Key test cell characteristics to meet the challenges of today’s and future HVM of MEMS/sensors
Xcerra will give an expert presentation on “MEMS Sensor Testing Challenges and Requirements” at the upcoming Sensor China Expo scheduled to take place September 12 – 14, 2016 at the Shanghai Convention & Exhibition Center of International Sourcing, China.
In his paper the speaker, Nigel Beddoe, Global Business Development Director Handler Group at Xcerra Corporation, will explore some of the key attributes and technical challenges in testing high accuracy specification MEMS devices. He will discuss the market drivers as well as other factors contributing to the more stringent specifications and new test requirements. The paper will address the key test cell characteristics that can help MEMS suppliers navigate the challenges faced today in HVM as well as what may come in the future.
Today MEMS sensor test requirements are far more challenging than just a couple of years ago. MEMS markets such as mobility, automotive and medical are driving new requirements. While some of these requirements may be easily achieved in an engineering lab environment, they can be a major challenge for high volume manufacturing (HVM). Environmental combination sensors are seeing a strong growth due to its wide breath of potential applications in consumer and automotive applications. These environmental sensors have very stringent temperature requirements which can be challenging to achieve in HVM.
With lowering ASP in the sensor market MEMS suppliers are focused on testing at higher levels of parallelism in order to reduce CoT. The target level of parallelism extends beyond the 256 sites on a single touchdown that is currently being done today. In addition the trend of multiple types of sensors on a single chip 9DOF, 10DOF and even 12 DOF are driving new test requirements. The ability to test multiple sensor types in a single insertion along with test cell modularity and flexibility will be key to addressing these integrated sensors.
Finding flexible solutions for handling all the different types of MEMS packaging and sizes that we see today as well as what will come in the future will also be something MEMS suppliers will need to consider. Low cost and small form factor for the mobility and automotive markets are main drivers for the MEMS WLCSP growth. Handling MEMS WLCSP brings new test requirements in the already challenging HVM environment. Appropriate solutions need to meet today’s requirements and also anticipate future needs in order support the growth in this market accordingly.
Nigel Beddoe is Global Business Development Director Asia for Xcerra’s Handler Group.
After graduating from the University of Wales in Electrical and Electronic Engineering, Nigel Beddoe has been in the Semiconductor Final Test environment since 1979. In his positions at previous companies such as Inmos (UK) and STMicroelectronics (Malaysia,), he gained experience using a variety of semiconductor test solutions. Since 2001 Nigel Beddoe has been with Multitest, an Xcerra company, as a provider of semiconductor test solutions.
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