Multitest Contactors for Greatest Flexibility and Best Performance for Testing Wafer Level Chip Scale Packages

Expanding the range of Gemini Kelvin from WLCSP 0.3 mm pitch to 0.5 mm pitch

Multitest adding the Gemini Kelvin 050 for 0.5 mm pitch contacting continues to address the expanding requirements of its customers for reliable interface solutions for testing packages with continuously shrinking dies, which are needed for smaller, lower current, and faster end-user devices. The Gemini Kelvin contactor solutions are known for being the most reliable cost effective solution for increasing OEE in test.

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Multitest ecoAmp Kelvin: Approved Contactor for Automotive High Volume Production

Major IDM selects ecoAmp Kelvin Contactor for high power testing

Multitest’s ecoAmp Kelvin Contactor successfully passed an in-depth evaluation phase at a major IDM. Based on the performance, which was demonstrated in a challenging high power application, the customer decided to make the Multitest ecoAmp Kelvin Contactor their strategic test interface product for existing and future high power test applications at high volume production.

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Multitest Sensor Test Modules Ready for Increased Productions Needs

Optimizing 6DOF Gyro Test of Singulated Packages

Multitest has been the market leader for MEMS/sensor test and calibration equipment for more than 15 years. Multitest has now launched the next generation of its 6DOF gyro test module for singulated packages, which provides significant production benefits resulting in even lower cost of test, enhanced test accuracy and higher daily output.

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Increasing Test Cell Throughput:

Multitest adds “Super-Sharp” option to Quad Tech probes

Multitest’s Super-Sharp Option for Quad Tech probes provides an increase in test cell throughput and maintains the fidelity of the test signal over longer uninterrupted run times for higher yields. Multitest makes these advantages available to customers at no additional cost.

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Multitest’s Unique Interface Solution for Ultra-High Frequency Testing Delivers Unprecedented Life-Time in Volume Production

mmWave customer case presented at Test Vision

Multitest’s mmWave contactor is a proven broadband production solution for RF applications up to 100 GHz. In a presentation by Jeffrey Finder, Senior Product and Test Engineering Manager at NXP, named “Building a Test Ecosystem for High Volume Manufacturing of 76-81 GHz Semiconductor Radar Sensors” the repeatable and stable performance of mmWave contactor was highlighted for an Automotive Radar Sensor Chipset application. This presentation was given at the Test Vision 2020 workshop at Semicon West in July 2017.
(Download the full presentation here: Download)

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WLCSP Test: Efficient High Volume Solution for Post-Saw Testing

Multitest InWaferX for final test of singulated WLCSPs

Multitest’s new InWaferX final test solution for singulated WLCSPs addresses the increased quality demand for automotive applications as these quality requirements are expanding to cost sensitive, high volume consumer applications. Based on the production proven InCarrier technology, InWaferX ensures highest efficiency and yield for lowest cost of test.

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Multitest Successfully Introduced New Super Sharp Gemini Kelvin Probes

Seamless switch to higher-yield probes

Multitest recently passed an evaluation of new-super-sharp Gemini Kelvin (GMK) probes. The evaluation took place at an OSAT testing devices for a major customer. Although the customer was not experiencing issues with the original GMK probes, they were encouraged to try the super-sharp probes and saw a measurable improvement in both test yield and probe life. The OSAT plans to order all super-sharp probes going forward to help reduce costs and increase throughput.

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Multitest MiCon® Contactor: Advantages of Cantilever Design for MCU and ASIC Testing

Significant Improvements in Overall Equipment Efficiency (OEE)

Multitest recently launched the MiCon contactor. The MiCon leverages the industry-proven Cantilever technology for the final test of Microcontrollers, Industrial DSPs and Application Specific ICs. Evaluations at customer test floors showed substantial improvements in first pass yield, life span and cleaning cycles compared to spring pin solutions. MiCon fully supports the requirements of a high, stable and reliable production output at lowest cost of test.

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Multitest Atlas Contactor Demonstrates Advanced Electrical and Mechanical Performance in WLCSP Testing

Atlas 0.3 mm pitch spring probe validated at customer site

Multitest’s new 0.3 mm pitch Atlas contactor successfully passed a demanding customer production floor evaluation. The customer’s evaluation measures confirmed that the Atlas did reduce the customer’s cost of test while improving test yield and increasing throughput. Based on the evaluation results, the customer ordered a significant number of Atlas 030 contactors to support their new product WLCSP production ramp.

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Expanding Capabilities for Temperature Testing

Multitest Soak Booster for Significant Reduction of Soaking Time

Multitest recently installed the well-established tri-temp handler MT9928 with an enhanced Soak Booster option. The Soak Booster cuts down the soak time by up to 50%. Multitest is currently the only company offering this kind of advanced technology for gravity handlers.

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