Multitest’s Unique Interface Solution for Ultra-High Frequency Testing Delivers Unprecedented Life-Time in Volume Production

mmWave customer case presented at Test Vision

Multitest’s mmWave contactor is a proven broadband production solution for RF applications up to 100 GHz. In a presentation by Jeffrey Finder, Senior Product and Test Engineering Manager at NXP, named “Building a Test Ecosystem for High Volume Manufacturing of 76-81 GHz Semiconductor Radar Sensors” the repeatable and stable performance of mmWave contactor was highlighted for an Automotive Radar Sensor Chipset application. This presentation was given at the Test Vision 2020 workshop at Semicon West in July 2017.
(Download the full presentation here: Download)

As stated in the presentation, NXP has been using the mmWave contactor in production since Q3 of 2016. In the presentation Jeffrey stated that a recent modification in the materials of the mmWave contractor biasing element translated to a 400% increase in the number of insertions for production testing of their 76-81GHz radar sensor. Multitest has implemented this new biasing element material in the mmWave contactor after thorough internal lab testing leveraging the long-term experience and expertise in contactor design and production. The new material has shown to last more than 5 million actuations with minimal wear and without degradation in spring force.

Multitest has more than seventy five mmWave contactors in the field testing automotive radar and WiGig application devices, including RF transceivers, high gain amplifiers, LNAs, filters, switches, DACs, and ADCs. The mmWave contactor utilizes hybrid contacting technology to optimize RF performance and provide robustness for production testing of the most challenging mmWave devices. Inside the mmWave contactor, RF signals and adjacent grounds are routed on a leadframe, while the rest of the DUT I/O are contacted by standard pogo pins. The number of interconnects between the DUT and tester are minimized for RF signals through the use of co-planar waveguide structures on the leadframe that make direct connection with the DUT and bypass the PCB with either a coax connector and cable or waveguide to interface directly with the tester.

Dan Campion, Director of Business Development for the Interface Products Group, comments: “We are working closely with our customers to understand their most challenging test requirements and for opportunities to continuously improve our solutions. The enhanced life time of our mmWave contactor enables  our customers to increase equipment utilization and OEE. Today customers report our mmWave contactor overall lifetime up to 1,500,000 insertions in production test with an automated handler, which is a testament to the robustness of our solution.”

To learn more about the Multitest mmWave Contactor, please visit http://multitest.com/mmWave

WLCSP Test: Efficient High Volume Solution for Post-Saw Testing

Multitest InWaferX for final test of singulated WLCSPs

Multitest’s new InWaferX final test solution for singulated WLCSPs addresses the increased quality demand for automotive applications as these quality requirements are expanding to cost sensitive, high volume consumer applications. Based on the production proven InCarrier technology, InWaferX ensures highest efficiency and yield for lowest cost of test.

The InWaferX solution enables post saw testing of singulated WLSCPs detecting all production defects in true final test of singulated devices. In addition, the same process can be deployed for retest and RMA process handling. Both options significantly enhance the production quality of the shipped devices and substantially support the zero defect parts per million (ppm) efforts of the device makers. In addition the InWaferX is equipped with a full 6 side vision inspection capability for complete physical validation.

InWaferX combines high multisite testing with the highest positioning accuracy for best yield and 100% touch efficiency on the rectangular carrier trays. InWaferX supports the high daily output requirements in today’s high volume manufacturing (HVM) environments.

Based on the well-established InCarrier / InStrip solution, the InWaferX supports full range temperature testing, as well as, MEMS/sensor testing. The InWaferX final test solution can be applied for WLSCPs from sawn film frame or tape and reel.

Andreas Bursian, Senior Director Innovation, comments: “We did extensive system validation on a production test floor and passed all requirements such as ESD, safety and operational conditions. Compared to the traditional wafer probing, the InWaferX test solution has proven to increase test throughput and outgoing device quality.

To learn more about the Multitest InWaferX solution based on the InCarrier, please visit http://multitest.com/incarrier/

Multitest Successfully Introduced New Super Sharp Gemini Kelvin Probes

Seamless switch to higher-yield probes

Multitest recently passed an evaluation of new-super-sharp Gemini Kelvin (GMK) probes. The evaluation took place at an OSAT testing devices for a major customer. Although the customer was not experiencing issues with the original GMK probes, they were encouraged to try the super-sharp probes and saw a measurable improvement in both test yield and probe life. The OSAT plans to order all super-sharp probes going forward to help reduce costs and increase throughput.

As Multitest designed and fabricated finer-pitch probes over the last few years, those probes were made super sharp in order to provide adequate pressure at the contact point with the lower force developed by the smaller springs. The super-sharp probes were released to the field after the standard, rigorous internal testing. They have been in high-volume production test for several years now, and have demonstrated excellent performance.

Since then, Multitest has updated the designs of some probes to have super-sharp tips for applications where it was difficult to maintain low and consistent contact resistance (RC). The super-sharp probes exhibited the anticipated improvement in performance and continue to perform well in these applications, extending the useful life of the probes. Based on internal testing and this field data, Multitest is encouraging customers to make the seamless switch to sharp-tip styles at no increase in cost.

Senior Product Manager Bert Brost says “While the GMK product was doing a good job, we decided to make it better without any incremental cost for the customer. Making it better means increasing the customer’s throughput, increasing the customer’s system run times between cleaning, and increasing the customer’s first pass yields.”

To learn more about the Gemini Kelvin contactor, please visit http://multitest.com/geminikelvin

Multitest MiCon® Contactor: Advantages of Cantilever Design for MCU and ASIC Testing

Significant Improvements in Overall Equipment Efficiency (OEE)

Multitest recently launched the MiCon contactor. The MiCon leverages the industry-proven Cantilever technology for the final test of Microcontrollers, Industrial DSPs and Application Specific ICs. Evaluations at customer test floors showed substantial improvements in first pass yield, life span and cleaning cycles compared to spring pin solutions. MiCon fully supports the requirements of a high, stable and reliable production output at lowest cost of test.

MiCon leverages the proven Cantilever technology for an architecture, which matches existing spring pin test boards and provides self-cleaning wipe. MiCon is a spring pin  footprint compatible alternative supporting advanced temperature requirements as well as advanced power/current requirements. The footprint compatibility allows for easy and cost-efficient conversion from spring pin setups. The fully decoupled load board side of the spring ensure no degradation of the load board pad.

MiCon features a single piece design, which ensures a long lifespan, low and stable contact resistance, high current carrying capability and an extended temperature range. The MiCon allows for testing at full specification values. The extended operating range accommodates device lead trim and form variability such as device alignment accuracy and device lead coplanarity.

Marcel Sans, Project Manager, explains: “The performance reports, received from the onsite customer evaluations, showed extraordinary advantages compared to the traditional spring pin solutions with a first pass yield of 99.8 %, time between cleaning cycles more than doubled and provided full contacting performance without signs yield degradations at high insertions counts, beyond the spring pins end of life.”

To learn more about the Multitest MiCon contactor, please visit http://multitest.com/MiCon

Multitest Atlas Contactor Demonstrates Advanced Electrical and Mechanical Performance in WLCSP Testing

Atlas 0.3 mm pitch spring probe validated at customer site

Multitest’s new 0.3 mm pitch Atlas contactor successfully passed a demanding customer production floor evaluation. The customer’s evaluation measures confirmed that the Atlas did reduce the customer’s cost of test while improving test yield and increasing throughput. Based on the evaluation results, the customer ordered a significant number of Atlas 030 contactors to support their new product WLCSP production ramp.

The customer is a long time user of Multitest contactors and after reviewing the new Atlas design they were eager to evaluate it. It is the added strength of the Atlas cruciform tip that captured the customer’s attention.  Not only is the Atlas mechanically superior, the Atlas offers electrical performance that allows the customer to test to the true performance of the device. The evaluation ended with the customer placing an order for a significant quantity of Atlas 030 contactors.

The key to the WLCSP Atlas’s high performance, high reliability and superior electrical contacting is the combination of increased mechanical tip strength and short probe electrical performance.  Atlas WLCSP test contactors achieve mechanical reliability with a rigid “cruciform” tip applied to Multitest’s QuadTech flat probe technology.  The Atlas 030 offers a short electrical path, with lower capacitance and inductance that is ideal for functional and AC parametric testing of WLCSP devices that require high system bandwidth and throughput gains in large multisite test applications.

The cruciform tip provides increased tip rigidity with a much greater immunity to breakage than traditional WLCPS probes used in earlier-generation test sockets. The Atlas 030 has 0.310 mm of compliance for bump structures that requires a larger compliance window for reliable contacting in high parallel test applications.

Bert Brost, Senior Product Managers, explains: “We are very proud of the positive result of the evaluation. The evaluation by the customer confirmed what we already knew, the Atlas 030 contactor is a high performance solution for WLCSP testing.”

To learn more about the Multitest Atlas contactor, please visit http://multitest.com/atlas

Expanding Capabilities for Temperature Testing

Multitest Soak Booster for Significant Reduction of Soaking Time

Multitest recently installed the well-established tri-temp handler MT9928 with an enhanced Soak Booster option. The Soak Booster cuts down the soak time by up to 50%. Multitest is currently the only company offering this kind of advanced technology for gravity handlers.

With this development Multitest is responding to the market need for temperature testing of large devices where soak time closely correlates with throughput,  and as a result, impacts the cost of test. High-volume production test of automotive devices is one market that benefits from this enhanced Soak Booster capability.

Whereas the industry standard for gravity handling is thermal heat transfer by radiation from track to device, Soak Booster uses convection as transfer principle. The temperature controlled air is blown directly to the device.

The “Soak Booster” option is built on Multitest’s excellence in temperature test solutions and is available for SO packages down to 300 mil in size.

To learn more about the MT9928 gravity handler, please visit http://multitest.com/mt9928

Proven RF Performance Based on Proprietary Design

Link HB Contactor Compensates for HIB Tolerances

Multitest’s Link HB contactor exhibited excellent RF performance at customer sites ensuring ultra-clean high speed signals. The patent-pending design adds boardside compliance to compensate for board fabrication tolerances ensuring increased contact reliability and multisite stability.

Based on the well-established offset vertical architecture of the Link contactor, Multitest has developed the Link HB which adds boardside compliance with improved pin/pad concentrated contact. The proprietary design of the Link HB (patent pending) compensates for load board planarity tolerances, which are particularly critical in multisite applications.

The offset vertical architecture of the Link contactor family is designed to support superior test yield, maximum repeatability and low repair and replacement cost. The wipe motion of the probe provides scrub through oxides on the IC pads and cleans itself when moving back to its original free height.

This motion is fully decoupled from the connection to the test interface board resulting in a stable connection between the probe and the load board pad, avoiding pad wear and carbon debris buildup. This implementation also eliminates the potential for arcing between the probe and the test interface board pad.

Tony Tiengtum, Product Manager, commented, “Two recent European customers have confirmed the superior performance of the Link HB contactor.  In feedback to us they said the actual performance of the contactor was as advertised and went on to say that the Link contactor technology made it seem like the sockets were essentially transparent from an electrical perspective.”

To learn more about the Multitest Link Contactor family, please visit http://multitest.com/link

High Volume Test for Absolute Pressure Sensors

Multitest InPressure HD System Released to Production for Automotive Application

Multitest’s new InPressure HD system successfully passed all correlation tests on a customer test floor and has been released to production testing sensors for an automotive application. Multitest InPressure HD brings the field proven InPressure solution for absolute pressure test to the next level of parallel testing with up to 1440 signal lines.

InPressure HD is the next generation automotive test solution for absolute pressure sensors up to 16 bar. In addition to the increased number of signal lines, the form factor of the strip or carrier has been increased to 70 x 250 mm.

The InPressure HD supports strip-like InCarrier test. InCarrier based testing is known for low jam rates, high first pass yield and best temperature accuracy, ensuring high OEE even for challenging applications including automotive and industrial.
Short pressure setting times of below 2 seconds, as well as a parallel soaking architecture, enable the high throughput of this high volume manufacturing (HVM) test solution.

The InPressure HD continues Multitest’s modular InMEMS machine concept, which provides highest flexibility to customers by enabling different stimulus configurations for different sensor types.

Andreas Nagy, Senior Director Handler Group Marketing and Test Cell Innovation, comments: “The InPressure HD is the next generation solution for reliable HVM absolute pressure sensor test and calibration up to 16 bar, both of which are typically required in the automotive and industrial pressure sensor market. “

To learn more about the Multitest sensor test portfolio, please visit http://multitest.com/inmems/

Best Temperature Accuracy for Testing of High Pin Count Packages

Multitest MT9510 Pick-and-Place Handler available with additional temperature control features

The Multitest MT9510 pick-and-place handler is now available with an optional active socket purge (ASP). The ASP is another feature to support the excellent temperature performance of the well-established MT9510 test handler.

By applying thermal controlled air flow to the pins the ASP keeps the temperature contact pin in the socket at the set test temperature. ASP provides optimum thermal energy to device under test and reduces the energy losses during test significantly. Particularly for high pin count devices this has a substantial influence on the overall temperature performance and therefore reduces the temperature calibration efforts.

Syariffuddin Kamarudin, Product Manager MT9510, explains: “With ASP we extend our temperature control features for the MT9510. This is especially important for the automotive market where strict requirements for temperature accuracy are in already in place. The MT9510 with ASP will support our customers to improve quality and yield.”

To learn more about the Multitest MT9510, please visit http://multitest.com/MT9510

Multitest Atlas Contactor Brings Advanced Electrical and Mechanical Performance to WLCSP Testing

Atlas 0.3 mm pitch spring probe for reduced cost of test

Multitest’s Atlas contactor with 0.3 mm pitch responds to challenging requirements in WLCSP testing. The Atlas 030 high performance WLCSP test contactors are designed to meet the electrical requirements of today’s testing environment, without sacrificing mechanical performance. Long probe life, combined with improved first pass yields and easy WLCSP probe replacement in test fixtures and probe heads, significantly contributes to a lower cost of test.

The Atlas 030 contact profile is critically important to achieving high bandwidth, low contact resistance, long life and high reliability. The Atlas 030 offers a shorter electrical path, lower capacitance and inductance, and increased tip rigidity with a much greater immunity to breakage than traditional WLCSP probes used in earlier-generation test sockets. The Atlas 030 has 0.310 mm of compliance for bump structures that requires a larger compliance window for reliable contacting in high parallel test applications.

The Atlas 030 contactors are designed to meet standard sizes and footprints. This makes Atlas 030 an efficient and easy to install solution for replacing other WLCSP test sockets in a variety of applications. Atlas 030 supports both manual and automated contacting of WLCSPs. The Atlas 030 combines Multitest’s proprietary precision manufacturing process for producing smooth sub-micron features with an innovative cruciform tip design for optimum electrical and mechanical performance.

Bert Brost, Product Managers, explains: “Spring probes are emerging as the wafer-level chip scale package (WLCSP) contacting technology of choice. Spring probe WLCSP contactors and probe heads provide high bandwidth, low and repeatable contact resistance, with increased compliance and are easily maintained by our customers. The Atlas 030 is our response to the need of our customers for improving mechanical and electrical performance in WLCSP testing without increasing the cost of the interface.”

To learn more about the Multitest Atlas contactor visit http://multitest.com/atlas