Everett Charles Technologies to Exhibit at Space Tech Expo 2016

Leading Probe and Connector Solutions for Challenging Applications

Everett Charles Technologies (ECT) will exhibit its leading probe and connector solutions for the military and aerospace market at the upcoming Space Tech Expo scheduled to take place May 24-26, 2016 at the Pasadena Convention Center, California.

At Space Tech Expo, ECT will showcase its leading portfolio of probes for RF and high current applications, a comprehensive offering of battery probes that feature highly consistent electro-mechanical characteristics and the most flexible and reliable compliant connector solutions. (http://ect-cpg.com/compliant-connectors)

ECT supports a wide range of industrial test applications with high performance RF and high current probes. Leveraging advanced probe designs and materials, ECT’s RF and high current probes are known for excellent electrical performance combined with reliable mechanical characteristics. (http://ect-cpg.com/rf-probes  http://ect-cpg.com/hc-probes)

ECT battery probes are used in a wide range of applications that include docking stations, data transmission, PCB interposers, and contacts for connector assemblies for medical, mil/aero, transportation and more. ECT battery probes ensure consistent, long-life, low-resistance, compliant electrical and mechanical connections. ECT’s versatile line of battery interconnect probes provide design flexibility to match performance, cost, and assembly requirements. In addition, these products can be modified or custom designed to meet specific project requirements. (http://ect-cpg.com/battery-probes)

ECT’s Compliant Connector solutions offer superior durability in for a wide range of high cycle life applications. The spring probe based solutions can maintain consistent electro-mechanical characteristics in excess of million cycles. When mating planer tolerances pose a challenge or longer reach is required, spring probe based connectors ensure best performance. ECT Compliant Connectors are available in configurable off-the-shelf versions or as fully customized designs based on their flexible architecture.

To learn more about the ECT Contact Solutions, visit http://ect-cpg.com

 

 

ECT Accordion™ Technology Used for Innovative High Current Connector Solution

Innovative interconnect design exceeds the limitations of standard spring probes

Everett Charles Technologies (ECT) has developed a customized high current connector for testing electrical power components based on an unprecedented design using ECT’s Accordion™ compliant contacts. In addition to the demanding high power performance this challenging application called for a cutting-edge connector design to comply with the extremely small space limitations and contact surfaces.

The challenge of this project was to transfer continuous current exceeding 50 Amps through small contact surface area, not well suited for standard spring probes. ECT developed a technical solution that gives the customer high cycle life and compressed foot print based on the Accordion™ compliant contact. Compared to standard spring probe solutions, the Accordion™ based design supports higher current and leverages more reliable surface contact.

The Accordion™ compliant contact is a proven solution for high density / high current applications. Accordion™ contacts can be integrated into a connector to provide multiple, independent current paths. The Accordion™ ensures low resistance and reduces power loss and therefore heat loss. Accordion™ contacts placed in parallel overcome contact challenges including irregular surface topography, dirt and debris, and non-parallel connection. In addition, the probe is modular. This allows varying the current capacity as required for each test point, but uses a consistent reliable design.

Tony DeRosa, Product Manager, explains: “For this customer project we designed a compliant connector with a direct current path using multiple independent current paths. We developed this innovative solution leveraging the unique advantages of our Accordion™ contact: flat , single piece compliant spring design for best reliability in high current applications. This customer specific solution packed several Accordion™ contacts together, ensuring side to side contact and specific overlapping, redundant contact points through-out the assembly. No comparable solution had been available to the customer before. It proves once more, how the team at Everett Charles Technologies combines leading-edge technology with innovation and experience to create the best solutions for our customers.”

To learn more about the ECT Accordion, please visit http://ect-cpg.com/accordion

 

Meeting the Needs of OEM Applications: New Everett Charles Technologies Battery Probes

Four new members in the ECT BIP family – specifically designed for the OEM market

Everett Charles Technologies (ECT) recently expanded its portfolio of Battery Interconnect Probes by adding four new probes to the well-established BIP family: BIP-8, BIP-9, BIP-10 and BIP-12. These new products provide customers additional options for overall length, compliance, mounting and force.

ECT battery probes are used in a wide range of applications that include docking stations, data transmission, PCB interposers, and contacts for connector assemblies for medical, mil/aero, transportation and more. Typically battery probes are contained in modules where consistent, long-life, low-resistance, compliant electrical and mechanical connections are required.

Spring probe based solutions can maintain consistent electro-mechanical characteristics in excess of required mission cycles. When mating planar tolerances pose a challenge, or a longer reach is required, spring probes are the preferred solution. ECT’s versatile line of battery interconnect probes provides design flexibility to match performance, cost, and assembly requirements. In addition, these products can be modified or custom designed to meet specific project requirements.

BIP Battery Probes offer superior durability in high cycle life applications and feature industry leading current carrying capacity of 5.0A and probe resistance of under 50 mOhm.

Tony DeRosa, Product Manager, explains: “We understand the need of our customers for a greater range in mechanical form factors at a competitive cost point. With our design expertise and manufacturing capabilities we can help bring competitive products to market faster.”

To learn more about the ECT battery probes, please visit http://ect-cpg.com/battery-probes

 

ECT Introduces the SPP-25 Spring Probes for Solar Panel Test

Leveraging contacting expertise for non-destructive measurements

ECT’s SPP-25 probes are designed specifically to support non-destructive electrical contact at various stages of test during the fabrication process of solar photovoltaic (PV) products. ECT’s reliable and effective solution is well suited for high volume production test which is needed as volumes increase due to alternative energies becoming more mainstream.

Spring probe technology is an ideal solution to provide electrical connection to obtain I-V curve measurements, or providing reliable contact for your challenging high current or low voltage connections. SPP-25 probes feature low, stable resistance, a center close for enhanced pointing accuracy, tip styles designed to distribute spring force across a large area, and two force options; 4oz and 6oz. The probes are specifically designed to yield a linear force –compression relationship as the probe is actuated. This minimizes potentially harmful jumps or steps in force. SPP-25 probes fit into standard Pogo 25 receptacles.

ECT probes are often used for standard or custom automated test equipment and fixture applications which involve simulation, production testing, characterization, validation or failure analysis. ECT has leveraged decades of spring probe design and manufacturing knowhow to create probes that ensure reliable electrical contact without damaging the PV cell.

Tony DeRosa, Senior Product Manager, explains: “Whether you are making contact directly with silicon/thin film circuitry, or the bus bar of your PV device, ECT offers a wide range of sizes, tip styles, and spring forces to accommodate your specific application.”

To learn more about SSP25, please visit: http://ect-cpg.com/solar-panel-probes

 

ECT’s ZIP™ Z0 RF Spring Probe for Semiconductor Test Exceeds Customer Expectations

ZIP probes built from HyperCore™ base material provides superior performance in high volume production

Everett Charles Technologies (ECT) successfully won a head-to-head evaluation of ZIP probes with the HyperCore™ material option in a high volume production environment at a large Chinese OSAT. The Z0 probes reached 450k insertions more than doubling the life of the competitor’s spring probe while exceeding first pass yield expectations.

ZIP is one of several semiconductor test probe families offered by ECT. For this evaluation the ZIP Z0-040RHJ probe was deployed in a multi-site test set-up for a 14L, 0.4mm pitch QFN package. The application was a RF transceiver. Testing was performed at ambient and hot (85°C) conditions. With its 1.5mm test height Z0 is an excellent choice for RF devices requiring low insertion loss (40GHz @ -1dB) and low inductance (0.55nH).

ECT’s patented ZIP probes feature a number of innovative design features that provide superior contact capability. ZIP probes have a large internal contact area resulting in low contact resistance, superior bandwidth and excellent conductance. ZIP probes are built from HyperCore™ and present a new level of accuracy, scalability and performance. The proprietary non-plated, homogenous probe material possesses properties that prevent oxidation, ensuring premium performance throughout high volume production cycles. With a hardness rating of 600 Knoop; ZIP has excellent wear characteristics, is effective for contacting hard DUT surfaces and withstands abrasive cleaning.

Tony DeRosa, Senior Product Manager explains: “Customers are continuously requiring lower cost per insertion. ECT’s ZIP™ probes meet this challenge by bringing value to customers through competitive pricing, high reliability and excellent electrical performance. Our RF simulation and validation capabilities further expands the cost-of-test advantage by providing a high level of confidence that Z0 will meet or exceed critical RF test requirements.”

To learn more about ZIP™ please visit ect-cpg.com/semiconductor-probes

Compliant Connectors Designed to the Project Specifications

Everett Charles Technologies leverage RF simulation expertise to optimize electrical performance of custom connector solutions

Everett Charles Technologies’ (ECT) Compliant Connectors Team successfully developed a custom solution for a demanding medical application in the area of video imaging and endoscopic data. Combining decades of experience in probes with ECT’s expert capability of RF simulation, the solution fully met the mechanical, electrical and environmental specifications while keeping to the customer’s project schedule.

This customer faced a major challenge related to a connector requirement. The connector had to fit into a tightly confined area. Therefore the connector design needed to be very compact. The application was in a very dirty environment. The connector needed to be field cleanable and withstand the environmental conditions. As an added complication, the connector had to maintain a 100 Ohm impedance for proper signal transmission. Finally a life of ten thousands of insertions was required.

ECT provided a custom solution designed to the parameters including high speed signal transmission and mechanical life meeting all electrical and mechanical challenges while keeping to the project’s development time window. ECT’s capabilities of RF signal integrity simulation and validation were key for project success. Accurately predicting electrical performance of the spring probe connector as well as complete circuit performance prior to fabrication was essential to avoid multiple iterations and delays. ECT accurately modeled electrical performance and adjusted design parameters on-the-fly to ensure the prototypes met performance specifications.

Tony DeRosa, Product Manager, commented: “In addition to our off-the-shelf ‘catalog connectors’, which can be configured to customer requirements, we offer solutions fully designed to customer specifications, where standard products can’t meet the entire set of requirements. Our in-house expertise in RF simulation is a unique and valuable asset for this. With our RF simulation and validation capabilities we optimize the design prior to production. This way we ensure both: best performance and fast project completion.”

To learn more about the ECT custom connectors, please visit: www.ect-cpg.com/custom-connectors

 

High Performance Spring Probes for In-circuit and Functional PCBA Test

ECT’s EDGE probe combines leading architecture and materials for lead free applications

Everett Charles Technologies’ (ECT) EDGE probes are the answer to poor first pass yield, short probe life and excessive cleaning cycles, when caused by oxide layer build up or debris, particularly in lead free applications. In volume manufacturing the impact worsens as cycle count increases and elevated levels of debris are transferred to the probe tips.  In many applications effective electrical contact is compromised.

Lead free solder is known to cause many problems during in-circuit testing. Lead free solder has a higher reflow temperature, which can result in harder and stickier solder flux resin and a thicker, harder oxide layer. This thicker layer of resin and oxide is more difficult to penetrate and increases wear on the pogo pin. Lead free solder resin and oxides can also increase debris transfer to spring probes.

ECT’s EDGE probes meet these challenges as well as those found in OSP (organic solderability preservatives) and no-clean applications by combining innovative probe design with the ultra-hard plating material – ECT’s proprietary LFRE hard plating. LFRE plating is significantly harder than the industry’s standard gold plating. LFRE has a hardness range of 550 to 650 Knoop.  LFRE improves tip performance while helping maintain tip sharpness.

EDGE probes feature an ultra sharp tip geometry that is capable of penetrating debris, oxide and OSP layers. The tip radius is 0.0003” and is about 10 times sharper than typical machined probe tips. Additionally, EDGE probes apply ECT’s proven Micro-Wipe bias technique that provides low and consistent internal contact resistance.

Tony DeRosa, Product Manager, explains: “Recently ECT has enhanced key processes related to probe assembly. The results are a more consistent set of mechanical parameters and electrical performance. In addition, the spring design has changed to reduce stress and increase life. EDGE tip geometries have also been optimized to make sustainable, reliable contact to PCB targets such as vias. EDGE is ECT’s answer to your most challenging test contact applications. It combines design, materials and platings expertise along with probe fabrication knowledge.”

For more Information about the ECT In-circuit and Functional Test Probes, please visit: http://ect-cpg.com/ICT-FCT-probes

 

Everett Charles Technologies to exhibit at BIOMEDevice Show 2015

Leading Connector Solutions Meeting Challenging Requirements

Everett Charles Technologies (ECT) will exhibit its leading Compliant Connector Solutions at the upcoming BIOMEDevice Show scheduled to take place December 2 -3, 2015 at the San Jose Exhibition Center, California.

ECT offers a comprehensive portfolio of compliant connectors including customized solutions. ECT’s “standard connectors” are based on a highly flexible architecture, which facilitates cost-efficient configurations for customer requirements. ECT compliant connectors meet the highest quality standards and have proven superior durability in high life cycle applications.

Leveraging decades of experience and a US-based manufacturing, ECT uses application specific materials and contact technology to ensure reliable signal integrity. ECT Compliant Connectors feature sealed connections and are also available for high current and high frequency applications.

ECT continuously strives to offer the best solutions for challenging applications. Recently, ECT launched the Accordion™ probe. Accordion™ is a patented contact technology from ECT that targets high reliability applications. It’s well suited for demanding environments found in medical markets. Accordion spring contacts incorporate a compliant, one-piece spring in an open architecture format to accommodate a wide range of physical circuit topologies. Utilizing a single contact eliminates the threat of liquid and debris build up between parts while also being tolerant of vibration and shock. Accordion offers several surface contact advantages over traditional compliant contacts. One of which is placing multiple contacts per position to allow for single target redundancy.

It can also be designed to provide a controlled scrub which removes oxides and debris from the contact position and its mate. The Accordion scrubbing action ensures surface contact, while the single beam prevents the momentary resistance spikes found in connection systems requiring a wide range of actuation. This versatile contact can be tailored to specific x-y-z envelops and compression force targets.

For more information, please visit: http://ect-cpg.com/compliant-connector or http://ect-cpg.com/accordion

 

LFRE Plated Probes: Substantial Improvement of Test Cell Uptime on PCBA In-circuit Test Applications

ECTs proprietary LFRE plating has been proven to significantly extend probe life and time between cleaning cylces

Everett Charles Technologies (ECT) has proven the exceptional performance of LFRE spring probe products in a challenging evaluation at a major automotive electronics supplier with global manufacturing facilities. The ECT LFRE probes, which were used in an in-circuit test fixture, tripled insertion life and reduced cleaning frequency by a factor of 10 compared to the original set up.

ECT LFRE probes meet the challenges of lead free pads. Lead free solder has a higher reflow temperature, which can result in harder and stickier solder flux resin and a thicker, harder oxide layer. This thicker layer of resin and oxide is more difficult to penetrate and increases wear on the pogo pin. Lead free solder resin and oxides can also increase debris transfer to spring probes. These are many of the issues found in OSP (Organic Solderability Preservatives) and no-clean applications.

ECT’s proprietary LFRE plated probes have two key attributes that make it an ideal choice for the most challenging PCB test applications. LFRE provides a smooth, slick plating surface that not only resists wear but also resists solder and debris transfer. ECT’s LFRE plating is also significantly harder than the industry’s standard gold plating and has a hardness range of 550 to 650 Knoop. This makes the probe tips much more durable and less susceptible to solder and material transfer. LFRE probes incorporate a double roll close, which offers the industry’s best pointing accuracy. Increased pointing accuracy is of benefit when using lead free solder and/or no-clean as the probe is less likely to touch the edge of the pad where the solder flux accumulates.

Tony DeRosa, Product Manager, highlights: “The customer was experiencing excessive cleaning, short probe life, and low first pass yield. Contamination due to excessive solder flux was limiting probe life to only 60k insertions. We were able to improve insertion life to more than 180k cycles and to reduce the cleaning frequency to 2-3 times per week.”

LFRE plated probes leverage ECT’s long-term expertise in materials and platings along with probe fabrication knowledge. The LFLT probe – the long travel version of the LFRE probe – incorporates ECT’s proven PogoPlus bias ball design and double roll close process. Both of which contribute to making sustainable and reliable contact to PCB targets.

LFRE Pogo® pins are available in a variety of spring force choices and pitches. All of ECT’s lead free (LFRE) probes have a spring fatigue life that surpasses 500,000 cycles.

Learn more about the ECT In-circuit and Functional Test Probes: http://ect-cpg.com/ICT-FCT-probes

 

New ECT Accordion™ Technology Provides Reliable Contact in Harsh Environments

Patented interconnect solution offers unprecedented cost and reliability advantages for high insertion count applications

Everett Charles Technologies (ECT) has been supplying spring probes for over 50 years. ECT leverages this industry leading experience for unique, customer focused solutions to the most challenging connector requirements. Accordion™ is a patented contact technology from ECT that targets high reliability applications. It’s well suited for demanding environments found in the military, aerospace and medical markets. Recently the ECT Accordion contact has been selected as interconnect platform solution for a critical signal and power transmission application by a tier one military contractor.

Accordion spring contacts incorporate a compliant, one-piece spring in an open architecture format to accommodate a wide range of physical circuit topologies. The Accordion is ideal for harsh environments. Utilizing a single contact eliminates the threat of liquid and debris build up between parts while also being tolerant of vibration and shock. Accordion offers several surface contact advantages over traditional compliant contacts. One of which is placing multiple contacts per position to allow for single target redundancy.

It can also be designed to provide a controlled scrub which removes oxides and debris from the contact position and its mate. The Accordion scrubbing action ensures surface contact, while the single beam prevents the momentary resistance spikes found in connection systems requiring a wide range of actuation.

This versatile contact can be tailored to specific x-y-z envelops and compression force targets.

Tony DeRosa, Product Manager, explains: “ECT was given the challenge to create an interconnect for harsh environments, where the electrical properties would remain unaffected. Competition was limited to conventional spring probe options and required the development of a costly and unproven sealed design. We at ECT were able to use our patented Accordion technology to produce a single beam contact that is unaffected by liquid, and has the ability to wipe away surface contaminants. The contact form factor was also designed to enable a redundant contact in each position. All of this was accomplished at a cost below that of a custom pogo.”

Learn more about the ECT Accordion: http://ect-cpg.com/accordion