Entries by Daniela

Expanding MEMS Test Capabilities in the Chinese Market

Xcerra MEMS Test Cell at SITRI for Barometric Pressure Sensors Xcerra, with its recognized industry-leading suite of flexible and cost-effective MEMS test cell offerings, announced today that SITRI, the Shanghai Industrial µTechnology Research Institute, has added barometric pressure sensor test and calibration to its test services offering. SITRI extends its MEMS test capabilities, based on […]

Multitest Successfully Introduced New Super Sharp Gemini Kelvin Probes

Seamless switch to higher-yield probes Multitest recently passed an evaluation of new-super-sharp Gemini Kelvin (GMK) probes. The evaluation took place at an OSAT testing devices for a major customer. Although the customer was not experiencing issues with the original GMK probes, they were encouraged to try the super-sharp probes and saw a measurable improvement in […]

ECT Interposers for Board to Board Connections

Reliable and non-destructive connections for PCBA assemblies or testing ECT interposers are industry-proven solutions for connecting and disconnecting boards in a reliable and non-destructive way. Drawing from its extensive portfolio of spring probes, ECT manufactures interposers that fully meet the electrical requirements of a wide variety of applications.

LTX-Credence Ships the 600th PAx Test System for Testing RF Front End Devices

PAx and PAx-ac systems continue as the market leader for RF front end device testing LTX-Credence shipped the 600th PAx test system to Skyworks Solutions, Inc., an innovator of high performance analog semiconductors connecting people, places and things. The PAx platform has been specifically designed to address the high volume manufacturing test challenges of suppliers […]

ECT Launches New Probe for High Performance RF Signal Testing of PCBAs

The ECT CSP-30TS-011 has been designed to perfectly mate with PCBA test pads and vias Everett Charles Technologies (ECT) recently added the CSP-30TS-011 to its industry-proven portfolio of high frequency probes for the PCBA test market. This next generation coaxial probe provides instrumentation-quality interface for broadband RF measurements exceeding 20GHz, delivering superior performance while seamlessly […]

Multitest MiCon® Contactor: Advantages of Cantilever Design for MCU and ASIC Testing

Significant Improvements in Overall Equipment Efficiency (OEE) Multitest recently launched the MiCon contactor. The MiCon leverages the industry-proven Cantilever technology for the final test of Microcontrollers, Industrial DSPs and Application Specific ICs. Evaluations at customer test floors showed substantial improvements in first pass yield, life span and cleaning cycles compared to spring pin solutions. MiCon […]

Multitest Atlas Contactor Demonstrates Advanced Electrical and Mechanical Performance in WLCSP Testing

Atlas 0.3 mm pitch spring probe validated at customer site Multitest’s new 0.3 mm pitch Atlas contactor successfully passed a demanding customer production floor evaluation. The customer’s evaluation measures confirmed that the Atlas did reduce the customer’s cost of test while improving test yield and increasing throughput. Based on the evaluation results, the customer ordered […]