High Volume Test for Absolute Pressure Sensors

Multitest InPressure HD System Released to Production for Automotive Application

Multitest’s new InPressure HD system successfully passed all correlation tests on a customer test floor and has been released to production testing sensors for an automotive application. Multitest InPressure HD brings the field proven InPressure solution for absolute pressure test to the next level of parallel testing with up to 1440 signal lines.

InPressure HD is the next generation automotive test solution for absolute pressure sensors up to 16 bar. In addition to the increased number of signal lines, the form factor of the strip or carrier has been increased to 70 x 250 mm.

The InPressure HD supports strip-like InCarrier test. InCarrier based testing is known for low jam rates, high first pass yield and best temperature accuracy, ensuring high OEE even for challenging applications including automotive and industrial.
Short pressure setting times of below 2 seconds, as well as a parallel soaking architecture, enable the high throughput of this high volume manufacturing (HVM) test solution.

The InPressure HD continues Multitest’s modular InMEMS machine concept, which provides highest flexibility to customers by enabling different stimulus configurations for different sensor types.

Andreas Nagy, Senior Director Handler Group Marketing and Test Cell Innovation, comments: “The InPressure HD is the next generation solution for reliable HVM absolute pressure sensor test and calibration up to 16 bar, both of which are typically required in the automotive and industrial pressure sensor market. “

To learn more about the Multitest sensor test portfolio, please visit http://multitest.com/inmems/

Finding the ECT Equivalent to an Existing Spring Probe Solution

Everett Charles Technologies Introduces the new online part conversion tool

Everett Charles Technologies (ECT) has recently launched a new online parts conversion tool, which converts most industry or competitors’ part numbers to a functionally equivalent ECT solution.

ECT has implemented a new online tool to convert non-ECT spring probe part numbers into ECT equivalent part numbers. The new cross-reference tool provides customers with a quick and easy way of determining if an ECT equivalent probe is available for their application.

When a customer enters a competitor’s part number into the cross-reference tool, it will provide an exact match to an existing ECT part number if available or to a “functional” equivalent when a perfect match does not exist. The conversion result includes a link to the product page on the ECT website, where detailed specifications allow customers to engage in more in-depth analysis of the ECT alternative. This lets the customer instantly check the electrical and mechanical specification of ECT’s recommended probe match and to compare critical parameters to verify compatibility.

Tony DeRosa, Product Manager, explains: “Our proficient engineers compiled the data for this tool, which leverages ECT’s extensive knowledge of spring probes along with our applications experience to allow us to accurately recommend conversion to ECT probes.”

Test the new online conversion tool here:

 

Custom Spring Probes Tailored to Demanding Requirements

Everett Charles Technologies leverages decades of expertise to optimize electrical and mechanical performance of custom spring probe solutions

Everett Charles Technologies (ECT) has the experience and knowhow to provide custom spring probes for just about every application. ECT’s custom tailored probe solutions are designed taking into account all mechanical, electrical, and environmental customer requirements, which result in an optimized solution.

Beyond a comprehensive portfolio of off-the-shelf spring probe solutions for a wide range of applications, ECT offers solutions fully designed to customer specifications when standard products don’t meet an entire set of requirements. Whether a requirement  is as simple as special tip geometry or as complex as a custom coax RF probe, ECT’s engineers combine state-of-the-art design, materials and production know-how, with ECT’s long-term experience in spring probe technology to deliver results that truly meet customers’ expectations.

ECT custom projects begin with direct engineer to engineer dialog with the customer to ensure design requirements are fully understood and that all design work leads to a solution fully aligned with their needs.

Electrical and mechanical analysis prior to hardware build, including proficient RF simulation when needed, increases design integrity. ECT’s well-defined process ensures a smooth release to production and on-time delivery to support the customer’s time-to-market targets.

Tony DeRosa, Product Manager, commented: “We keep expanding our probe portfolio while we are open for customer specific requests. By constantly expanding our understanding of innovative and reliable designs, materials, and production processes, we are able to meet advanced requirements that go beyond today’s standard applications.”

To learn more about how easy it is to start a special probe project at ECT, click here: visit https://shop.ect-cpg.com/support/special-probe-request/

Best Temperature Accuracy for Testing of High Pin Count Packages

Multitest MT9510 Pick-and-Place Handler available with additional temperature control features

The Multitest MT9510 pick-and-place handler is now available with an optional active socket purge (ASP). The ASP is another feature to support the excellent temperature performance of the well-established MT9510 test handler.

By applying thermal controlled air flow to the pins the ASP keeps the temperature contact pin in the socket at the set test temperature. ASP provides optimum thermal energy to device under test and reduces the energy losses during test significantly. Particularly for high pin count devices this has a substantial influence on the overall temperature performance and therefore reduces the temperature calibration efforts.

Syariffuddin Kamarudin, Product Manager MT9510, explains: “With ASP we extend our temperature control features for the MT9510. This is especially important for the automotive market where strict requirements for temperature accuracy are in already in place. The MT9510 with ASP will support our customers to improve quality and yield.”

To learn more about the Multitest MT9510, please visit http://multitest.com/MT9510

Multitest Atlas Contactor Brings Advanced Electrical and Mechanical Performance to WLCSP Testing

Atlas 0.3 mm pitch spring probe for reduced cost of test

Multitest’s Atlas contactor with 0.3 mm pitch responds to challenging requirements in WLCSP testing. The Atlas 030 high performance WLCSP test contactors are designed to meet the electrical requirements of today’s testing environment, without sacrificing mechanical performance. Long probe life, combined with improved first pass yields and easy WLCSP probe replacement in test fixtures and probe heads, significantly contributes to a lower cost of test.

The Atlas 030 contact profile is critically important to achieving high bandwidth, low contact resistance, long life and high reliability. The Atlas 030 offers a shorter electrical path, lower capacitance and inductance, and increased tip rigidity with a much greater immunity to breakage than traditional WLCSP probes used in earlier-generation test sockets. The Atlas 030 has 0.310 mm of compliance for bump structures that requires a larger compliance window for reliable contacting in high parallel test applications.

The Atlas 030 contactors are designed to meet standard sizes and footprints. This makes Atlas 030 an efficient and easy to install solution for replacing other WLCSP test sockets in a variety of applications. Atlas 030 supports both manual and automated contacting of WLCSPs. The Atlas 030 combines Multitest’s proprietary precision manufacturing process for producing smooth sub-micron features with an innovative cruciform tip design for optimum electrical and mechanical performance.

Bert Brost, Product Managers, explains: “Spring probes are emerging as the wafer-level chip scale package (WLCSP) contacting technology of choice. Spring probe WLCSP contactors and probe heads provide high bandwidth, low and repeatable contact resistance, with increased compliance and are easily maintained by our customers. The Atlas 030 is our response to the need of our customers for improving mechanical and electrical performance in WLCSP testing without increasing the cost of the interface.”

To learn more about the Multitest Atlas contactor visit http://multitest.com/atlas

Combining Flexibility with High Throughput

atg Luther & Maelzer introduced the highly automated A8a Flying Probe Test System

atg Luther & Maelzer GmbH introduced its new A8a Automatic Bare Board Flying Probe Test System. The A8a provides the flexibility of flying probe test while delivering high throughput.

To achieve high throughput the key feature of the A8a is a new design dual shuttle system, which reduces the product exchange time to zero seconds. In addition to superior test speed of up to 140 measurements per second the A8a provides innovative load /unload and pass / fail sorting for true automatic „lights-out“ operation.

Typical features such as high accuracy Kelvin 4 wire, embedded component and latent defect test are available as well as a tension clamp set up for flexible products.

atg Luther & Maelzer Sales Director for Europe and responsible product manager, Peter Brandt, highlights: “The A8a is atg-LM’s latest innovation in high performance, high accuracy automatic flying probe testing. The A8a can significantly contribute to the profitability of our customers by combining widest flexibility with high throughput.

To learn more about the A8a, please visit http://atg-lm.com/A8a

ECT’s ZIP™ Z0-040 Spring Probe Increased Life by 500% in Head to Head Comparison

Z0-040RHJ High Performance Spring Probe for semiconductor test out performs the competition in a challenging application contacting NiPd pads

Everett Charles Technologies (ECT) successfully won a head-to-head evaluation using Z0-040 probes made with HyperCore™ material in a high volume production environment at a large Asian OSAT. The Z0 probes reached 250k insertions, more than a 500% increase of the probe life compared to the competitor’s spring probe while exceeding first pass yield expectations.

Z0-040RHJ went head to head in an evaluation with another industry leading probe. The customer was in search of a longer lasting probe that would lower total cost of test.  The application required reliable and repeatable contacting of NiPd pads, which are known to be very challenging due to their hardness and abrasiveness. The primary goal of the evaluation was to increase probe life and lower cost of test. The target parameters for success were to exceed 200k insertions while maintaining consistent 1st pass yield performance.

ZIP Z0 probes built from HyperCore present a new level of accuracy, scalability and performance. The proprietary non-plated, homogenous probe material possesses properties that prevent oxidation, ensuring premium performance throughout high volume production cycles. With 600 Knoop hardness, the probe is inert to common wear related to contacting hard, rough surfaces and abrasive cleaning. Additionally, ECT’s patented ZIP Z0 probes feature a number of innovative design features that provide superior contact capability. ZIP Z0 probes have a large internal contact area resulting in low contact resistance, superior bandwidth and excellent conductance.

Tony DeRosa, Senior Product Manager explains: “In applications like this one, our proprietary Hypercore material provides a substantial advantage due to its extraordinary hardness. We are proud that based on the evaluation performance the customer qualified ZIP Z0 for their most challenging applications where DUT pads are comprised of NiPd.  Customer’s production has begun to transfer contactor designs to Z0.

To learn more about ZIP™, please visit http://ect-cpg.com/semiconductor-probes

 

 

Xcerra to Establish Direct Sales and Support Operations for its Semiconductor Test Solutions in Taiwan and China

Growth in China and Taiwan drives strategic realignment of resources

Xcerra announced that it will be establishing a direct sales and support operation for semiconductor test solutions in Taiwan and China. With Xcerra’s business accelerating in the region, especially in China, customers have been requesting a greater direct presence from the company. Our initial response to our customers’ request was the establishment of the Xcerra Development Center (XDC) in Shanghai, China. The XDC is an engineering center intended to establish high level contact between our customers’ and Xcerra’s system level engineers. Xcerra’s operations in Taiwan and China will be expanding to include day-to-day operations in sales and support. This operational change will take place during a twelve month transition period with Spirox Corporation, our current sales channel in the region. Spirox has been a valued partner and will continue to fully support Xcerra’s customers and business during the transition period.

The move to establish direct support for Xcerra’s semiconductor test solutions will expand the company’s existing direct presence in China and Taiwan, for its PCB / PCBA test solutions.

Dave Tacelli, president and chief executive officer, commented, “Spirox has played an important role establishing Xcerra as a major test equipment supplier in Taiwan and China. With that success has come greater demand from customers expecting direct access to Xcerra. This change will enhance Xcerra’s growth opportunities in these critical regions and is expected to improve our profitability once the transition is complete. Xcerra and Spirox are committed to making this change seamless for our customers. ”

For any questions please contact us under customer.relations@xcerra.com

ECT’s BTP/BTLP Series Supports Bead Probe Testing of PCBs

Leveraging ECT’s Expertise and Innovation for this Advanced PCB Test Approach

Everett Charles Technologies (ECT) has developed a series of spring probes, BTP and BPLT, specifically for bead probe test. Combining well-established design and plating principles with an innovative tip design to fully support the special requirements for contacting bead probes.

Spring probes used for bead probe test must be capable of reliable and repeatable positional accuracy to contact the hemi-ellipsoid target shape. Since bead probe structures are sensitive to contamination from solder and other materials, the test probe tip geometry must be sharp to minimize transfer.  Sharp tips also allow for lower spring force probes which can increase mechanical reliability of the test fixture.

ECT has developed an innovative flat and “micro-textured” tip that is optimized for contact to the hemi-ellipsoid shape of bead probes as small as 0.004”.  The textured surface is formed by closely spaced triangular pyramid shapes.  This geometry ensures highly accurate contact of the typical bead probe which is long, but also small in width when placed on a PCB trace.

ECT’s BTP and BTLP probe series leverage the proprietary POGO Plus® design applying the bias ball technology to maintain an excellent internal contact between the barrel and plunger even at the low forces required for bead probe applications.

ECT’s LFRE plating, which is a proven solution for lead-free contacting based on its extreme hardness of 550 to 650 Knoop, ensures a less porous and more durable surface that is less susceptible to solder and material transfer from bead probes.

Tony DeRosa, Product Manager, explains: “With the BTP/BTLP probe series, ECT enables our PCB Test customers applying bead probe technology to significantly improve their first pass yield in high volume applications. We support this technology with OEM’s, contract manufacturers, and test fixture partners.

To learn more, visit http://ect-cpg.com/bead-target-probes

atg Luther & Maelzer to introduce the highly automated A8a Flying Probe Test System at IPC APEX 2017

atg Luther & Maelzer GmbH will introduce its new A8a Automatic Bare Board Flying Probe Test System at IPC APEX EXPO 2017, which is scheduled to take place on February 14 – February 16, 2017 at the Convention Center in San Diego CA.

atg Luther & Maelzer North American Sales Director, Klaus Koziol, highlights: “The A8a is atg-LM’s latest innovation in high performance, high accuracy automatic flying probe testing. The A8a provides the flexibility of flying probe test while delivering high throughput. “

To achieve high throughput the key features of the A8a is a new design dual shuttle system which reduces the product exchange time to zero seconds. In addition to superior test speed of up to 140 measurements per second the A8a provides innovative load /unload and pass / fail sorting for true automatic „lights-out“ operation.

Typical features such as high accuracy Kelvin 4 wire, embedded component and latent defect test are available as well as a tension clamp set up for flexible products.

To learn more about the A8a, please visit http://atg-lm.com/A8a