High Volume Test for Absolute Pressure Sensors

Multitest InPressure HD System Released to Production for Automotive Application

Multitest’s new InPressure HD system successfully passed all correlation tests on a customer test floor and has been released to production testing sensors for an automotive application. Multitest InPressure HD brings the field proven InPressure solution for absolute pressure test to the next level of parallel testing with up to 1440 signal lines.

InPressure HD is the next generation automotive test solution for absolute pressure sensors up to 16 bar. In addition to the increased number of signal lines, the form factor of the strip or carrier has been increased to 70 x 250 mm.

The InPressure HD supports strip-like InCarrier test. InCarrier based testing is known for low jam rates, high first pass yield and best temperature accuracy, ensuring high OEE even for challenging applications including automotive and industrial.
Short pressure setting times of below 2 seconds, as well as a parallel soaking architecture, enable the high throughput of this high volume manufacturing (HVM) test solution.

The InPressure HD continues Multitest’s modular InMEMS machine concept, which provides highest flexibility to customers by enabling different stimulus configurations for different sensor types.

Andreas Nagy, Senior Director Handler Group Marketing and Test Cell Innovation, comments: “The InPressure HD is the next generation solution for reliable HVM absolute pressure sensor test and calibration up to 16 bar, both of which are typically required in the automotive and industrial pressure sensor market. “

To learn more about the Multitest sensor test portfolio, please visit http://multitest.com/inmems/

Best Temperature Accuracy for Testing of High Pin Count Packages

Multitest MT9510 Pick-and-Place Handler available with additional temperature control features

The Multitest MT9510 pick-and-place handler is now available with an optional active socket purge (ASP). The ASP is another feature to support the excellent temperature performance of the well-established MT9510 test handler.

By applying thermal controlled air flow to the pins the ASP keeps the temperature contact pin in the socket at the set test temperature. ASP provides optimum thermal energy to device under test and reduces the energy losses during test significantly. Particularly for high pin count devices this has a substantial influence on the overall temperature performance and therefore reduces the temperature calibration efforts.

Syariffuddin Kamarudin, Product Manager MT9510, explains: “With ASP we extend our temperature control features for the MT9510. This is especially important for the automotive market where strict requirements for temperature accuracy are in already in place. The MT9510 with ASP will support our customers to improve quality and yield.”

To learn more about the Multitest MT9510, please visit http://multitest.com/MT9510

Multitest Atlas Contactor Brings Advanced Electrical and Mechanical Performance to WLCSP Testing

Atlas 0.3 mm pitch spring probe for reduced cost of test

Multitest’s Atlas contactor with 0.3 mm pitch responds to challenging requirements in WLCSP testing. The Atlas 030 high performance WLCSP test contactors are designed to meet the electrical requirements of today’s testing environment, without sacrificing mechanical performance. Long probe life, combined with improved first pass yields and easy WLCSP probe replacement in test fixtures and probe heads, significantly contributes to a lower cost of test.

The Atlas 030 contact profile is critically important to achieving high bandwidth, low contact resistance, long life and high reliability. The Atlas 030 offers a shorter electrical path, lower capacitance and inductance, and increased tip rigidity with a much greater immunity to breakage than traditional WLCSP probes used in earlier-generation test sockets. The Atlas 030 has 0.310 mm of compliance for bump structures that requires a larger compliance window for reliable contacting in high parallel test applications.

The Atlas 030 contactors are designed to meet standard sizes and footprints. This makes Atlas 030 an efficient and easy to install solution for replacing other WLCSP test sockets in a variety of applications. Atlas 030 supports both manual and automated contacting of WLCSPs. The Atlas 030 combines Multitest’s proprietary precision manufacturing process for producing smooth sub-micron features with an innovative cruciform tip design for optimum electrical and mechanical performance.

Bert Brost, Product Managers, explains: “Spring probes are emerging as the wafer-level chip scale package (WLCSP) contacting technology of choice. Spring probe WLCSP contactors and probe heads provide high bandwidth, low and repeatable contact resistance, with increased compliance and are easily maintained by our customers. The Atlas 030 is our response to the need of our customers for improving mechanical and electrical performance in WLCSP testing without increasing the cost of the interface.”

To learn more about the Multitest Atlas contactor visit http://multitest.com/atlas

Better Contacting Yield by Innovative Proprietary Design

Link HB Contactor Compensates for HIB tolerance

Multitest launches a new design of the well-established Link contactor. The Link HB adds boardside compliance to compensate for board fabrication tolerances ensuring increased contact reliability and multisite stability.

The offset vertical architecture of the Link probe is designed to support superior test yield, maximum repeatability and low repair and replacement cost. The wipe motion of the probe provides scrub through oxides on the IC pads and cleans itself when moving back to its original free height.

This motion is fully decoupled from the connection to the test interface board resulting in a stable connection between the probe and the load board pad, avoiding pad wear and carbon debris buildup. This implementation also eliminates the potential for arching between the probe and the test interface board pad.

Striving for continuous improvements to ensure best performance Multitest has developed a solution, which adds boardside compliance with improved pin/pad concentrated contact. This proprietary design of the Link HB (patent pending) compensates for load board planarity tolerances, which are particularly critical in multisite application.

To learn more about the Multitest Link Contactor family, visit http://multitest.com/link

Relying on Leading Test Handling Know-How: Rapid Acceptance of the New MT2168 XT Handler by the Market

Four majors IDMs decide for the MT2168 XT

Multitest has received multiple orders for the new tri-temp pick and place handler, the MT2168 XT. Shortly after its official introduction to the market four global IDMs have chosen the MT2168 XT for their volume production.

After comprehensive demos or onsite evaluations customers have chosen the MT2168 XT because of its temperature performance, high multisite capabilities, flexibility, and small floor space requirements. The MT2168 XT is considered a platform not only to address today’s requirements for highly reliable and cost-efficient test handling, but also because it offers great flexibility and an innovative architecture to support future needs.

The highly flexible contact site layout facilitates the transfer of existing applications from legacy gravity and pick-and-place handlers, by allowing for a reuse of the existing load board.

During demos and evaluations the sophisticated plunging solutions fully validated the expected best first pass yield, which directly supports high daily output in volume production.

Günther Jeserer, Vice President Gravity and Pick & Place Products, comments: “Besides the discussion on the technical details, it has become obvious, how important the combination of in-depth handling know-how with advanced innovation is for our customers. A new platform needs to provide reliable quality today, but also leverage the latest technology to support highest efficiency and lowest cost. The MT2168 XT leverages both: more than 30 years expertise in test handling and a next-generation architecture.”

To learn more about the MT2168 XT tri-temp pick and place handler, please visit http://multitest.com/mt2168-xt

Expanding on Proven Solutions: New Sensor Test Module for Twin Axis Stimulation

Multitest has shipped new high g sensor test module for X/Z stimulation

Multitest shipped a new “Shaker” high g sensor test module for the MT9928. The module allows for twin axis testing in one stimulation on the x and z axis. The module expands the MEMS/sensor test portfolio for the flexible and modular MT9928 handler platform, which already includes multiple solutions for test and calibration of inertial MEMS/sensors.

With the kitable and modular MT9928 platform, in combination with dedicated MEMS/sensor test modules, the customer receives a highly flexible test setup which can easily be converted to different packages styles and MEMS/sensor applications.

The generic Multitest MEMS test approach deploys all features and functions of the standard handling system and addresses the MEMS specific requirements by adding MEMS/sensor test and calibration carts with dedicated stimulus boxes.

The new twin axis high g sensor test module is dedicated for X/Z stimulation of a MEMS device and allows for two axis testing in one stimulation. By applying one stimulation, cycle time can be saved and the packages need to be touched less often reducing the risk of damage during test. For testing at various temperature levels this advantage is even greater.

The twin axis X/Z high g module for the MT9928 gravity handler offers advantages in test time, test process optimization and flexibility, as well as, better equipment utilization. The module has proven best performance with less than 1.5 % THD at 14 g 100 Hz stimulation.

To learn more about the Multitest MEMS test and calibration solutions, please visit http://multitest.com/sensor

Multitest Atlas Contactor Outperforms Competition:

Significant improvements in yield and life span

Multitest’s Atlas contactor with the recently launched Atlas 040 probe has demonstrated substantial advantages over a competitive solution in an onsite evaluation at a major Asian customer. Both test yield and probe life span were significantly increased and contributed to a sustainable cost of test improvement  for the entire test cell.

The Atlas contacting products are the next generation of Multitest’s revolutionary QuadTech flat probe technology. The Atlas 040 is a high performance contactor designed for 0.4 mm pitch WLCSP and large BGA ball count device-under-test contacting applications. The Atlas 040 was configured as part of a quad site setup with a LTX-Credence Diamond10 tester.  The Atlas 040 contactor delivered a 25% longer life for the customer with 250K insertions and first pass yields were increased by 4 percentage points. With these results the Atlas contactor clearly met the customer’s criteria to increase yields, increase system uptime, and reduce costs. After this successful evaluation the Atlas was designated the customer’s contacting solution of choice.

Bert Brost, Product Managers, explains: “The development of the Atlas probe was driven by the customer’s need for a low cost probe that has the strength and reliability of a radial probe but at a fraction of the cost. The measurable focus was low cost, high bandwidth, long life, with low and repeatable contact resistance. Higher test yields and longer probe life directly translate into less test capacity required for retest, higher system uptimes and a significantly increase in the number of shipped devices.”

To learn more about the Multitest Atlas contactor, please visit http://multitest.com/atlas

Small Packages on Multitest Pick and Place Handlers

Multitest MT2168 and MT9510: Ready for Packages below 3 x 3 mm

Multitest expanded the package range for both pick and place handler platforms – the MT9510 and MT2168 to devices smaller than 3 x 3 mm. The expanded package portfolios of the MT9510 and MT12168 go beyond the typical ranges of established pick and place systems

Multitest’s industry-leading handling solutions for small sized devices fully maintain the proven temperature and multi-site test capabilities. This combination makes the Multitest pick and place handlers the platform of choice for high volume application, which not only require reliable handling of small packages with high yield, but also best accuracy and stability in the full tri-temp range.

Multitest has installed multiple pick and place handling systems leveraging this new package range in Asia and Europe.

To learn more about the Multitest’s pick and place handling solutions, please visit http://multitest.com/pick-place

Multitest Triton 080 Contactor: New Tip for Significant OEE Improvements

Multitest recently introduced a new version of the well-established high performance Triton contactor. The new TRN080 delivers reduced cleaning needs, which directly contribute to higher test cell availability and better Overall Equipment Efficiency (OEE).

The Triton is the ideal high performance probe for general purpose and digital applications that demand high bandwidth contactor performance. Triton meets the requirements of the new generation of densely packaged large I/O count semiconductors for a high level of electrical and mechanical performance that is often unattainable with traditional spring probe test sockets. The next generation Triton 080 deploys a monolithic alloy probe tip that is less likely to bond with device lead/ball plating alloys. The lack of solder bonding to probe tip means reduced solder build up on probe tips leading to longer run times between cleaning.

Bert Brost, Product Managers, explains: “Multitest leverages years of experience in flat probe technology and innovation in the development of spring probe components for increasing the customer′s OEE in backend test. The new Triton 080 is a perfect example how we continue to analyze the changing market requirements to offer leading products to our customers.”

To learn more about the Multitest sensor test portfolio, please visit http://multitest.com/triton

Supporting Growth of Integrated Environmental Sensors

Multitest InHumid for testing of environmental combo sensors successfully installed

Multitest’s first InHumid test system for final test of environmental sensors was successfully installed at a major European IDM. The Multitest solution allows for high volume single-insertion test and calibration of integrated environmental sensors measuring pressure, temperature, humidity and gas.

InHumid is an optional upgrade to Multitest’s well-established InBaro module, adding humidity and gas test to the barometric test capability provided by InBaro. The physical structures to apply humid air or gas flow to the DUT reside inside the conversion kit. This architecture facilitates easy upgrading in the field. For testing the gas element of environmental sensors InHumid can be extended by a gas option. This option provides the measures needed to operate the machine in a safe manner when testing typical environmental, gases traced in air quality monitoring, or personal fitness applications (e.g. connections to attach to a general exhaust system).

The InHumid solution fully leverages the temperature capabilities and proven high volume performance of the InBaro/InStrip set-up. Like with InBaro InHumid can be used in a Multitest InCarrier set up to support reliable and robust test handling of small MEMS packages, which are typical for environmental sensors in consumer applications.

Gabriela Born, Director InMEMS and IoT Products, comments: “Our customers are experiencing a growing demand for environmental sensors mainly driven by expanding applications on consumer devices. In particular gas sensors in smartphones and wearables are expected to raise the number of shipped units exponentially over the next 4 to 5 years. To meet this demand, true high-volume production solutions will be necessary, which provide reliable test at low cost per unit.”

To learn more about the Multitest sensor test portfolio, please visit http://multitest.com/sensor