Multitest Introduces ACE Contactor:

Cost-efficient contactor solution for best RF performance

Multitest recently introduces the ACE Contactor, which offer optimal RF performance for fine pitch FBGA, QFN and wafer-level packages at an attractive. Typical applications for this new contactor are Power Amplifiers, RF switches and mobile communications.

The ACE probe has a revolutionary, which provides exceptional electrical performance, both DC and RF. The ACE probe is manufactured from HyperCore™ base material, which is a proprietary material of Xcerra’s ECT Contact Product Group. HyperCore™ combines the mechanical properties of high carbon steel, with the electrical properties of BeCu and non-oxidizing properties of a precious metal.

The materials and architecture create a very robust probe with a very working life and best yield. The electrical and mechanical performance, combined with the long probe life, deliver low overall cost of test, which are unprecedented for RF contactors.

Within the range of applications the ACE probe are compatible with all device types, platings, and pitches; and all test applications, including singulated devices, strip test and wafer-scale test. The ACE contactor supports pitches down to 0.4 mm.

Jason Mroczkowski, Director RF Product Development and Marketing explains: “ACE contactor has been evaluated by initial customers, which report significant improvements compared to other solutions: More than double the probe life and substantially better figures for current consumption, gain, standard deviation, and power efficiency.”

To learn more about the Multitest ACE Contactor, please visit http://multitest.com/ace

Multitest Launches Atlas Contactor: Cost-Efficient High Performance Solution for Large I/O Count Devices in High End Digital Applications

Multitest recently launched the Atlas contactor, which has been optimized for cost-efficient and reliable testing of high end digital high ball count BGAs. Based on the well-established Multitest QuadTech flat probe technology, the Atlas contactor combines advanced mechanical and electrical probe technology for improved functionality and performance in manual test and automated test.

With an optimal insertion force and a large compliance window, the Atlas provides ultra-stable contact resistance over hundreds of thousands of device insertions. The Atlas can be configured for use without a floating alignment plate. The low Atlas per pin insertion force significantly reduces insertion strain on automated test handling systems while making the Atlas easier to use in manual test.

Atlas’ mechanical integrity includes the controlled insertion forces that are determined by the compression of a precision alloy stainless steel spring. Properties of the spring are engineered to offer predictable long-term performance over a broad temperature range: -50° to +150° C along with a typical life of 500K insertions. Atlas 040 insertion forces are controlled to just 25 grams per pin.

The insertion loss of Atlas 040 is measured at 18.5 GHz @-1dB while the return loss is measures at 14.72 GHz @ -20dB. The Atlas’ bandwidth supports the spectral content of most high speed digital device for ensuring great signal fidelity for maintaining digital edge rates. With a test height of only 3.53 mm, the Atlas 040 has the bandwidth for obtaining superb signal fidelity.

The Atlas design combines fine pitch capability with reduced contact height, force, and no damage zone contacting to meet the contacting needs of next generation for advanced high-end digital devices with typically 600 to 5,000 ball count range.

Bert Brost, Product Managers, explains: “Currently the Atlas contactor supports pitches down to 0.4 mm. Soon we will launch the Atlas for 0.3 mm pitches continuing the miniaturization and advancement of our field proven QuadTech flat probe technology

To learn more about the Multitest Atlas contactor, please visit http://multitest.com/atlas

Expanding Application Range to Challenging SOT23 Packages

Multitests Tri-Temp Gravity Handler MT9928 supports SOT23 Devices

Multitest recently shipped a high volume test handling solution for SOT23 packages. The innovative conversion kit design allows for tri-temp testing of SOT23 packages on the production proven MT9928 gravity handler.

Traditionally, these packages were handled on turret handlers, but these types of handlers do not support temperature testing. With a growing number of SOT23 application, which require testing at various temperatures, this is no longer sufficient.

The new Multitest kit design applies an innovative guiding principle, which is able to handle packages with missing upper body mold e.g. the SOT23 package with 4, 5 or 6 leads.

With more than 1100 installations the MT9928 is well-established and provides field proven reliability and performances. Its modular and scalable design and the variety of options allow configuration of the MT9928 exactly according to the test needs. The MT9928 offers a large soak capacity and supports the entire ambient-hot-cold temperature range at outstanding accuracy and stability.

To learn more about the MT9928 gravity handler, please visit http://multitest.com/mt9928

Efficient Testing of Environmental Sensors

Multitest InBaro will expand test capacity at a European IDM

Multitest’s InBaro test module for barometric sensors continues to expand its footprint in the growing MEMS and sensor market. The Multitest InBaro was recently shipped on a repeat order to a major European semiconductor manufacturer expanding the capacity for testing barometric sensors. The increasing volumes associated with these types of sensors are driven mainly by consumer applications used to monitor their environment or aid in indoor navigation. The Multitest InBaro delivers a high return on investment because it offers the greatest flexibility and supports the most cost-efficient test and calibration, which is particularly important to meet the requirements of this fast-growing market.

InBaro is part of Multitest’s broad portfolio of InMEMS modules that work in combination with Multitest’s proven InStrip handler. It is designed according to Multitest’s modular concept for MEMS test and calibration, facilitating system conversion to other MEMS/sensor test applications, e.g. for gyroscope or microphone test. InBaro offers a high degree of flexibility. It can be upgraded to InHumid, which adds humidity and gas test capability to the barometric component thereby supporting highly-integrated environmental sensors.

InBaro-based systems are designed to switch very fast between various pressure levels. Therefore it is possible to efficiently test and calibrate the sensors at multiple pressure levels within a single insertion, ensuring fast test times even for comprehensive test cases.

The InBaro can be used in a Multitest InCarrier set up to support reliable and robust test handling of small MEMS packages, which are typical for environmental sensors in consumer applications.

Garbiela Born, Director InMEMS and IoT Products, comments: “We are proud of this repeat order. It confirms that the system meets the expectations of the customer. In addition to the small package handling capability, cost-efficiency and flexibility, which all are key performance factors of the players competing in this end market, the customer particularly recognized the temperature accuracy of the system.”

To learn more about the Multitest sensor test portfolio, please visit http://multitest.com/sensor

Ensuring Temperature Accuracy for Testing of High Pin Count Packages

Multitest MT2168 Pick-and-Place Handler offers advanced temperature control features

The Multitest MT2168 pick-and-place handler now offers an optional active socket purge (ASP). The ASP completes the portfolio of advanced temperature control features of the MT2168, which include Active Temperature Control (ATC), Cold Test for Characterization on the ambient / hot base handler version and now the ASP.

The ASP keeps the temperature contact pin in the socket on the set test temperature by applying a thermal controlled air flow to the pins. Particularly for high pin count devices this has significant influence on the overall temperature performance and reduces the temperature calibration efforts. The ASP can be configured with up to 16 independent sets of temperature sensor, controller and heater to ensure best temperature accuracy for each device under test.

Günther Jeserer, VP Gravity and Pick & Place Products, explains: “We continue to develop advanced features for the MT2168 to expand the capabilities of this leading pick and place handler. To achieve the advanced temperature performance we leveraged the more than 25 years of expertise within the Company and a wide range of production proven developments. All new features of the MT2168 will be available on the new MT2168 XT handler ambient/hot/cold test, which will be officially released later this year.”

To learn more about the Multitest MT2168, please visit http://multitest.com/mt2168

MicroLink: Miniaturization of Link Technology for Small Pitches and Advanced Electrical Requirements

Multitest leverages the innovative and field proven Link technology to develop MicroLink – a probe which addresses advanced electrical test requirements for lower inductance and better signal integrity.

The MicroLink probe offers enhanced performance in all major electrical categories: impedance, insertion loss, inductance, contact resistance, and signal integrity. The signal path has been shortened to 0.373 mm. MicroLink supports RF applications with 60GHz and higher.

Mechanically the MicroLink probe features optimized contact wipe and pointing accuracy, which makes it most appropriate for packages with a pitch down to 0.3 mm.

Tony Tiengtum, Product Managers, confirms: “MicroLink is a field proven re-design of the well-established Link technology, which allows our customers to leverage the benefits of the Link technology for applications with even stricter electrical requirements and/or smaller device pitches. Our customers, which have been deploying MicroLink in production for several months, report that the MicroLink proves superior electrical performance over competitor’s solutions. ”

To learn more, download the MicroLink Fact Sheet: MicroLink FactSheet

MacroLink: Making Link Technology Footprint Compatible to Existing Set-Ups

Multitest offers the field proven Link technology as a replacement option for existing solutions. MacroLink combines full foot print compatibility with production proven electrical and mechanical performance.

MacroLink particularly addresses board wear issues, which customer faced with competitor’s solutions. The MacroLink facilitates the replacement by keeping full compatibility to existing test handler conversion kits and load boards.

For MacroLink the Link probe design has been adjusted to comply with larger offset footprints. Additionally, the probe geometry has been optimized for electrical performance.

Tony Tiengtum, Product Managers, explains: “MacroLink was driven by customers request to replace competitor’s solutions, which caused substantial board wear issues. The design of MacroLink makes it an easy drop-in alternative.”

To learn more, download the MacroLink Fact Sheet: MacroLink Fact Sheet

Link Contactor Family: Offset Vertical Probe with Wipe Design for Best Mechanical and Electrical Performance

Multitest’s Link Contactor family line for analog, mixed signal, and RF applications applies innovative vertical probe design. Link Contactors combine advantageous mechanical features – such as self-cleaning and scrub – with superior electrical performance and an architecture that eliminates wear on test interface board pads.

The offset vertical architecture of the Link probe is designed to support superior test yield, maximum repeatability and low repair and replacement cost. The wipe motion of the probe provides scrub through oxides on the IC pads and cleans itself when moving back to its original free height. This motion is fully decoupled from the connection to the test interface board resulting in a stable connection between the probe and the load board pad, avoiding pad wear and carbon debris buildup. This implementation also eliminates the potential for arching between the probe and the test interface board pad.

The footprint compatibility of the Link contactor supports easy replacement of existing solutions. The Link probe is available in different styles optimizing the solution to the requirements of the specific test applications.

To learn more about the Multitest Link Contactor family, visit www.multitest.com/Link

Gaining A Competitive Advantage by Leveraging Xcerra Test Cell Integration

Xcerra to deliver a fully integrated and validated test cell for pressure sensor test

Xcerra provide a complete test cell to a major IDM in the automotive semiconductor market. The complete test cell solution includes the tester, handler, tester interface and the sensor test module from Xcerra, and a pressure supply unit from a third party. In addition to the hardware, Xcerra will develop the test program and provide full integration and validation services.

The Xcerra test cell will combine the high-throughput capability of the Multitest InMEMS/InCarrier solution with the cost-efficient LTX-Credence Diamondx tester. The solution will also include the integration of a third party pressure supply unit. With this Xcerra solution the customer will receive a fully integrated and validated test cell for pressure sensor calibration, trim and test, providing fast time-to-volume and optimal OEE and yield.

Andreas Nagy, Senior Director, Test Cell Innovation, comments, “With the fully integrated and validated Xcerra Test Cell the customer will benefit from high operational efficiency and an accelerated time to high volume production on day one. The high throughput solution will be able to contact 90 devices in parallel resulting in a significant cost of test advantage.”

To learn more about the Xcerra Test Cell Innovation, please visit www.Xcerra.com/TCI

 

 

Multitest Introduces mmWave Contactor

Revolutionary interface for high frequency testing in high volume production

Multitest successfully introduced an innovative contacting solution for testing of extremely high frequency semiconductors in high volume production. The Multitest mmWave Contactor offers field proven outstanding electrical performance while maintaining best mechanical characteristics.

Multitest has developed a revolutionary hybrid contacting solution that combines traditional spring probe architecture for low frequency and power I/O’s while incorporating a cantilever solution for the peripheral high frequency transceiver I/O’s. By combining spring probe and cantilever technologies Multitest has extended the reach of volume production contactors to the extremely high frequencies ranges needed by automotive radar, WiGig, and 5G backhaul devices.

Keeping the interface from test equipment to the device as short as possible while minimizing the number of transitions is how Multitest is able to minimize the loss and maintain broadband performance from DC to 81GHz (<-10dB return loss and 4dB to 6dB insertion loss typical at 81GHz).

The mmWave contactor addresses the mechanical requirements of high volume production by incorporating high compliance, robust spring probes and materials and onsite replacement compatibility. The contactor assembly can be fully serviced onsite without incurring delays due to shipping lead times or RMA queues. The entire contacting solution is mechanically assembled and each component can be removed and replaced on site.

The mmWave contactor solution from Xcerra is a field proven solution for high volume semiconductor test that has overcome the challenge of using of metal transmission lines for extremely high frequency applications..

Jason Mroczkowski, Director RF Product Development and Marketing explains: “With the advent of production volumes of extremely high frequency semiconductors, it begs the question, ‘How will you test it?’. The experts at Multitest have considered all factors ranging from impedance discontinuities to stackup tolerances and their impact on RF performance at mmWave frequencies. Xcerra is the only supplier offering a complete test cell solution for volume production of automotive radar devices up to 81GHz. This test cell includes the tester, handler, and interface components required for a true high volume production test of mmWave devices. A critical component of this hardware is the Multitest mmWave Contactor. To date there are many lab and low volume solutions for extremely high frequency semiconductor test, but none exist for true high volume production test of mmWave devices. Until now.”

To learn more about the Multitest mmWave Contactor family, please visit www.multitest.com/mmWave