Multitest Expands Contactor Portfolio for WLP / WLCSP Testing:

Mercury 030 combines best mechanical and electrical performance with ease of use and cost advantages 

Multitest’s Mercury 030 probe meets the increasing demand for cost-efficient high performance WLP / WLCSP contacting solutions. The Mercury 030 is designed to address the electrical requirements of today’s test challenges, without sacrificing mechanical performance in an automated test environment. The Mercury 030 is a WLCSP fine pitch probe made using a Multitest proprietary process that produces a long life, high strength probe with gold plating. For high reliability, stability, and very low contact resistance contacting, the Mercury 030 has two flat surfaces moving in surface-to-surface contact.

While electrical and cost benefits are turning WLP and WLCSP into the “go-to” packaging of choice, traditional wafer probe technology can prevent customers from testing the device in a WLP package to published specification. The low RLC parasitics of the Mercury 030 make it a preferred contacting solution for customers who want to fully test wafer level packaged devices in the DC, functional, and AC parametric domains.

The Mercury 030 probe geometry and components provide high bandpass (8 GHz @-1 dB insertion loss) and low resistance (160 mΩ). The Mercury 030 ensures required probing coplanarity matching the vertical heights of the customers’ WLCSP balls and/or lands. With a 0.33 mm window of compliance and low insertion force, the Mercury 030 is well qualified for both singulated and multisite WLP and WLCSP contacting and/or probing.

During customer field tests, the Mercury 030 demonstrated long run times between cleaning with an average probe replacement life of 300K -500K device contacts.

Particularly valued in a high volume environment, the Mercury 030 is easy to setup and to maintain.

Bert Brost, Product Manager at Xcerra’s Interface Product Group explains: “Although the Mercury 030 can cost less than traditional probe technology, its ease of use, ease of maintenance, and high performance attributes directly address customer test requirements. With this new contacting solution we are supporting our customers’ efforts to reduce costs and improve throughput. The Mercury 030 is the result of Multitest spring probe development experience, integrating proven technology that is of greater value to the customer than products offered by the competition.”

To learn more about the Multitest Mercury family, please visit www.multitest.com/Mercury

 

Most Flexible MEMS/ Sensor Test and Calibration Equipment for Best RoI

Multitest offers efficient solutions for a wide range of applications

Multitest MEMS test equipment is based on a modular design, which combines well established handling equipment with state-of-the-art test and calibration modules dedicated to the specific application. This approach offers proven benefits for the test quality and the return on investment.

Multitest’s portfolio includes solutions based on strip test as well solutions, which leverage the capabilities of the standard gravity or pick-and-place handling systems for up to 8 parallel test sites. All systems cover the full ambient-hot-cold temperature range. Whereas the strip test systems provide best cost of test for high volumes, smaller to medium production volumes benefit from the lower investment requirements for gravity and pick-and-place based systems.

The handling systems for singulated test are combined with “MEMS” cart, which houses the exchangeable MEMS stimulus box, which is designed according to the dedicated customer requirements. This way highest flexibility is ensured: By exchanging the stimulus box the MEMS cart can be converted for different MEMS applications. By undocking the MEMS cart from the test handler, the handler is ready for standard IC test. This offers the opportunity to first calibrate the MEMS part of the device and then perform the final electrical test on the same equipment.

Multitest offers a comprehensive portfolio of MEMS test solutions based on gravity and pick-and-place handlers including high g accelerometers (up to 100 g), low g or gyroscopes up to 6 degrees of freedom, magnetometer with rotating stimulus or Helmholtz coils and pressure test applications.

Andy Ludwig, Product Mangers comments: “Leveraging our knowledge from handling equipment with an installed base of more than 3,500 and our experience in MEMS/sensor test and calibration equipment of more than 15 years, we are able to offer high quality solutions to our customers, which combine proven standard solutions with custom tailored modules in the most efficient way.”

To learn more about Multitest MEMS and sensor test and calibration equipment for singulated devices , please visit http://multitest.com/s-mems/

 

Bringing MEMS Testing to the Next Level

Installation of first complete Xcerra turn key test cell for MEMS in Asia

Xcerra finalized the installation of a complete test cell for 3/6DOF inertial and navigation MEMS applications at an Asian customer. The test cell leverages proven Xcerra expertise in highly parallel test of sensor devices, delivered through the LTX-Credence and Multitest semiconductor test brands. The customer benefits from the pre-validated test cell set-up, with integrated test program and optimization support, to rapidly realize outstanding test efficiency and target yield performance.
The Xcerra MEMS test cell ideally combines the cost of test advantages of highly-parallel, high-throughput testing with the flexibility of the scalable base equipment. The Multitest InStrip handler with the exchangeable InFlipM MEMS stimulus and interface options and high-density Mercury contactors is combined with the Diamondx tester using DPIN96 digital pins; this combination supports the fast test and calibration of 3DOF magnetometers at 204 sites in parallel on strip, as well as 2/3DOF accelerometers at 216 sites in parallel, using the Multitest InCarrier solution for wafer level package test at about 1.5×1.5 mm device size. Changing between the applications requires less than 30 minutes to swap the test interfaces, the handler conversion kit and the test program.

Peter Cockburn, Senior Product Manager Test Cell Innovation, explains: “The project was driven by an Asian fabless customer, who searched for a highly parallel test solution at an OSAT to support the aggressive production ramp and cost of test reduction goals for his mobility MEMS applications. With the Xcerra Test Cell Solution, the fabless customer is now able to outsource his test in a highly efficient way. In addition, the OSAT can fully leverage the flexibility of the Xcerra Test Cell Solution for further business opportunities.”

To learn more about the Xcerra Test Cell Innovation, please visit www.Xcerra.com/TCI

 

High Current meets Strip Test: Multitest launches HC Contactor for high parallel test

Multitest announces that its new high power Kelvin contactor for strip test successfully passed a long term evaluation for a high volume automotive application at an Asian manufacturing site of a global IDM. The outstanding yield and contactor pin lifespan enable extraordinary OEE (overall equipment efficiency) and a lower overall cost of test.

The evaluation ran for over a year using a SO150 package for a high current automotive application requiring very high volumes. The results proved the outstanding performance of this contacting solution: >99% first pass yield and a contact pin life span of more than 1 million insertions.

The Multitest High Current Strip Contactor addresses two critical requirements: high power carrying capability and the limited space in a high parallel test set up. Usually, strip contactors are based on vertical probe designs, which cannot meet the electrical and thermal requirements of high current applications. The new contactor is based on the established Multitest ecoAmp Cantilever design and deliveries superior electrical performance and temperature accuracy.

For more information about Multitest’s ecoAmp™ contactors, visit  www.multitest.com/ecoAmp 

Enabling Test for High Voltage Applications

MT9510 pick and place handler for testing up to 10 kV

Rosenheim (Germany), August 2015: Multitest has shipped the first MT9510 pick and place handler for testing high voltage applications up to 10 kV (peak). A complete solution can be provided through Multitest’s Plug & Yield program which includes a Multitest high power contactor. The entire set up has been optimized to meet the challenges of cost-efficient and reliable high voltage testing.

The Multitest high voltage solution will be deployed for the automotive market (hybrid cars) andfor consumer market applications.

The Multitest MT9510,a kitable tri-temp pick and place handler, is established as the benchmark test handler in the automotive market due to its superior temperature performance in the full ambient/hot/cold range and the broad variety of additional optional features.

The high voltage set up uses a standard MT9510 base unit. All application specific requirements are covered with the design of the dedicated high voltage conversion kit. This way the greatest flexibility at the test floor, best return on investment and lowest cost of test are achieved. With its favorable cost structure the MT9510 high voltage solution also meets the targets of more cost-sensitive applications in the consumer market.

To learn more about the Multitest MT9510, please visit www.multitest.com/MT9510

About Multitest:

Multitest (headquartered in Rosenheim, Germany) is one of the world’s leading manufacturers of semiconductor material handling equipment and interfaces for the testing and calibration of semiconductors and sensors. Multitest markets a broad portfolio of innovative and performance driven test handlers, contactors and ATE printed circuit boards. Multitest has more than 30 years of experience in the semiconductor industry, providing solutions to the automotive, consumer, communication, and sensor markets. Multitest is a company of Xcerra™ Corporation, which provides capital equipment, interface products, and services to the semiconductor, industrial, and electronics manufacturing industries. Xcerra Corporation offers a comprehensive portfolio of solutions and technologies, and a global network of strategically deployed applications and support resources. Additional information can be found at www.multitest.com and www.Xcerra.com

Lowering Cost of Test by Reuse of Test Interfaces

Multitest’s MT9510 offers new contact site layouts

Multitest’s well-established MT9510 tri-temp pick and place handler is now available with various site pitch layouts, which are compatible with major standard handlers in the market. The new site pitch layouts enable to customer to re-use existing loadboards from other handling equipment for applications on the MT9510.

The Multitest MT9510 is a kitable tri-temp pick and place handler, which is known for its superior temperature performance and a wide range of options to address specific customer requirements. With an installed base of more than 800 the MT9510 platform is highly accepted in Asia, Europe and USA. The site pitch compatibility now allows for easy and economic transfer of applications form other handling equipment to this highly reliable system by reusing the existing test interface boards.

The MT9510 platform supports parallel test of up to 8 devices (MT9510 XP) or up to 16 devices (MT9510 x16) with up to 4 (MT9510 XP) or 8 (MT9510 x16) horizontal sites. The new site pitch layout for quad setups allows for horizontal site pitches from 40mm up to 80 mm and vertical site pitches from 60 mm up to 63.5 mm. The new site pitch layouts require only a minor modification of the handler base and therefore are backward compatible to a standard MT9510 site pitch.

Syariffuddin A.Kamarudin, Product Manager for the MT9510 platfrom adds: “The new site pitch layout option not only allows an easy transfer of standard applications from other pick and place handler brands, but also make the MT9510 compatible for the Multitest MEMS modules, which have been developed for the Multitest gravity feed product line. Beyond the direct reuse of existing test interface boards, we see our customer leveraging the loadboard compatibility at their engineering sites, where they now can use the exact same board design for package characterization, as it will be used later in volume production”.

Expanding MEMS Test and Calibration Portfolio for Pick & Place Handlers

Multitest launches magnetic (MRS) sensor test module for MT9510

Multitest adds a magnetic rotation stimulus (MRS) module for sensor test on the MT9510 handler to the MEMS/sensor test product line. The module allows for x and y axis testing of magnetic sensors on a flexible and well-established pick and place handler platform. The MRS module, which was originally available for only the MT9928, now also supports test and calibration of sensors in packages which are typically handled on pick and place handlers.

The Multitest MT9510 is a kitable tri-temp pick and place handler, which is known for its superior temperature performance and a wide range of options to address specific customer requirements. Typical packages include BGA, CSP, LGA, Micro-BGA, MLP/MLF, PLCC, PGA, QFN, and TSSOP.

The generic Multitest MEMS test approach deploys all features and functions of the standard handling system and meets the MEMS specific requirements by adding MEMS/sensor test and calibration carts with dedicated stimulus boxes. The new MRS sensor test solution for pick and place handlers continues this aApproach.

The new MRS module for the MT9510 pick and place handler allows for leveraging the proven MRS sensor test solution for a new range of packages.

To learn more about Multitest’s MEMS test and calibration solutions, please visit www.multitest.com/sensor

One Insertion for Testing at Multiple Set Temperatures

Multitest MT2168 Pick-and-Place Handler offers multi-temperature testing within one plunger cycle

The Multitest MT2168 pick-and-place handler now offers multi-temperature test with only one insertion. The highly dynamic temperature control allows for testing at multiple set temperatures within one plunger cycle. This new feature particularly addresses the requirements in design and engineering sites.

The fast and accurate changes of the set temperatures are based on the chamberless soaking solution in the contact unit of the MT2168. This design allows for exact thermal measurements and prompt temperatures adjustments for each device under test.

Multi-temperature testing with only one insertion significantly reduces the operator actions and the stress on the device under test. It is an ideal solution for temperature characterization at engineering sites, because it fully supports lights-out operations over nights or at weekends.

The MT2168 can also be configured to meet the speed and automation requirements of high volume production. This allows for the same platform that was deployed in engineering and test development to also be used in volume production.

To learn more about the Multitest MT2168, please visit www.multitest.com/MT2168 .

Conversion Kit Design Makes a Difference

Multitest launches local kit design team in the Philippines

Multitest makes a significant step to expand customer support. Starting May 2015 an additional design team for conversion kits will be supporting the needs of Asian customers. The local design team based in the Philippines will be the expert contact for kit related requests of customers and ensure shortest response times.

Efficient handling solutions are often based on appropriate design of the conversion kits. Customers will be able to explain their requirements directly to the designers and  will receive immediate feedback on the available design options. Understanding the conditions of each alternative provides a better basis for decision making.

Based in the close location to the customer the design kit team will be able to get clarification on open issues fast and efficiently. The overall cycle time from kit order to delivery can be substantially shortened.

Syariffuddin A. Kamarudin, Product Manager, explains: “Kit business is important for our customers and for us. Often the overall handling solution is based on innovative kit design. We are proud to offer this additional support to our customer base in Asia. We staffed the team with experienced designers. Our goal is to establish another channel for technical discussion with our customers. The designers will work with customers onsite. A thorough understanding of the customer requirements will enable them to translate it directly into a design concept.”

Combining Flexibility and Throughput Improvements for Sensor Test

Multitest has shipped first 45° high g sensor test module for kitable MT9928 gravity handler

Multitest shipped the first “Shaker” 45° high g sensor test module for the MT9928 to a major international IDM. The module allows for a two axis testing with one single stimulation on a flexible and modular handler platform. The well-established “Shaker” module, which was originally available for the MT93xx only, is now also available for the flexible and modular MT9928 gravity handler.

The MT9928 has a kitable and modular architecture and therefore can be converted to different package types and configured with various loading and unloading options. The generic Multitest MEMS test approach deploys all features and functions of the standard handling system and meets the MEMS specific requirements by adding MEMS/sensor test and calibration carts with dedicated stimulus boxes.

The new 45° high g sensor test solution fully continues this approach. The 45° high g sensor is dedicated for X/Y stimulation of the MEMS devices and allows for two axis testing in one single stimulation. This way one stimulation cycle time can be saved and the packages need to be touched less often, which reduces the risk of damages during test. If testing has to be done at various temperature levels this advantage multiplies.

The new 45° high g module for the MT9928 gravity handler combines test time and test process optimization with more flexibility and better equipment utilization.

To learn more about Multitest’s MEMS test and calibration solutions, please visit www.multitest.com/sensor