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Combining Speed with Automation:

atg Luther & Maelzer launches the A8-16a – a new automation version of the ultra fast A7/A8 linear motor technology

atg Luther & Maelzer releases the A8-16a, which combines the speed of the 16 probe system A8-16 with the well-known and market established automation of the A7a. The A8-16a addresses the test and productivity requirements of big or complex server boards or production panels up to 24.4” x 24.0” with huge test point numbers.

The 16 test heads of the A8-16a reach a test speed of up to 15,000 measurements per minute. The system fully supports the testing of air- and aerospace applications due to IPC-9252A guidelines. This includes Class 3 products which have to be tested using an adjacency based ohmic resistance test because a capacitance short test is not allowed.

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One Insertion for Testing at Multiple Set Temperatures

Multitest MT2168 Pick-and-Place Handler offers multi-temperature testing within one plunger cycle

The Multitest MT2168 pick-and-place handler now offers multi-temperature test with only one insertion. The highly dynamic temperature control allows for testing at multiple set temperatures within one plunger cycle. This new feature particularly addresses the requirements in design and engineering sites.

The fast and accurate changes of the set temperatures are based on the chamberless soaking solution in the contact unit of the MT2168. This design allows for exact thermal measurements and prompt temperatures adjustments for each device under test.

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