Supporting Growth of Integrated Environmental Sensors

Multitest InHumid for testing of environmental combo sensors successfully installed

Multitest’s first InHumid test system for final test of environmental sensors was successfully installed at a major European IDM. The Multitest solution allows for high volume single-insertion test and calibration of integrated environmental sensors measuring pressure, temperature, humidity and gas.

InHumid is an optional upgrade to Multitest’s well-established InBaro module, adding humidity and gas test to the barometric test capability provided by InBaro. The physical structures to apply humid air or gas flow to the DUT reside inside the conversion kit. This architecture facilitates easy upgrading in the field. For testing the gas element of environmental sensors InHumid can be extended by a gas option. This option provides the measures needed to operate the machine in a safe manner when testing typical environmental, gases traced in air quality monitoring, or personal fitness applications (e.g. connections to attach to a general exhaust system).

The InHumid solution fully leverages the temperature capabilities and proven high volume performance of the InBaro/InStrip set-up. Like with InBaro InHumid can be used in a Multitest InCarrier set up to support reliable and robust test handling of small MEMS packages, which are typical for environmental sensors in consumer applications.

Gabriela Born, Director InMEMS and IoT Products, comments: “Our customers are experiencing a growing demand for environmental sensors mainly driven by expanding applications on consumer devices. In particular gas sensors in smartphones and wearables are expected to raise the number of shipped units exponentially over the next 4 to 5 years. To meet this demand, true high-volume production solutions will be necessary, which provide reliable test at low cost per unit.”

To learn more about the Multitest sensor test portfolio, please visit

Combining Leading Temperature Performance with Highest Flexibility for Pick and Place Handling

Multitest has shipped the first MT2168 XT for ambient/hot/cold applications

Multitest shipped the first MT2168 XT tri-temp pick and place handler to a major IDM. The MT2168 XT combines the innovative architecture of the MT2168 ambient/hot handler with leading temperature test performance, for which Multitest has been known for decades. The MT2168 XT offers greatest flexibility and best performance for highest return on investment and lowest cost of test.

It leverages more than 30 years of experience in test handling and the technology leadership in temperature test. The MT2168 XT provides a reliable test handling solution for the complete range of packages, which are usually provided in trays, at ambient, ambient/hot and ambient/hot/cold temperature conditions.

The innovative architecture and material flow offers significant advantages in throughput, stability and reliability, as well as, floor space requirements and conversion kit cost.

A wide range of options allow for extending the capabilities of the MT2168 XT in the field according to actual needs. The site pitch kit supports a fully flexible contact site layout to comply with the design of existing load boards. Sophisticated plunging solutions ensure best first pass yield in high volume production.

Günther Jeserer, Vice President Gravity and Pick & Place Products, comments: “Even before the public launch of this new pick and place handler, we received multiple orders from our customers, which see the unique advantage of this highly modular and scalable tri-temp handler. The MT2168 XT leverages both, the innovative design of our MT2168 platform and the more than 30 years of Multitest’s experience in test handling – particularly in temperature testing. It provides a state-of-the-art test handling solution for today’s applications and is well equipped to meet future requirements.”

To learn more about the MT2168 XT tri-temp pick and place handler, please visit

High Volume Testing of Fingerprint Sensors with Multitest InStrip

Major OSAT deploys Multitests solution for an application of one of the worlds leading fingerprint sensor companies

Multitest’s InStrip has been selected to be the platform of a set up for high parallel testing of fingerprint sensors in China. The solution relies on Multitest’s well established and production proven InStrip / InCarrier, which is extended to fingerprint testing by a dedicated conversion kit (CK).

Andreas Bursian, Director InStrip & InMEMS Products, explains: “Fingerprint sensing technology has been considered to be one of the most reliable and cost effective biometrics technologies. Currently, we see a rapid growth in the demand for fingerprint sensors mostly driven by uses in consumer applications and smart homes but also for governmental and industrial security. The market is expecting to experience a double digit growth rate in the coming five years. This requires high volume proven test solutions. With testing up to 90 devices in parallel, Multitest offers a unique solution, which exceeds the parallel test capability of alternative (wafer probing) solution significantly.”

To learn more about Multitest’s MEMS test solution for high parallel testing, please visit

Multitest Introduces ACE Contactor:

Cost-efficient contactor solution for best RF performance

Multitest recently introduces the ACE Contactor, which offer optimal RF performance for fine pitch FBGA, QFN and wafer-level packages at an attractive. Typical applications for this new contactor are Power Amplifiers, RF switches and mobile communications.

The ACE probe has a revolutionary, which provides exceptional electrical performance, both DC and RF. The ACE probe is manufactured from HyperCore™ base material, which is a proprietary material of Xcerra’s ECT Contact Product Group. HyperCore™ combines the mechanical properties of high carbon steel, with the electrical properties of BeCu and non-oxidizing properties of a precious metal.

The materials and architecture create a very robust probe with a very working life and best yield. The electrical and mechanical performance, combined with the long probe life, deliver low overall cost of test, which are unprecedented for RF contactors.

Within the range of applications the ACE probe are compatible with all device types, platings, and pitches; and all test applications, including singulated devices, strip test and wafer-scale test. The ACE contactor supports pitches down to 0.4 mm.

Jason Mroczkowski, Director RF Product Development and Marketing explains: “ACE contactor has been evaluated by initial customers, which report significant improvements compared to other solutions: More than double the probe life and substantially better figures for current consumption, gain, standard deviation, and power efficiency.”

To learn more about the Multitest ACE Contactor, please visit

Multitest Launches Atlas Contactor: Cost-Efficient High Performance Solution for Large I/O Count Devices in High End Digital Applications

Multitest recently launched the Atlas contactor, which has been optimized for cost-efficient and reliable testing of high end digital high ball count BGAs. Based on the well-established Multitest QuadTech flat probe technology, the Atlas contactor combines advanced mechanical and electrical probe technology for improved functionality and performance in manual test and automated test.

With an optimal insertion force and a large compliance window, the Atlas provides ultra-stable contact resistance over hundreds of thousands of device insertions. The Atlas can be configured for use without a floating alignment plate. The low Atlas per pin insertion force significantly reduces insertion strain on automated test handling systems while making the Atlas easier to use in manual test.

Atlas’ mechanical integrity includes the controlled insertion forces that are determined by the compression of a precision alloy stainless steel spring. Properties of the spring are engineered to offer predictable long-term performance over a broad temperature range: -50° to +150° C along with a typical life of 500K insertions. Atlas 040 insertion forces are controlled to just 25 grams per pin.

The insertion loss of Atlas 040 is measured at 18.5 GHz @-1dB while the return loss is measures at 14.72 GHz @ -20dB. The Atlas’ bandwidth supports the spectral content of most high speed digital device for ensuring great signal fidelity for maintaining digital edge rates. With a test height of only 3.53 mm, the Atlas 040 has the bandwidth for obtaining superb signal fidelity.

The Atlas design combines fine pitch capability with reduced contact height, force, and no damage zone contacting to meet the contacting needs of next generation for advanced high-end digital devices with typically 600 to 5,000 ball count range.

Bert Brost, Product Managers, explains: “Currently the Atlas contactor supports pitches down to 0.4 mm. Soon we will launch the Atlas for 0.3 mm pitches continuing the miniaturization and advancement of our field proven QuadTech flat probe technology

To learn more about the Multitest Atlas contactor, please visit

Expanding Application Range to Challenging SOT23 Packages

Multitests Tri-Temp Gravity Handler MT9928 supports SOT23 Devices

Multitest recently shipped a high volume test handling solution for SOT23 packages. The innovative conversion kit design allows for tri-temp testing of SOT23 packages on the production proven MT9928 gravity handler.

Traditionally, these packages were handled on turret handlers, but these types of handlers do not support temperature testing. With a growing number of SOT23 application, which require testing at various temperatures, this is no longer sufficient.

The new Multitest kit design applies an innovative guiding principle, which is able to handle packages with missing upper body mold e.g. the SOT23 package with 4, 5 or 6 leads.

With more than 1100 installations the MT9928 is well-established and provides field proven reliability and performances. Its modular and scalable design and the variety of options allow configuration of the MT9928 exactly according to the test needs. The MT9928 offers a large soak capacity and supports the entire ambient-hot-cold temperature range at outstanding accuracy and stability.

To learn more about the MT9928 gravity handler, please visit

Efficient Testing of Environmental Sensors

Multitest InBaro will expand test capacity at a European IDM

Multitest’s InBaro test module for barometric sensors continues to expand its footprint in the growing MEMS and sensor market. The Multitest InBaro was recently shipped on a repeat order to a major European semiconductor manufacturer expanding the capacity for testing barometric sensors. The increasing volumes associated with these types of sensors are driven mainly by consumer applications used to monitor their environment or aid in indoor navigation. The Multitest InBaro delivers a high return on investment because it offers the greatest flexibility and supports the most cost-efficient test and calibration, which is particularly important to meet the requirements of this fast-growing market.

InBaro is part of Multitest’s broad portfolio of InMEMS modules that work in combination with Multitest’s proven InStrip handler. It is designed according to Multitest’s modular concept for MEMS test and calibration, facilitating system conversion to other MEMS/sensor test applications, e.g. for gyroscope or microphone test. InBaro offers a high degree of flexibility. It can be upgraded to InHumid, which adds humidity and gas test capability to the barometric component thereby supporting highly-integrated environmental sensors.

InBaro-based systems are designed to switch very fast between various pressure levels. Therefore it is possible to efficiently test and calibrate the sensors at multiple pressure levels within a single insertion, ensuring fast test times even for comprehensive test cases.

The InBaro can be used in a Multitest InCarrier set up to support reliable and robust test handling of small MEMS packages, which are typical for environmental sensors in consumer applications.

Garbiela Born, Director InMEMS and IoT Products, comments: “We are proud of this repeat order. It confirms that the system meets the expectations of the customer. In addition to the small package handling capability, cost-efficiency and flexibility, which all are key performance factors of the players competing in this end market, the customer particularly recognized the temperature accuracy of the system.”

To learn more about the Multitest sensor test portfolio, please visit

Ensuring Temperature Accuracy for Testing of High Pin Count Packages

Multitest MT2168 Pick-and-Place Handler offers advanced temperature control features

The Multitest MT2168 pick-and-place handler now offers an optional active socket purge (ASP). The ASP completes the portfolio of advanced temperature control features of the MT2168, which include Active Temperature Control (ATC), Cold Test for Characterization on the ambient / hot base handler version and now the ASP.

The ASP keeps the temperature contact pin in the socket on the set test temperature by applying a thermal controlled air flow to the pins. Particularly for high pin count devices this has significant influence on the overall temperature performance and reduces the temperature calibration efforts. The ASP can be configured with up to 16 independent sets of temperature sensor, controller and heater to ensure best temperature accuracy for each device under test.

Günther Jeserer, VP Gravity and Pick & Place Products, explains: “We continue to develop advanced features for the MT2168 to expand the capabilities of this leading pick and place handler. To achieve the advanced temperature performance we leveraged the more than 25 years of expertise within the Company and a wide range of production proven developments. All new features of the MT2168 will be available on the new MT2168 XT handler ambient/hot/cold test, which will be officially released later this year.”

To learn more about the Multitest MT2168, please visit

MicroLink: Miniaturization of Link Technology for Small Pitches and Advanced Electrical Requirements

Multitest leverages the innovative and field proven Link technology to develop MicroLink – a probe which addresses advanced electrical test requirements for lower inductance and better signal integrity.

The MicroLink probe offers enhanced performance in all major electrical categories: impedance, insertion loss, inductance, contact resistance, and signal integrity. The signal path has been shortened to 0.373 mm. MicroLink supports RF applications with 60GHz and higher.

Mechanically the MicroLink probe features optimized contact wipe and pointing accuracy, which makes it most appropriate for packages with a pitch down to 0.3 mm.

Tony Tiengtum, Product Managers, confirms: “MicroLink is a field proven re-design of the well-established Link technology, which allows our customers to leverage the benefits of the Link technology for applications with even stricter electrical requirements and/or smaller device pitches. Our customers, which have been deploying MicroLink in production for several months, report that the MicroLink proves superior electrical performance over competitor’s solutions. ”

To learn more, download the MicroLink Fact Sheet: MicroLink FactSheet

MacroLink: Making Link Technology Footprint Compatible to Existing Set-Ups

Multitest offers the field proven Link technology as a replacement option for existing solutions. MacroLink combines full foot print compatibility with production proven electrical and mechanical performance.

MacroLink particularly addresses board wear issues, which customer faced with competitor’s solutions. The MacroLink facilitates the replacement by keeping full compatibility to existing test handler conversion kits and load boards.

For MacroLink the Link probe design has been adjusted to comply with larger offset footprints. Additionally, the probe geometry has been optimized for electrical performance.

Tony Tiengtum, Product Managers, explains: “MacroLink was driven by customers request to replace competitor’s solutions, which caused substantial board wear issues. The design of MacroLink makes it an easy drop-in alternative.”

To learn more, download the MacroLink Fact Sheet: MacroLink Fact Sheet