International Test Conference 2016
Fort Worth Convention Center
Fort Worth, TX
Visit our presentation
“Challenges with high volume mmWave test cells”
Date: Wednesday, November 16
Time: 8:30 – 10:00 a.m.
Special Session 5: mmWave ATE HVM Technology
Speaker: John Shelley (Director Business Development)
This presentation reveals challenges encountered in developing a test cell for mmWave in high volume production test. Before and after results are discussed after two years of development and customer trials. Topics will include ATE, handler, and interface challenges, as well as future test concepts.