ECT Introduces New Tools to Its Robust E-Commerce Website

Search Competitor Parts, Download Specs, CAD drawings, ISO and Order Probes

In the past 12 months ECT has provided multiple new tools to its e-commerce website (shop.ect-cpg.com) including: a competitor cross reference tool; revamped search functionality; the ability to download ISO, mechanical, CAD drawings, and probe/tip replacement instructions; and a new shopping cart to make a purchase or request a quote.

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ECT’s Switch Probes: Cost-Efficient Solutions for Testing Electronic Assemblies

ECT switch probes are cost effective and reliable solutions for non-destructive testing to verify the presence of components or contact leads within a connector assembly. ECT offers proven off-the-shelf options and a large portfolio of custom switch probes. ECT’s experience and design standards combined with its knowledge of materials and platings allows for the quick alignment of probe features with project requirements. ECT switch probes are replaceable by using of one of many receptacle termination options. Customers can choose from gold or nickel plated plungers.

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atg Luther & Maelzer to exhibit at HKPCA & IPC Show 2017, in Shenzhen

New Generation Flying Probe Test and Innovative Grid Test Equipment

atg Luther & Maelzer will exhibit its leading test solutions for PCBs at the upcoming HKPCA & IPC 2017 show scheduled to take place on December 6 – 8, 2017 at the Shenzhen Convention & Exhibition Center, China.

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Multitest’s Unique Interface Solution for Ultra-High Frequency Testing Delivers Unprecedented Life-Time in Volume Production

mmWave customer case presented at Test Vision

Multitest’s mmWave contactor is a proven broadband production solution for RF applications up to 100 GHz. In a presentation by Jeffrey Finder, Senior Product and Test Engineering Manager at NXP, named “Building a Test Ecosystem for High Volume Manufacturing of 76-81 GHz Semiconductor Radar Sensors” the repeatable and stable performance of mmWave contactor was highlighted for an Automotive Radar Sensor Chipset application. This presentation was given at the Test Vision 2020 workshop at Semicon West in July 2017.
(Download the full presentation here: Download)

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WLCSP Test: Efficient High Volume Solution for Post-Saw Testing

Multitest InWaferX for final test of singulated WLCSPs

Multitest’s new InWaferX final test solution for singulated WLCSPs addresses the increased quality demand for automotive applications as these quality requirements are expanding to cost sensitive, high volume consumer applications. Based on the production proven InCarrier technology, InWaferX ensures highest efficiency and yield for lowest cost of test.

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atg Luther & Maelzer to exhibit at Productronica 2017

Leading solutions fully automated test of bare boards

atg Luther & Maelzer will exhibit the new fully automated A8a flying probe test solution at the upcoming Productronica Show scheduled to take place November 14 – 17, 2017 in Munich, Germany.

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ECT’s Comprehensive Portfolio of Receptacles Offer Flexibility in PCB Test Fixture Design

ECT receptacles combine industry proven technical features with optimized cost

ECT leverages its industry leading experience in probe and receptacle design and manufacture to provide cost-effective and reliable customer-focused solutions for the most challenging ICT and FT applications. ECT receptacles allow for rapid replacement of spring probes without disrupting wiring. ECT’s comprehensive offering of receptacles provides customers with fixture design flexibility that results in an optimal product for their customers.

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atg Luther & Maelzer to exhibit at TPCA Show 2017

Leading test solutions for bare boards and substrates

atg Luther & Maelzer will exhibit the new A8a flying probe test solution as well as, the high speed substrate test solution, S3-8, at the upcoming TPCA Show scheduled to take place October 25 – 27, 2017 at the Nangang Exhibition Center in Taipei, Taiwan.

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ECT’s New Board Marker Probe for Reliable PCB Testing

Innovative features optimized for best performance

ECT adds the next generation board marker probe to its industry proven portfolio of ICT / FCT probes. The BMP-4 incorporates innovative and industry-leading features that result in superior performance, ease of use and maintainability.

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Expanding MEMS Test Capabilities in the Chinese Market

Xcerra MEMS Test Cell at SITRI for Barometric Pressure Sensors

Xcerra, with its recognized industry-leading suite of flexible and cost-effective MEMS test cell offerings, announced today that SITRI, the Shanghai Industrial µTechnology Research Institute, has added barometric pressure sensor test and calibration to its test services offering. SITRI extends its MEMS test capabilities, based on an Xcerra Test Cell solution that includes an LTX-Credence Diamond tester, a Multitest InStrip handler and the Multitest InGyro, with the InBaro test module. The flexible and modular MEMS handling system of Multitest facilitates switching form one MEMS stimulus to another using the same base handler.

Whereas the InGyro module provides physical stimulation for inertial sensors, the InBaro supports environmental applications requiring barometric pressure conditions for calibration and testing of MEMS devices. Both set-ups feature a full temperature range from -40°C to +125°C.

The test cell for barometric test enables SITRI to provide multisite, cost efficient, accurate and reliable tri-temperature test for environmental sensors. The InBaro-based system supports very fast switching between various pressure levels, making it possible to efficiently test and calibrate at multiple pressure levels within a single insertion, ensuring fast test times even for comprehensive test cases. It can be upgraded to InHumid, which adds humidity and gas test capability to the barometric component, thereby supporting highly-integrated environmental sensors.

“The Xcerra test cell approach combines the advantages of a completely pre-validated one-stop solution with the flexibility of a modular set-up,” said Gabriela Born, Xcerra Director InMEMS and IoT Products “SITRI strategically leverages this feature to reconfigure the set-up to meet the requirements of new applications.”

To learn more about the Xcerra Test Cell Innovation, please visit http://xcerra.com/tci