InCarrier Loader plus Dedicated to High Volume Production

Multitest launches the next generation loader for test in carriers

Multitest is launching the first InCarrier Loader plus with the shipment to a major IDM with high volume production in Europe and Asia.
The InCarrier Loader plus is the new state-of-the art loading solution for test in carriers. It is designed to optimize the back-end process at high volume production sites. The InCarrier Loader plus supports device loading to carrier from standard back-end transport media in a most cost-efficient and productivity-oriented way.

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High Volume Test and Calibration of Barometric Sensors

Multitest InBaro confirmed as platform of choice

Multitest successfully introduced a new solution to their MEMS test and calibration portfolio: Multitest InBaro for high parallel test of barometric sensors. During a benchmark evaluation at a major European semiconductor manufacturer the InBaro specification outperformed the competition and was selected as the standard platform for test and calibration of their barometric sensor devices for consumer applications.

The InBaro provides a reliable multisite test and calibration solution for barometric pressure sensors and gas detection sensors for e.g. 144 and more devices in parallel with a maximum signal count of 2400 pins per insertion. It enables temperature test at a range form – 40°C up to +125°C with best temperature accuracy and stability. The InBaro standard configuration supports quick exchange between five pressure levels – more can be added on request. InBaro features absolute pressures up to 1,500 mbar. The InBaro can be upgraded to “InHumid” to expand the application to other environmental sensor devices.

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atg Luther & Maelzer to exhibit at IPC APEX Expo 2015

High Performance Flying Probe Test and Automation

atg Luther & Maelzer will exhibit its fully automated flying probe test solution at the upcoming IPC APEX Expo scheduled to take place February 24 -26, 2015 at the San Diego Convention Center, California, USA.

At IPC APEX Expo, atg Luther & Maelzer will showcase its latest generation automatic flying probe system: The A7 – Automation (A7A).

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Cost-efficient and Flexible Solution for Managing Power Dissipation

Multitest ATC for the MT2168 Pick-and-Place Handler

The Multitest ATC option for the MT2168 pick-and-place handler offers a most cost-efficient and flexible solution for managing low to medium range power dissipation at multisite test cells with up to 16 sites. Multitest ATC is an easy add-on to the standard MT2168, which can be mounted and demounted effortless. Multitest ATC is an affordable, reliable and flexible solution for test development and high volume production.

In the past power dissipation was recognized as an issue for high performance server, processor and graphic applications. Today package density and integration increases more and more to achieve higher speed and save space particularly in mobile applications. The power dissipation here is significantly less than in the high performance applications. However, thermal stress may damage the packages, temperature test may be distorted and test repeatability and yield lost. Additionally, there is a higher cost pressure for this market, which requires best cost of test configurations.

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100th Diamondx Test System Shipped

Customers value cost-efficiency and wide range of applications

LTX-Credence announced a major milestone for one of their key products, the Diamondx. The Company recently shipped the 100th Diamondx test system to an OSAT in China for high volume production of HiSilicon application specific devices. This is an important milestone in the success story of the product and validation of its ability to deliver cost-optimized semiconductor test solutions to the market. While the majority of systems are deployed at OSATs (outsource semiconductor assembly and test companies), it is also well-established at fabless companies and IDMs (integrated device manufacturers).

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