Everett Charles Technologies Releases HyperCore™ Material to Full ZIP™ Probe Product Line

Premium Performance for Semiconductor Test Based on Superior Probe Material

Everett Charles Technologies (ECT) releases the HyperCore™ material to the full ZIP™ product line. ZIP™ is an ECT single probe family that is dedicated to semiconductor test applications. HyperCore™ is an innovative, non-plated and homogenous probe material optimized for longer probe life, longer cleaning cycles and reliable contact.

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