ECT’s ZIP™ Z0-040 Spring Probe Increased Life by 500% in Head to Head Comparison

Z0-040RHJ High Performance Spring Probe for semiconductor test out performs the competition in a challenging application contacting NiPd pads

Everett Charles Technologies (ECT) successfully won a head-to-head evaluation using Z0-040 probes made with HyperCore™ material in a high volume production environment at a large Asian OSAT. The Z0 probes reached 250k insertions, more than a 500% increase of the probe life compared to the competitor’s spring probe while exceeding first pass yield expectations.

Z0-040RHJ went head to head in an evaluation with another industry leading probe. The customer was in search of a longer lasting probe that would lower total cost of test.  The application required reliable and repeatable contacting of NiPd pads, which are known to be very challenging due to their hardness and abrasiveness. The primary goal of the evaluation was to increase probe life and lower cost of test. The target parameters for success were to exceed 200k insertions while maintaining consistent 1st pass yield performance.

ZIP Z0 probes built from HyperCore present a new level of accuracy, scalability and performance. The proprietary non-plated, homogenous probe material possesses properties that prevent oxidation, ensuring premium performance throughout high volume production cycles. With 600 Knoop hardness, the probe is inert to common wear related to contacting hard, rough surfaces and abrasive cleaning. Additionally, ECT’s patented ZIP Z0 probes feature a number of innovative design features that provide superior contact capability. ZIP Z0 probes have a large internal contact area resulting in low contact resistance, superior bandwidth and excellent conductance.

Tony DeRosa, Senior Product Manager explains: “In applications like this one, our proprietary Hypercore material provides a substantial advantage due to its extraordinary hardness. We are proud that based on the evaluation performance the customer qualified ZIP Z0 for their most challenging applications where DUT pads are comprised of NiPd.  Customer’s production has begun to transfer contactor designs to Z0.

To learn more about ZIP™, please visit http://ect-cpg.com/semiconductor-probes