Radar based active safety systems are in the automotive market today, enabling key applications such as emergency braking, adaptive cruise control, blind-spot monitoring, and cross-traffic alert. The industry is heavily invested in removing the challenges of integrating these functional applications into a cohesive system that will enable Autonomous Driving. Adoption is increasing with research estimating the market to grow to more than 50 million radar sensors in 20211, a 23 percent year-on-year increase from today.
NXP’s MR2001 is a high-performance 77 GHz radar transceiver chipset that is scalable for multi-channel operation enabling a single radar platform with electronic beam steering and wide field-of-view to for long, mid-, and short-range radar applications. The market acceptance of the MR2001 chipset is driving innovation in final test methodologies and hardware.
This presentation will review Automotive Radar test requirements for the MR2001 products at Final Test, describe the existing test process and hardware. Integration of tester, handler and interface equipment is critical to ensure delivery of quality product to the end customer. Significant challenges were overcome to implement a stable test cell related to reliable contacting, thermal stability, and process control to ultimately achieve the repeatable electrical evaluation of devices. This paper will describe the challenges and results of a contactor based Final Test at 77 GHz using the Xcerra MMW contactor solution. Impact of handler properties, lead frame and pogo pin wear, contact resistance, and solder ball damage on measuring critical RF parameters over the frequency band of 76 to 77 GHz is described.
1 IHS, Advanced Driver Assistance Applications Semiconductor Market Tracker – H1 2015
Presented at: BiTS 2017
Presented by: Brian Nakai (NXP Semiconductors)
Date: March 2017
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