Multitest recently introduced a new version of the well-established high performance Triton contactor. The new TRN080 delivers reduced cleaning needs, which directly contribute to higher test cell availability and better Overall Equipment Efficiency (OEE).
The Triton is the ideal high performance probe for general purpose and digital applications that demand high bandwidth contactor performance. Triton meets the requirements of the new generation of densely packaged large I/O count semiconductors for a high level of electrical and mechanical performance that is often unattainable with traditional spring probe test sockets. The next generation Triton 080 deploys a monolithic alloy probe tip that is less likely to bond with device lead/ball plating alloys. The lack of solder bonding to probe tip means reduced solder build up on probe tips leading to longer run times between cleaning.
Bert Brost, Product Managers, explains: “Multitest leverages years of experience in flat probe technology and innovation in the development of spring probe components for increasing the customer′s OEE in backend test. The new Triton 080 is a perfect example how we continue to analyze the changing market requirements to offer leading products to our customers.”