atg Luther & Maelzer to introduce the highly automated A8a Flying Probe Test System at IPC APEX 2017

atg Luther & Maelzer GmbH will introduce its new A8a Automatic Bare Board Flying Probe Test System at IPC APEX EXPO 2017, which is scheduled to take place on February 14 – February 16, 2017 at the Convention Center in San Diego CA.

atg Luther & Maelzer North American Sales Director, Klaus Koziol, highlights: “The A8a is atg-LM’s latest innovation in high performance, high accuracy automatic flying probe testing. The A8a provides the flexibility of flying probe test while delivering high throughput. “

To achieve high throughput the key features of the A8a is a new design dual shuttle system which reduces the product exchange time to zero seconds. In addition to superior test speed of up to 140 measurements per second the A8a provides innovative load /unload and pass / fail sorting for true automatic „lights-out“ operation.

Typical features such as high accuracy Kelvin 4 wire, embedded component and latent defect test are available as well as a tension clamp set up for flexible products.

To learn more about the A8a, please visit http://atg-lm.com/A8a

ECT Fixture Press Adapter: A Major Step towards Automation, Ease of Handling, Reliability and Cost Reduction

Everett Charles Technologies (ECT) recently introduced the new ECT Fixture Press Adapter for in-circuit testing, which utilizes the well-established ECT VG interface to offer a standardized module in the PCBA test setup. Complexity of the fixtures is reduced leading to significant benefits in cost, lead time and reliability, as well as to reductions of the fixtures weight and size. Additionally, the ECT Fixture Press Adapter requires less operator effort.

The Fixture Press Adapter allows for separating the actuation hardware from the core functions of the fixture. The actuation is taken over by the Fixture Press Adapter, which can receive the exchangeable fixtures. The fixture itself can be designed fully dedicated to the actual test without components for actuation. The reduced complexity of the fixture substantially lowers the fixture cost and shortens the lead time. Additionally, the lowered weight and the smaller fixture size provide enhanced ease of operation and reduce the space requirements for storing.

The Fixture Press Adapter is placed onto an existing ICT machine. Inside the adapter, internal connections remap the ICT test interface to the ECT VG 12 block VG (Pylon) interface. Since the adapter has a built-in linear pneumatic press, cassette type fixtures can be quickly loaded into the system for board test. Loading the upper and lower cassette items takes less than 15 seconds.

The ECT Fixture Press Adapter supports PCBAs up to 400 mm x 210 mm and a maximum cylinder travel of 250 mm with an operational speed of 1 to 1.1 seconds. The ECT Fixture Press Adapter is able to deliver a force of up to 8700 N, which corresponds to compressing 3150 8oz probes.

To learn more about ECT’s in-circuit test fixtures, please visit http://ect-fsg.com/incircuit-test-fixtures or contact us at marcom_ECT-FSG@Xcerra.com to request the data sheet of the ECT Fixture Press Adapter with more technical information

Xcerra launches a comprehensive support program for test handlers

OEM Protect Offerings Ensure Full Performance of Handling Equipment

Xcerra’s OEM Protect program offers multiple options to ensure highest equipment uptime and performance in combination with simplified processes and optimized price structure for onsite maintenance and spare parts supply. OEM Protect supports Xcerra customers in achieving the highest return on investment for their test handlers.

Professionally maintained equipment with high quality and reliable parts will yield best production performance, highest Overall Equipment Efficiency, reliable test quality and finally, best cost of test. The Xcerra OEM protect program is based on four generic types of contracts, which will be tailored to the actual requirements of the customer.

  • OEM PM Contract: Effective and efficient savings of preventive maintenance cost.
  • OEM Parts Contract: Easy and cost-efficient spare parts supply
  • OEM Plus: Combines the OEM PM offering or the OEM Parts offering with professional onsite labor support

To meet the needs of HVM production sites, all of these offerings are designed to reduce the administration effort and includes priority escalation services.

For R&D sites or ramping businesses, the OEM Protect program includes the fourth contract option:

  • OEM Ramp Pack: The most flexible short term contract that provides maintenance support through new product ramps and customer deliveries.

Jamie Luke, Vice President Global Field Service, adds: “With the OEM Protect program, we developed a set of flexible contract offerings that provide our customers flexibility and the opportunity to leverage the knowledge gained from our long-term support of a large installed base of equipment. Our global assistance network ensures prompt support in every time zone. Equipment availability and performance is a decisive differentiator and a major contributor to the overall success of our customers. ”

To learn more about the Xcerra OEM Protect program, please visit www.Xcerra.com/OEM-Protect

Choosing the Right ECT Spring Probe for ICT and FCT Testing

How do I select Base Material / Plating, Spring Force, and Tip Selection?

In the world of spring probes, choices abound when it comes to selecting materials and platings for plungers, barrels and springs. Choosing the right options can greatly impact yield, probe life and cleaning frequency.

Base Materials

BeCu is a popular choice for both plungers and barrels and has outstanding mechanical properties with high electrical conductivity. Steel is significantly harder and is typically used for plungers with aggressive tip styles. Nickel Silver is very resistant to corrosion and is well suited for barrels. Bronze has good wear resistance, cold formability and high electrical conductivity. Lastly, brass is a high quality material with high electrical conductivity and good wear resistance.

Plating Choices

Choosing the right plating depends on the application and customer preference.  Gold is widely used and provides excellent electrical performance and good corrosion resistance. To address lead free solder challenges, ECT has developed a proprietary plating material called LFRE which is approximately 5 times harder than gold.  LFRE plated tips are much more durable and wear resistive than gold and have proven to last more than twice as long as gold plated probes. LFRE probes are also less susceptible to solder and material transfer and require less cleaning than gold plated probes.

Spring Force

Spring force selection is mainly dependent upon the application. It provides the required compliant force at the plunger tip and the contact force between the barrel and the plunger. Higher spring forces provide more effective penetration through contamination contact points, but leave heavier witness marks on the test point. Lower spring forces should be used where no witness marks are welcome or to prevent board flexing on higher pin count applications.  Stainless steel must be used for springs when test temperatures exceed 100°C.

Tip Selection

Most tip styles can be used for a variety of different applications. However, some test targets are better suited for unique tip styles. Some applications require a non-aggressive tip to be used on pads, such as radius, crown, or flat.  These tips leave little to no witness marks on test pads. For through-hole vias ECT offers: blade, star, or pyramid tip styles. These are well suited for contact through the outer ring of the via surface. Over time solder builds up oxide layers, therefore medium to very aggressive tips like the serrated, crown, blade, pyramid and point are used. Posts, pins or screws are more unpredictable and therefore more challenging. For these applications, tip styles like the cup, serrated and crown are best suited. Other applications may require more unique tip styles depending on test target material, size, shape, access and cleanliness.   With over 50 years of making high quality spring probes, ECT has developed a vast library of probe options for all your testing needs.

Product Selection Made Easy on shop.ect-cpg.com

The new e-shop provides sophisticated filters to make your product selection as convenient as possible. To learn more about the ECT offerings for ICT / FCT test, click here.

To learn more, visit http://ect-cpg.com

 

 

ECT Test Fixtures: Customized Solutions on a Global Scale

Everett Charles Technologies’ (ECT) is a true global test fixture and programming services company, supporting customers worldwide with test design for high volume production PCBA’s. This global presence ensures prompt support while at the same time holding to our global standards and ensuring they are reliably met.

ECT’s Fixture Services Group offers customization for both In Circuit Test as well as Functional Test Fixtures. ECT experts provide support for Supply Chain and Product/Project managers with our ability to offer worldwide fixture duplication and global test fixture installation and support with manufacturing and service centers in the Americas, Europe, Asia, and Mexico.

With the application of global fixture standards that are developed in close cooperation with our customers, ECT ensures exact duplication of test fixtures that can be manufactured and deployed globally.

The global product and service portfolio of ECT includes ICT Test Fixtures, FCT Test Fixtures, VG Mass Interconnect Systems, Total Solution Turn Key Projects, Pneumatic Fixtures, Dual Stage, Dual Access, Loopbacks, Bare board and Backplane Test fixtures,

Scott Manty, Director of Sales, explains: “The standardization of parts on a global scale allows us to ensure that the same quality standards are adhered to for meeting the demanding requirements of today’s test industry wherever your product is manufactured. Our ability to deliver, install and support almost anywhere in the world give our customers the advantage of knowing that assistance is very close for part or process change support or ECO implementation.”

To learn more about ECT’s global presence, please visit http://ect-fsg.com/global-services

 

Better Contacting Yield by Innovative Proprietary Design

Link HB Contactor Compensates for HIB tolerance

Multitest launches a new design of the well-established Link contactor. The Link HB adds boardside compliance to compensate for board fabrication tolerances ensuring increased contact reliability and multisite stability.

The offset vertical architecture of the Link probe is designed to support superior test yield, maximum repeatability and low repair and replacement cost. The wipe motion of the probe provides scrub through oxides on the IC pads and cleans itself when moving back to its original free height.

This motion is fully decoupled from the connection to the test interface board resulting in a stable connection between the probe and the load board pad, avoiding pad wear and carbon debris buildup. This implementation also eliminates the potential for arching between the probe and the test interface board pad.

Striving for continuous improvements to ensure best performance Multitest has developed a solution, which adds boardside compliance with improved pin/pad concentrated contact. This proprietary design of the Link HB (patent pending) compensates for load board planarity tolerances, which are particularly critical in multisite application.

To learn more about the Multitest Link Contactor family, visit http://multitest.com/link

Relying on Leading Test Handling Know-How: Rapid Acceptance of the New MT2168 XT Handler by the Market

Four majors IDMs decide for the MT2168 XT

Multitest has received multiple orders for the new tri-temp pick and place handler, the MT2168 XT. Shortly after its official introduction to the market four global IDMs have chosen the MT2168 XT for their volume production.

After comprehensive demos or onsite evaluations customers have chosen the MT2168 XT because of its temperature performance, high multisite capabilities, flexibility, and small floor space requirements. The MT2168 XT is considered a platform not only to address today’s requirements for highly reliable and cost-efficient test handling, but also because it offers great flexibility and an innovative architecture to support future needs.

The highly flexible contact site layout facilitates the transfer of existing applications from legacy gravity and pick-and-place handlers, by allowing for a reuse of the existing load board.

During demos and evaluations the sophisticated plunging solutions fully validated the expected best first pass yield, which directly supports high daily output in volume production.

Günther Jeserer, Vice President Gravity and Pick & Place Products, comments: “Besides the discussion on the technical details, it has become obvious, how important the combination of in-depth handling know-how with advanced innovation is for our customers. A new platform needs to provide reliable quality today, but also leverage the latest technology to support highest efficiency and lowest cost. The MT2168 XT leverages both: more than 30 years expertise in test handling and a next-generation architecture.”

To learn more about the MT2168 XT tri-temp pick and place handler, please visit http://multitest.com/mt2168-xt

Everett Charles Technologies to exhibit at BIOMEDevice Show 2016

Leading Contacting and Connector Solutions to Meet Challenging Requirements

Everett Charles Technologies (ECT) will exhibit its leading Contacting and Compliant Connector Solutions at the upcoming BIOMEDevice Show scheduled to take place December 7 – 8, 2016 at the San Jose Exhibition Center, California.

ECT offers a comprehensive portfolio of contacting and compliant connectors including customized solutions.

ECT’s offering of contacting products includes highly reliable battery probes for mission critical connections and proven RF probes to ensure accurate, consistent and repeatable contacts.

ECT’s “standard connectors” are based on a highly flexible architecture, which facilitates cost-efficient configurations for customer requirements. ECT compliant connectors meet the highest quality standards and have shown superior durability in high life cycle applications.

In addition to the off-the-shelf ‘catalog connectors’, which can be configured to customer requirements, ECT offers solutions fully designed to customer specifications. These custom solutions are needed, when standard products can’t meet the entire set of requirements. ECT’s in-house expertise in RF simulation is a unique and valuable asset for this capability. With the RF simulation and validation capabilities ECT is able to optimize the design prior to production. This process ensures the best performance of the connector and fastest project completion.

For more information, please visit http://ect-cpg.com/compliant-connectors or http://ect-cpg.com/accordion

 

Expanding on Proven Solutions: New Sensor Test Module for Twin Axis Stimulation

Multitest has shipped new high g sensor test module for X/Z stimulation

Multitest shipped a new “Shaker” high g sensor test module for the MT9928. The module allows for twin axis testing in one stimulation on the x and z axis. The module expands the MEMS/sensor test portfolio for the flexible and modular MT9928 handler platform, which already includes multiple solutions for test and calibration of inertial MEMS/sensors.

With the kitable and modular MT9928 platform, in combination with dedicated MEMS/sensor test modules, the customer receives a highly flexible test setup which can easily be converted to different packages styles and MEMS/sensor applications.

The generic Multitest MEMS test approach deploys all features and functions of the standard handling system and addresses the MEMS specific requirements by adding MEMS/sensor test and calibration carts with dedicated stimulus boxes.

The new twin axis high g sensor test module is dedicated for X/Z stimulation of a MEMS device and allows for two axis testing in one stimulation. By applying one stimulation, cycle time can be saved and the packages need to be touched less often reducing the risk of damage during test. For testing at various temperature levels this advantage is even greater.

The twin axis X/Z high g module for the MT9928 gravity handler offers advantages in test time, test process optimization and flexibility, as well as, better equipment utilization. The module has proven best performance with less than 1.5 % THD at 14 g 100 Hz stimulation.

To learn more about the Multitest MEMS test and calibration solutions, please visit http://multitest.com/sensor

Lifesaving Device Relying on Everett Charles Technology’s Probe Expertise

Chest Compression Device Deploys ECTs Pylon E-S series probe

Everett Charles Technologies (ECT) developed a custom version of the well-established Pylon E-S series spring probe, which is deployed in new generation chest compression devices for Emergency Medical Services and hospitals. The slightly modified Pylon E-S Series probe suits the harsh requirements for the lifesaving mission to assure the battery pack is continuously transferring power to the system.

The application requires a 100% reliable, no fail contact under all operating conditions.  In case of a low battery level the emergency team needs to replace the battery pack within seconds and make reliable contact instantly. The probe is air and liquid tight for hygiene and cleaning reasons and is capable of withstanding shock and vibe that occur during helicopter missions. The application requires an uninterrupted, continuous current of 4.0 A.

ECT and the customer jointly developed a robust solution by leveraging a well-established probe and thorough knowhow of precision machining of metals and plastics. In-depth electrical and mechanical analysis prior to hardware build validated the design and reduced development time.

Thomas Frenzel, Sales Manager Northern Europe, explains: “Based on this high-end and lifesaving application, the requirements have been one of the harshest we ever had to meet. Our solution replaces a competitive one, which failed at vibe test.”

To learn more about the ECT spring probes, please visit http://ect-cpg.com/spring-probes