SEMICON Japan 2016
Tokyo Big Sight
Visit our presentation
“Proposal for the sensor test process to succeed in IoT market”
Date: Thursday, December 15
Time: 3:40 – 4:10 p.m.
Session: STS Test Session (Testing Technology for IoT Devices)
Conference location: TechSTAGE South, East Hall 1
Speaker: Hidenori Kakizaki (Application Engineer)
As applications for IoT continue to expand in smart cities, home automation, connected vehicles, and health care, this has become a significant growth driver for semiconductor devices. Meeting the challenges of double digit growth in unit volumes, relentless cost pressure and the ability to address a variety of sensors are required to succeed in this technology. We introduce an advanced mass production test technique for various sensors.