“Fan-IN WLCSP Test Strategy”
Date: Tuesday, October 24
Time: 9:30 – 10:00 a.m.
Session 3: Advanced Manufacturing & Test
Speaker: Mike Frazier (Senior Director Global Business Development)
Wafer Level Chip Scale Package (WLCSP) devices are used because they offer very low cost, small footprint packages to be directly mounted into smartphones, tablet’s, other mobile devices and automotive applications. The type of technologies targeted for fan-in WLCSP packaging includes PMIC’s transceivers, microcontrollers, IoT applications, MEMS and more.
This paper will explore how the demand from system manufacturers for lower defect parts per million (DPPM) from their suppliers is changing the back end processing of these devices.
Today, the backend process flow for WLCSP devices is a single insertion test at wafersort. With this flow, there is no test that is done after device singulation (wafer saw). The reason for this flow is that there has been no cost effective way to handle singulated WLCSP devices in high volume manufacturing environment. Other changes include increased vision inspection to detect devices that may exhibit eary life failures.