Over-the-Air (OTA) Integrated Test Solution for Antenna in Package (AiP) 5G, Auto Radar, and WiFi Devices to > 80 GHz

Xcerra combines innovative contacting technology with reliable test handling solution

Multitest recently delivered a production interface solution to a customer for OTA testing of a 60 GHz UltraGig single-chip integrated Antenna in Package (AiP). The solution integrates the xWave OTA Contactor with xWave patch antenna in the MT2168XT leadbacker.

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Substantial Yield Improvements with ECT’s LFRE Probes for PCBA Testing

ECT probes with proprietary lead-free plating passed extensive qualification at a major US based OEM

Everett Charles Technologies’ (ECT’s) LFRE plated probes successfully passed extensive qualification testing verses an incumbent probe at a major US based OEM for power infrastructure equipment. ECT’s LFRE proprietary plated spring probes demonstrated a significant improvement in first pass yield and fully met the customer’s expectations in contact reliability and probe life.

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atg Luther & Maelzer to exhibit at CTEX 2018, in Suzhou

New Generation Flying Probe Test and Innovative Grid Test Equipment

atg Luther & Maelzer will exhibit its leading test solutions for PCBs at the upcoming CTEX 2018 show scheduled to take place May 16 -18, 2018 at the Suzhou International Expo Center, China.

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Smart Maintenance Mechanics Ensure Significantly Higher Uptime: Multitest Quick Lock for Test Sockets

Multitest’s Quick Lock Contact Unit Holder (CUH) for ecoAMP and DuraKelvin Plunge-to-Board set-ups on the MT9928 gravity feed handler has been adopted as the standard mounting solution by one of Multitest’s largest automotive customers. Quick Lock demonstrated substantial reductions in maintenance, debugging, and repair times. Read more

Enhancing IC Production Quality: Multitest MT2168 Pick-and-Place Handler option for avoiding ESD pre-damages

The Multitest MT2168 pick-and-place handler now offers a ground fault monitoring option. The ground fault monitoring option is part of a feature set that will enhance the value of the production output at the customer site. Ground fault monitoring is an important feature for meeting advanced quality standards. Read more

ECT’s High Performance RF Coaxial Test Probe Passed Critical Qualification at a Major Medical Device Company

Everett Charles Technologies’ (ECT’s) CSP-30ES-013 high performance RF coaxial test probe successfully passed an intensive 6 month qualification test process at a major medical device manufacturer. The CSP-30ES-013 probe demonstrated that its innovative features result in superior performance and ease of use. The CSP-30ES-013 was specifically designed to mate with female SMA connectors without any of the mechanical stress caused by a standard male SMA connector. The probe provides an instrumentation quality interface for broadband RF measurements in excess of 20 GHz.

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Multitest High Voltage Contactors: Proven Solutions for Automotive Test Applications

Multitest’s customized high voltage contacting solutions have been well accepted for volume production. Multitest receive a significantly increased order volume from automotive customers for it Blue Line Cantilever Technology sockets: nanoKelvin, Dura Kelvin, and ECON. Multitest high voltage contactors have proven best performance for reliable high voltage tests at full specification values.

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Sealed Compliant Connectors for Harsh Environments

Everett Charles Technologies meets critical requirements for a high reliability radio application

Everett Charles Technologies’ (ECT) Compliant Connector solution for a high reliable communication system was accepted and will go into production at a North American customer. In close cooperation with the customer, ECT developed a dedicated probe that meets several critical requirements including short overall length, biased ball design with high compliance ratio for high current, and an over-moldable probe that is dive depth rated.

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Everett Charles Technologies to exhibit at International Battery Show 2018

Leading Connector and Probe Solutions Meeting the Requirements of Challenging Applications

Everett Charles Technologies (ECT) will exhibit its leading Electronic Interconnect Solutions at the upcoming International Battery Show taking place March 26 to 29, at the Fort Lauderdale Convention Centre, Florida.

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Multitest Contactors for Greatest Flexibility and Best Performance for Testing Wafer Level Chip Scale Packages

Expanding the range of Gemini Kelvin from WLCSP 0.3 mm pitch to 0.5 mm pitch

Multitest adding the Gemini Kelvin 050 for 0.5 mm pitch contacting continues to address the expanding requirements of its customers for reliable interface solutions for testing packages with continuously shrinking dies, which are needed for smaller, lower current, and faster end-user devices. The Gemini Kelvin contactor solutions are known for being the most reliable cost effective solution for increasing OEE in test.

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