Xcerra’s New Ultra-Compact DxV: Accelerated Time-to-Volume

DxV enables new ways to reduce time from design validation to volume production

Xcerra Tester Group launches the DxV ­-  an ultra-compact ATE with 5 high performance instrument slots, which has been designed for production and evaluation lab use. The DxV completes Xcerra’s toolset supporting efforts for fastest time-to-volume.

The DxV is a five slot variant of the successful Diamondx platform. It is a compact self-contained single ‘box’ solution providing 5 configurable slots for a range of standard Diamondx instruments. The DxV features a fully integrated, production worthy ATE design in ultra-small dimensions, portability, and low weight. The system is designed for low acoustic noise of 55 dB enabling deployment of the DxV in office spaces and engineering labs.
For initial production configuration the DxV features direct or cable dock, and a light portable manipulator option. The DxV is easy to set up and runs the full suite of Unison production tools. The DxV facilitates the transitions to high volume production on the Diamondx, as it uses the same test software and runs the same program.

Together with established Xcerra tools for silicon development the DxV enables the customers to efficiently improve their time-to-volume. The comprehensive Xcerra toolset supports the entire process from design to ´validation to production readiness and finally volume production.

The DxV provides a low cost high density ATE in a small portable and flexible package, offering all the advantages of a mainstream ATE but allows bench to production use.

To learn more about the DxV, please visit http://ltxc.com/DxV

ECT Launches New Probe for High Performance RF Signal Testing of PCBAs

The ECT CSP-30TS-011 has been designed to perfectly mate with PCBA test pads and vias

Everett Charles Technologies (ECT) recently added the CSP-30TS-011 to its industry-proven portfolio of high frequency probes for the PCBA test market. This next generation coaxial probe provides instrumentation-quality interface for broadband RF measurements exceeding 20GHz, delivering superior performance while seamlessly mating with pads, vias, and other board features. The CSP-30TS-011 RF probe combines several innovative features to provide a truly reliable and cost-effective testing solution.

The CSP-30TS-011 is compatible with other ECT ICT/FT probes and features an open architecture format that can be configured with up to 4 easy-to-replace ground probes.  With an insertion loss (S21) in excess of 20 GHz @ -1dB and a consistent impedance of 50 Ohm, the CSP-30TS-011 offers outstanding signal integrity and measurement capability. The CSP-30TS-011 provides spring-loaded compliance for both the center signal probe and the outer ground probes, while the knurl housing feature allows for easy and reliable press fit mounting.

Tony DeRosa, Senior Product Manager, explains: “We absolutely see the need for reliable, high performance and cost-efficient RF probe solutions in the PCBA test market. We launched this new probe to support our customers in high speed, high volume testing as well as in engineering labs.”

To learn more details about CPS-30TS-011 please visit https://shop.ect-cpg.com/product/CSP-30TS-011

Multitest MiCon® Contactor: Advantages of Cantilever Design for MCU and ASIC Testing

Significant Improvements in Overall Equipment Efficiency (OEE)

Multitest recently launched the MiCon contactor. The MiCon leverages the industry-proven Cantilever technology for the final test of Microcontrollers, Industrial DSPs and Application Specific ICs. Evaluations at customer test floors showed substantial improvements in first pass yield, life span and cleaning cycles compared to spring pin solutions. MiCon fully supports the requirements of a high, stable and reliable production output at lowest cost of test.

MiCon leverages the proven Cantilever technology for an architecture, which matches existing spring pin test boards and provides self-cleaning wipe. MiCon is a spring pin  footprint compatible alternative supporting advanced temperature requirements as well as advanced power/current requirements. The footprint compatibility allows for easy and cost-efficient conversion from spring pin setups. The fully decoupled load board side of the spring ensure no degradation of the load board pad.

MiCon features a single piece design, which ensures a long lifespan, low and stable contact resistance, high current carrying capability and an extended temperature range. The MiCon allows for testing at full specification values. The extended operating range accommodates device lead trim and form variability such as device alignment accuracy and device lead coplanarity.

Marcel Sans, Project Manager, explains: “The performance reports, received from the onsite customer evaluations, showed extraordinary advantages compared to the traditional spring pin solutions with a first pass yield of 99.8 %, time between cleaning cycles more than doubled and provided full contacting performance without signs yield degradations at high insertions counts, beyond the spring pins end of life.”

To learn more about the Multitest MiCon contactor, please visit http://multitest.com/MiCon

Multitest Atlas Contactor Demonstrates Advanced Electrical and Mechanical Performance in WLCSP Testing

Atlas 0.3 mm pitch spring probe validated at customer site

Multitest’s new 0.3 mm pitch Atlas contactor successfully passed a demanding customer production floor evaluation. The customer’s evaluation measures confirmed that the Atlas did reduce the customer’s cost of test while improving test yield and increasing throughput. Based on the evaluation results, the customer ordered a significant number of Atlas 030 contactors to support their new product WLCSP production ramp.

The customer is a long time user of Multitest contactors and after reviewing the new Atlas design they were eager to evaluate it. It is the added strength of the Atlas cruciform tip that captured the customer’s attention.  Not only is the Atlas mechanically superior, the Atlas offers electrical performance that allows the customer to test to the true performance of the device. The evaluation ended with the customer placing an order for a significant quantity of Atlas 030 contactors.

The key to the WLCSP Atlas’s high performance, high reliability and superior electrical contacting is the combination of increased mechanical tip strength and short probe electrical performance.  Atlas WLCSP test contactors achieve mechanical reliability with a rigid “cruciform” tip applied to Multitest’s QuadTech flat probe technology.  The Atlas 030 offers a short electrical path, with lower capacitance and inductance that is ideal for functional and AC parametric testing of WLCSP devices that require high system bandwidth and throughput gains in large multisite test applications.

The cruciform tip provides increased tip rigidity with a much greater immunity to breakage than traditional WLCPS probes used in earlier-generation test sockets. The Atlas 030 has 0.310 mm of compliance for bump structures that requires a larger compliance window for reliable contacting in high parallel test applications.

Bert Brost, Senior Product Managers, explains: “We are very proud of the positive result of the evaluation. The evaluation by the customer confirmed what we already knew, the Atlas 030 contactor is a high performance solution for WLCSP testing.”

To learn more about the Multitest Atlas contactor, please visit http://multitest.com/atlas

ECT High Current Probes Leverage over 50 Years of Industry Leading Experience

A comprehensive high current product portfolio provides both technical and commercial advantages to the customer

ECT high current probes are an optimal choice for testing PCBAs and electronic assemblies as well as embedded OEM applications. With multiple options ranging from 10 A up to 150 A DC, ECT offers cost-effective and highly reliable solutions to address the major technical challenges facing high current probes: consistent high current carrying capacity and low heat dissipation.

ECT high current spring probes provide customers with a broad range of proven capabilities. Their rugged design is optimized to ensure solid contact and resistance as low as 5 mOhm, making them ideal for inline applications. The probe tips have been engineered to maximize contact surface area and reduce arcing.

Tony DeRosa, Senior Product Manager, explains:”All ECT high current probes are designed to optimize current carrying capacity and minimize path resistance. Our engineering team utilizes highly conductive materials and platings, ensuring maximum current carrying capacity, wear resistance, and thermal integrity. All high current probes are designed to provide extreme durability while offering high, stable contact force; the ECT 100A probe has a spring force of about 8 lbs. while the flat tip geometry and ECT’s bias ball architecture ensure low resistance.”

ECT high current spring probes are well-suited to a variety of applications, from in-circuit and industrial testing to OEM applications. They offer an ideal solution for both high volume production and engineering test lab environments, and end- users include board test houses, fixture companies, and direct OEM customers.”

To learn more about ECT high current spring probes, visit http://ect-cpg.com/hc-probes

Expanding Capabilities for Temperature Testing

Multitest Soak Booster for Significant Reduction of Soaking Time

Multitest recently installed the well-established tri-temp handler MT9928 with an enhanced Soak Booster option. The Soak Booster cuts down the soak time by up to 50%. Multitest is currently the only company offering this kind of advanced technology for gravity handlers.

With this development Multitest is responding to the market need for temperature testing of large devices where soak time closely correlates with throughput,  and as a result, impacts the cost of test. High-volume production test of automotive devices is one market that benefits from this enhanced Soak Booster capability.

Whereas the industry standard for gravity handling is thermal heat transfer by radiation from track to device, Soak Booster uses convection as transfer principle. The temperature controlled air is blown directly to the device.

The “Soak Booster” option is built on Multitest’s excellence in temperature test solutions and is available for SO packages down to 300 mil in size.

To learn more about the MT9928 gravity handler, please visit http://multitest.com/mt9928

Proven RF Performance Based on Proprietary Design

Link HB Contactor Compensates for HIB Tolerances

Multitest’s Link HB contactor exhibited excellent RF performance at customer sites ensuring ultra-clean high speed signals. The patent-pending design adds boardside compliance to compensate for board fabrication tolerances ensuring increased contact reliability and multisite stability.

Based on the well-established offset vertical architecture of the Link contactor, Multitest has developed the Link HB which adds boardside compliance with improved pin/pad concentrated contact. The proprietary design of the Link HB (patent pending) compensates for load board planarity tolerances, which are particularly critical in multisite applications.

The offset vertical architecture of the Link contactor family is designed to support superior test yield, maximum repeatability and low repair and replacement cost. The wipe motion of the probe provides scrub through oxides on the IC pads and cleans itself when moving back to its original free height.

This motion is fully decoupled from the connection to the test interface board resulting in a stable connection between the probe and the load board pad, avoiding pad wear and carbon debris buildup. This implementation also eliminates the potential for arcing between the probe and the test interface board pad.

Tony Tiengtum, Product Manager, commented, “Two recent European customers have confirmed the superior performance of the Link HB contactor.  In feedback to us they said the actual performance of the contactor was as advertised and went on to say that the Link contactor technology made it seem like the sockets were essentially transparent from an electrical perspective.”

To learn more about the Multitest Link Contactor family, please visit http://multitest.com/link

ECT Launches Next Generation Probe for High Performance RF Signal Testing of PCBAs

The ECT CSP-30ES-013 probe brings performance and ease-of-use to the next level

Everett Charles Technologies (ECT) recently launched a high frequency test probe for the PCBA test market. The CSP-30ES-013 radio frequency probe mates to standard SMA connectors and combines proven RF performance with ease-of-use to ensure accurate and reliable testing. The CSP-30ES-013 coaxial probe provides an instrumentation-quality interface for broadband RF measurements in excess of 20 GHz, providing a cost-efficient solution for high volume board testing. With the addition of the CSP-30ES-013 high performance radio frequency probe, ECT expands its industry-proven high speed test interface portfolio.

The CSP-30ES-013 offers outstanding signal integrity and is capable of bandwidth measurements in excess of 20 GHz @ -1dB. With the CSP-30ES-013 RF probe, high frequency and functional tests can be performed in both high volume testing and engineering lab environments. Accurate small signal and RF power (50 Watts) measurements provide consistent and repeatable results. The CSP-30ES-013 ensures a consistent impedance of 50 Ohm.

The CSP-30ES-013 provides spring-loaded compliance for both the center signal probe and outer housing that provides ground contact. The articulated contact allows for targeting errors. The CSP-30ES-013 features a rugged design for inline applications and an easy to replace center conductor probe (SPL-30E-030). The knurl housing feature ensures easy and reliable press fit mounting.

Tony DeRosa, Senior Product Manager, confirms: “The CSP-30ES-013 probe meets the need for cost effective, high performance functional testing at high speed.  Our engineers designed this probe to mate with SMA connectors and to provide excellent performance for our board test customers in both engineering characterization and high volume applications. It leverages Xcerra’s extensive knowledge in providing solutions for signal integrity sensitive applications, and we have over 15 years experience simulating complex test structures including probes, PCBA’s and launches. We build and test many structures to validate our products and corresponding models.”

To learn more details about CSP-30ES-013, please visit https://shop.ect-cpg.com/product/csp-30es-013

 

atg Luther & Maelzer to exhibit at CTEX 2017, in Suzhou

New Generation Flying Probe Test and Innovative Grid Test Equipment

atg Luther & Maelzer will exhibit its leading test solutions for PCBs at the upcoming CTEX 2017 show scheduled to take place May 17 -19, 2017 at the Suzhou International Expo Center, China.

At CTEX 2017 show, atg Luther & Maelzer will showcase its recently launched A8a Automatic Bare Board Flying Probe Test System. The A8a provides the flexibility of flying probe test while delivering high throughput. The A8a is atg Luther & Maelzer’s latest innovation in high performance, high accuracy automatic flying probe testing. The A8a can significantly contribute to the profitability of our customers by combining flexibility, which is typical for flying probe test equipment, with high throughput exceeding capabilities of standard flying probe testers.

To learn more about the A8a, please visit http://atg-lm.com/A8a

The LM1000, a member of  atg Luther & Maelzer’s leading grid test solutions family, will also be showcased. This dual-technology grid test system has been designed to support the mass production requirements of the HDI market. It supports both cost-efficient universal fixtures and dedicated fixtures for high end applications. Please visit http://atg-lm.com/LM1000 for more details.

For more information about atg Luther & Maelzer’s PCB and substrate test solutions, meet company representatives at the show or visit www.atg-LM.com

High Volume Test for Absolute Pressure Sensors

Multitest InPressure HD System Released to Production for Automotive Application

Multitest’s new InPressure HD system successfully passed all correlation tests on a customer test floor and has been released to production testing sensors for an automotive application. Multitest InPressure HD brings the field proven InPressure solution for absolute pressure test to the next level of parallel testing with up to 1440 signal lines.

InPressure HD is the next generation automotive test solution for absolute pressure sensors up to 16 bar. In addition to the increased number of signal lines, the form factor of the strip or carrier has been increased to 70 x 250 mm.

The InPressure HD supports strip-like InCarrier test. InCarrier based testing is known for low jam rates, high first pass yield and best temperature accuracy, ensuring high OEE even for challenging applications including automotive and industrial.
Short pressure setting times of below 2 seconds, as well as a parallel soaking architecture, enable the high throughput of this high volume manufacturing (HVM) test solution.

The InPressure HD continues Multitest’s modular InMEMS machine concept, which provides highest flexibility to customers by enabling different stimulus configurations for different sensor types.

Andreas Nagy, Senior Director Handler Group Marketing and Test Cell Innovation, comments: “The InPressure HD is the next generation solution for reliable HVM absolute pressure sensor test and calibration up to 16 bar, both of which are typically required in the automotive and industrial pressure sensor market. “

To learn more about the Multitest sensor test portfolio, please visit http://multitest.com/inmems/