ECT Improving Performance and Reliability for PCBA Test and Industrial Applications

Everett Charles Technologies Launches l40 Tip Style

Everett Charles Technologies (ECT) launches the new l40 tip style. The innovative geometry of the l40 tip ensures best yield and reliability and overcomes the challenges of contacting lead free solder or OSP treated copper.

Lead free solder and OSP treated copper present a harder or more abrasive contact surface causing excessive plating and probe tip wear. The l40‘s advanced off axis tip geometry machining methodology was designed to improve tip wear and resistance to tip fracturing. l40 tip style offers a more robust probe design and a longer tip life. The l40‘s straight shaft lance with a 40° facet combines the penetration capability of a sharp tip probe while providing added material behind the tip to increase strength.

Read more

atg Luther & Maelzer to exhibit at TPCA Show 2014

Leading Bare Board PCB Test Solutions – Testing the Limits

atg Luther & Maelzer will exhibit its leading PCB test solutions at the upcoming TPCA show, scheduled to take place October 22-24, 2014 at the Nangang Exhibition Center Taipei, Taiwan.

At the show, atg Luther & Maelzer will showcase the latest product of their industry leading flying probe product line: A8-8 Flying Probe Tester

Read more

ECT Launches Versatile RF Probes Semiconductor Test

Z1 and Z0 Probes leverages ECT‘s flat technology to achieve the next level performance

Everett Charles Technologies (ECT) launches two new members of the ZIP™ probe family designed to meet signal integrity challenges driven by the ever increasing speed of semiconductors devices. Z0 and Z1 probes are a cost effective solution that provide excellent mechanical reliability and electrical performance.

Read more

Xcerra™ to present at Semicon Europa 2014

The new brand in the electronics supply chain dedicated to your success

Xcerra Corporation announces that Peter Cockburn, Senior Product Manager of Test Cell Innovation, will give a presentation at the upcoming Semicon Europa trade show, scheduled to take place October 7-9 in Grenoble, France. Peter will present “Using a Test-Cell-Solution Approach to Achieve Device Quality and Production-Efficiency Goals for 77GHz Automotive Radar ICs” on Wednesday, October 8, 2014 at 1:50 p.m. in session 1 “System-Level Approaches for Optimizing Test” of the 16th European Manufacturing and Test Conference (EMTC). The presentation has been co-authored by Mauro Strazzeri of STMicroelectronics.

Legislation to reduce car injuries is causing dramatic growth in ADAS (Advanced Driver Assistance Systems). Radar-based ADAS are moving from 24GHz to 77GHz, providing better range, bandwidth and resolution for detecting objects. Automotive 0 ppm failure rates necessitate full functional test of the ADAS ICs at 24GHz or 77GHz in both engineering and high volume manufacturing (HVM).

Read more