As application for IoT continue to expand in smart cities, home automation, connected vehicles, and health care, this has become a significant growth driver for semiconductor devices. Meeting the challenges of double digit growth in unit volumes, relentless cost pressure and the ability to address a variety of sensors are required to succeed in this technology. We introduce an advanced mass production test technique for various sensors.
Presented at: Semicon Japan 2016
Presented by: Hidenori Kakizaki (Application Engineer)
Date: December 2016
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