Leveraging contacting expertise for non-destructive measurements
ECT’s SPP-25 probes are designed specifically to support non-destructive electrical contact at various stages of test during the fabrication process of solar photovoltaic (PV) products. ECT’s reliable and effective solution is well suited for high volume production test which is needed as volumes increase due to alternative energies becoming more mainstream.
Spring probe technology is an ideal solution to provide electrical connection to obtain I-V curve measurements, or providing reliable contact for your challenging high current or low voltage connections. SPP-25 probes feature low, stable resistance, a center close for enhanced pointing accuracy, tip styles designed to distribute spring force across a large area, and two force options; 4oz and 6oz. The probes are specifically designed to yield a linear force –compression relationship as the probe is actuated. This minimizes potentially harmful jumps or steps in force. SPP-25 probes fit into standard Pogo 25 receptacles.
ECT probes are often used for standard or custom automated test equipment and fixture applications which involve simulation, production testing, characterization, validation or failure analysis. ECT has leveraged decades of spring probe design and manufacturing knowhow to create probes that ensure reliable electrical contact without damaging the PV cell.
Tony DeRosa, Senior Product Manager, explains: “Whether you are making contact directly with silicon/thin film circuitry, or the bus bar of your PV device, ECT offers a wide range of sizes, tip styles, and spring forces to accommodate your specific application.”
To learn more about SSP25, please visit: http://ect-cpg.com/solar-panel-probes