Everett Charles Technologies Non Magnetic

Probes for Reliable Sensor Testing with Full Temperature Range

Everett Charles Technologies (ECT) expands its product portfolio with non-magnetic spring probes for test applications, which are based on the measurement of the earth′s magnetic field in the full ambient/hot/cold temperature range. ECT non-magnetic probes ensure accurate, reliable and repeatable measurement of the earth′s magnetic field and the yaw rate movement in any of the three axes without interference from the test probes.

ECT′s non-magnetic probes support typical navigation applications in smart phones or dedicated navigation devices for cars in the fast growing MEMS/sensor market. For the development of these probes ECT not only drew upon its long-term experience in spring probes and materials, but also the comprehensive expertise within Xcerra in MEMS/sensor testing. By combining these elements ECT is able to provide non-magnetic spring probes that meet the challenging requirements of tri-temp MEMS/sensor testing. Sensors that measure the earth′s magnetic field and the yaw rate movement must be tested in a benign environment. To test sensors reliably without interference from the test stimulus, any possible materials that might disturb the earth′s magnetic field are not allowed in the area around the device under test. In addition, since many applications are bound for the automotive market, the test probes need to withstand temperature of -55°C up to +85°C and in some cases up to 150°C.

Tony DeRosa, Product Manager, explains: “By leveraging off of the vast sensor test experience within Xcerra, we are able to develop non-magnetic spring probe solutions with extraordinary performance in an unmatched temperature range. Our non-magnetic probes have been already deployed in volume production, where the outstanding performance has been confirmed.”

To learn more about the ECT non-magnetic spring probes, visit http://ect-cpg.com/non-magnetic-probes


New Battery Probe from Everett Charles Technologies:

Performance Off-the-Shelf with the New ECT CP-4 Probe

Everett Charles Technologies (ECT) recently expanded its portfolio of Battery Interconnect Probes by adding the CP-4 probe. CP-4 is a standard off-the-shelf solution, which has been designed specifically for rigorous high reliability applications. CP-4 combines the low technical risk, fast delivery and high economies of scale of a typical standard product with the extraordinary electrical performance and reliability resulting from ECT’s extensive spring probe knowledge of materials and platings.

The CP-4 meets the requirements of high reliability applications by ensuring sustainable, consistent, and reliable contact. It is also tolerant to shock and vibration. The relatively high compliance helps to overcome planarity issues.  The CP-4 probe is capable of carrying 10 Amp DC and provides a low resistance contact (25 mOhm average). It has a proven life of over 100,000 cycles.

The outstanding performance is based on ECT’s proven Biasing-Ball™ and double roll close construction. The design using a deep draw plunger for a low mass head increases reliability in shock/vibe.

The CP-4 probe can easily be pressed into plastics or attached to a PCB. The CP-4 tail configurations include surface mount, through hole (straight or 90 degree angle) and solder cup. It is available as a lose probe or integrated into a custom Compliant Connector Solutions, CCS™. (To read more about the CP-4 or CCS see our website http://ect-cpg.com/compliant-connectors)

Tony DeRosa, Product Manager, highlights: “CP-4 provides reliable high performance at lower cost than other similar in-class products. Leveraging ECT’s design expertise and complete manufacturing capabilities, the CP-4 is a cost-efficient solution that will help to bring products to market faster and easier.”

To learn more about the ECT spring probes, visit http://ect-cpg.com/battery-probes


High Performance Probe for Lead-Free Fine Pitch PCBA Test Applications

Everett Charles Technologies launches LFRE-39 probe

Everett Charles Technologies (ECT) introduces the LFRE-39 spring probe to complete its comprehensive portfolio of products for lead-free test applications.  LFRE-39 features ECT’s LFRE™ plating and is designed to meet fine pitch requirements down to 39 mil (1.0 mm). The LFRE-39 fully meets the demanding requirements of high volume production in-circuit and functional test.

LFRE plated probes are field proven to provide enhanced performance in high volume production test environments. LFRE probes are less prone to solder transfer and tip wear due to their exceptional hardness. Lead free solder and OSP (Organic Solderability Preservatives) treated copper pads typically present a harder or more abrasive contact surface causing excessive plating and probe tip wear. Customers report that LFRE plating has demonstrated longer life and MTBM (mean time between maintenance) on their most challenging applications. LFRE plating is significantly harder than typical gold plating. LFRE has a hardness range of 550 to 650 Knoop which is about 3 to 4 times harder than standard gold. This makes the probe tips more durable and less susceptible to solder and material transfer. LFRE plated probes are the best solution to contact RoHS compliant boards and OSP boards.

Lead free plating is featured on ECT’s industry standard PogoPlus® LFRE series, Metrix™, and on LFLT Long Travel probes.  With the addition of LFRE-39, ECT’s proprietary plating is now available on a wide range of pitch options.

Tony DeRosa, Product Manager, explains: “In head to head testing with traditional gold plated probes, LFRE plated probes offer lower and more consistent resistance. LFRE probes have also outperformed gold plated probes in high volume production test applications by 3 to 5% first pass yield improvement. With LFRE-39 we can provide a reliable test probe solution for fine pitch lead-free PCBA test fixture applications.

To learn more about the ECT In-circuit nd Functional Test Probes, visit http://ect-cpg.com/ICT-FCT-probes

Everett Charles Technologies to Exhibit at Space Tech Expo 2016

Leading Probe and Connector Solutions for Challenging Applications

Everett Charles Technologies (ECT) will exhibit its leading probe and connector solutions for the military and aerospace market at the upcoming Space Tech Expo scheduled to take place May 24-26, 2016 at the Pasadena Convention Center, California.

At Space Tech Expo, ECT will showcase its leading portfolio of probes for RF and high current applications, a comprehensive offering of battery probes that feature highly consistent electro-mechanical characteristics and the most flexible and reliable compliant connector solutions. (http://ect-cpg.com/compliant-connectors)

ECT supports a wide range of industrial test applications with high performance RF and high current probes. Leveraging advanced probe designs and materials, ECT’s RF and high current probes are known for excellent electrical performance combined with reliable mechanical characteristics. (http://ect-cpg.com/rf-probes  http://ect-cpg.com/hc-probes)

ECT battery probes are used in a wide range of applications that include docking stations, data transmission, PCB interposers, and contacts for connector assemblies for medical, mil/aero, transportation and more. ECT battery probes ensure consistent, long-life, low-resistance, compliant electrical and mechanical connections. ECT’s versatile line of battery interconnect probes provide design flexibility to match performance, cost, and assembly requirements. In addition, these products can be modified or custom designed to meet specific project requirements. (http://ect-cpg.com/battery-probes)

ECT’s Compliant Connector solutions offer superior durability in for a wide range of high cycle life applications. The spring probe based solutions can maintain consistent electro-mechanical characteristics in excess of million cycles. When mating planer tolerances pose a challenge or longer reach is required, spring probe based connectors ensure best performance. ECT Compliant Connectors are available in configurable off-the-shelf versions or as fully customized designs based on their flexible architecture.

To learn more about the ECT Contact Solutions, visit http://ect-cpg.com



ECT Accordion™ Technology Used for Innovative High Current Connector Solution

Innovative interconnect design exceeds the limitations of standard spring probes

Everett Charles Technologies (ECT) has developed a customized high current connector for testing electrical power components based on an unprecedented design using ECT’s Accordion™ compliant contacts. In addition to the demanding high power performance this challenging application called for a cutting-edge connector design to comply with the extremely small space limitations and contact surfaces.

The challenge of this project was to transfer continuous current exceeding 50 Amps through small contact surface area, not well suited for standard spring probes. ECT developed a technical solution that gives the customer high cycle life and compressed foot print based on the Accordion™ compliant contact. Compared to standard spring probe solutions, the Accordion™ based design supports higher current and leverages more reliable surface contact.

The Accordion™ compliant contact is a proven solution for high density / high current applications. Accordion™ contacts can be integrated into a connector to provide multiple, independent current paths. The Accordion™ ensures low resistance and reduces power loss and therefore heat loss. Accordion™ contacts placed in parallel overcome contact challenges including irregular surface topography, dirt and debris, and non-parallel connection. In addition, the probe is modular. This allows varying the current capacity as required for each test point, but uses a consistent reliable design.

Tony DeRosa, Product Manager, explains: “For this customer project we designed a compliant connector with a direct current path using multiple independent current paths. We developed this innovative solution leveraging the unique advantages of our Accordion™ contact: flat , single piece compliant spring design for best reliability in high current applications. This customer specific solution packed several Accordion™ contacts together, ensuring side to side contact and specific overlapping, redundant contact points through-out the assembly. No comparable solution had been available to the customer before. It proves once more, how the team at Everett Charles Technologies combines leading-edge technology with innovation and experience to create the best solutions for our customers.”

To learn more about the ECT Accordion, please visit http://ect-cpg.com/accordion


Meeting the Needs of OEM Applications: New Everett Charles Technologies Battery Probes

Four new members in the ECT BIP family – specifically designed for the OEM market

Everett Charles Technologies (ECT) recently expanded its portfolio of Battery Interconnect Probes by adding four new probes to the well-established BIP family: BIP-8, BIP-9, BIP-10 and BIP-12. These new products provide customers additional options for overall length, compliance, mounting and force.

ECT battery probes are used in a wide range of applications that include docking stations, data transmission, PCB interposers, and contacts for connector assemblies for medical, mil/aero, transportation and more. Typically battery probes are contained in modules where consistent, long-life, low-resistance, compliant electrical and mechanical connections are required.

Spring probe based solutions can maintain consistent electro-mechanical characteristics in excess of required mission cycles. When mating planar tolerances pose a challenge, or a longer reach is required, spring probes are the preferred solution. ECT’s versatile line of battery interconnect probes provides design flexibility to match performance, cost, and assembly requirements. In addition, these products can be modified or custom designed to meet specific project requirements.

BIP Battery Probes offer superior durability in high cycle life applications and feature industry leading current carrying capacity of 5.0A and probe resistance of under 50 mOhm.

Tony DeRosa, Product Manager, explains: “We understand the need of our customers for a greater range in mechanical form factors at a competitive cost point. With our design expertise and manufacturing capabilities we can help bring competitive products to market faster.”

To learn more about the ECT battery probes, please visit http://ect-cpg.com/battery-probes


ECT Introduces the SPP-25 Spring Probes for Solar Panel Test

Leveraging contacting expertise for non-destructive measurements

ECT’s SPP-25 probes are designed specifically to support non-destructive electrical contact at various stages of test during the fabrication process of solar photovoltaic (PV) products. ECT’s reliable and effective solution is well suited for high volume production test which is needed as volumes increase due to alternative energies becoming more mainstream.

Spring probe technology is an ideal solution to provide electrical connection to obtain I-V curve measurements, or providing reliable contact for your challenging high current or low voltage connections. SPP-25 probes feature low, stable resistance, a center close for enhanced pointing accuracy, tip styles designed to distribute spring force across a large area, and two force options; 4oz and 6oz. The probes are specifically designed to yield a linear force –compression relationship as the probe is actuated. This minimizes potentially harmful jumps or steps in force. SPP-25 probes fit into standard Pogo 25 receptacles.

ECT probes are often used for standard or custom automated test equipment and fixture applications which involve simulation, production testing, characterization, validation or failure analysis. ECT has leveraged decades of spring probe design and manufacturing knowhow to create probes that ensure reliable electrical contact without damaging the PV cell.

Tony DeRosa, Senior Product Manager, explains: “Whether you are making contact directly with silicon/thin film circuitry, or the bus bar of your PV device, ECT offers a wide range of sizes, tip styles, and spring forces to accommodate your specific application.”

To learn more about SSP25, please visit: http://ect-cpg.com/solar-panel-probes


ECT’s ZIP™ Z0 RF Spring Probe for Semiconductor Test Exceeds Customer Expectations

ZIP probes built from HyperCore™ base material provides superior performance in high volume production

Everett Charles Technologies (ECT) successfully won a head-to-head evaluation of ZIP probes with the HyperCore™ material option in a high volume production environment at a large Chinese OSAT. The Z0 probes reached 450k insertions more than doubling the life of the competitor’s spring probe while exceeding first pass yield expectations.

ZIP is one of several semiconductor test probe families offered by ECT. For this evaluation the ZIP Z0-040RHJ probe was deployed in a multi-site test set-up for a 14L, 0.4mm pitch QFN package. The application was a RF transceiver. Testing was performed at ambient and hot (85°C) conditions. With its 1.5mm test height Z0 is an excellent choice for RF devices requiring low insertion loss (40GHz @ -1dB) and low inductance (0.55nH).

ECT’s patented ZIP probes feature a number of innovative design features that provide superior contact capability. ZIP probes have a large internal contact area resulting in low contact resistance, superior bandwidth and excellent conductance. ZIP probes are built from HyperCore™ and present a new level of accuracy, scalability and performance. The proprietary non-plated, homogenous probe material possesses properties that prevent oxidation, ensuring premium performance throughout high volume production cycles. With a hardness rating of 600 Knoop; ZIP has excellent wear characteristics, is effective for contacting hard DUT surfaces and withstands abrasive cleaning.

Tony DeRosa, Senior Product Manager explains: “Customers are continuously requiring lower cost per insertion. ECT’s ZIP™ probes meet this challenge by bringing value to customers through competitive pricing, high reliability and excellent electrical performance. Our RF simulation and validation capabilities further expands the cost-of-test advantage by providing a high level of confidence that Z0 will meet or exceed critical RF test requirements.”

To learn more about ZIP™ please visit ect-cpg.com/semiconductor-probes

Compliant Connectors Designed to the Project Specifications

Everett Charles Technologies leverage RF simulation expertise to optimize electrical performance of custom connector solutions

Everett Charles Technologies’ (ECT) Compliant Connectors Team successfully developed a custom solution for a demanding medical application in the area of video imaging and endoscopic data. Combining decades of experience in probes with ECT’s expert capability of RF simulation, the solution fully met the mechanical, electrical and environmental specifications while keeping to the customer’s project schedule.

This customer faced a major challenge related to a connector requirement. The connector had to fit into a tightly confined area. Therefore the connector design needed to be very compact. The application was in a very dirty environment. The connector needed to be field cleanable and withstand the environmental conditions. As an added complication, the connector had to maintain a 100 Ohm impedance for proper signal transmission. Finally a life of ten thousands of insertions was required.

ECT provided a custom solution designed to the parameters including high speed signal transmission and mechanical life meeting all electrical and mechanical challenges while keeping to the project’s development time window. ECT’s capabilities of RF signal integrity simulation and validation were key for project success. Accurately predicting electrical performance of the spring probe connector as well as complete circuit performance prior to fabrication was essential to avoid multiple iterations and delays. ECT accurately modeled electrical performance and adjusted design parameters on-the-fly to ensure the prototypes met performance specifications.

Tony DeRosa, Product Manager, commented: “In addition to our off-the-shelf ‘catalog connectors’, which can be configured to customer requirements, we offer solutions fully designed to customer specifications, where standard products can’t meet the entire set of requirements. Our in-house expertise in RF simulation is a unique and valuable asset for this. With our RF simulation and validation capabilities we optimize the design prior to production. This way we ensure both: best performance and fast project completion.”

To learn more about the ECT custom connectors, please visit: www.ect-cpg.com/custom-connectors


High Performance Spring Probes for In-circuit and Functional PCBA Test

ECT’s EDGE probe combines leading architecture and materials for lead free applications

Everett Charles Technologies’ (ECT) EDGE probes are the answer to poor first pass yield, short probe life and excessive cleaning cycles, when caused by oxide layer build up or debris, particularly in lead free applications. In volume manufacturing the impact worsens as cycle count increases and elevated levels of debris are transferred to the probe tips.  In many applications effective electrical contact is compromised.

Lead free solder is known to cause many problems during in-circuit testing. Lead free solder has a higher reflow temperature, which can result in harder and stickier solder flux resin and a thicker, harder oxide layer. This thicker layer of resin and oxide is more difficult to penetrate and increases wear on the pogo pin. Lead free solder resin and oxides can also increase debris transfer to spring probes.

ECT’s EDGE probes meet these challenges as well as those found in OSP (organic solderability preservatives) and no-clean applications by combining innovative probe design with the ultra-hard plating material – ECT’s proprietary LFRE hard plating. LFRE plating is significantly harder than the industry’s standard gold plating. LFRE has a hardness range of 550 to 650 Knoop.  LFRE improves tip performance while helping maintain tip sharpness.

EDGE probes feature an ultra sharp tip geometry that is capable of penetrating debris, oxide and OSP layers. The tip radius is 0.0003” and is about 10 times sharper than typical machined probe tips. Additionally, EDGE probes apply ECT’s proven Micro-Wipe bias technique that provides low and consistent internal contact resistance.

Tony DeRosa, Product Manager, explains: “Recently ECT has enhanced key processes related to probe assembly. The results are a more consistent set of mechanical parameters and electrical performance. In addition, the spring design has changed to reduce stress and increase life. EDGE tip geometries have also been optimized to make sustainable, reliable contact to PCB targets such as vias. EDGE is ECT’s answer to your most challenging test contact applications. It combines design, materials and platings expertise along with probe fabrication knowledge.”

For more Information about the ECT In-circuit and Functional Test Probes, please visit: http://ect-cpg.com/ICT-FCT-probes