Entries by Daniela

ECT’s ZIP™ Probe for Semiconductor Test Exceeds Customer Expectations

ZIP probes built from HyperCore™ base material proved superior performance in high volume production Everett Charles Technologies (ECT) successfully passed a two month evaluation of ZIP probes using the HyperCore material option in a high volume production environment at a large OSAT in Singapore. The ZIP probe exceeded the critical first pass yield expectations and […]

Offset Vertical Probe with Scrub Design for Best Test Yield and Lowest Cost of Test

Multitest Adds Link Contactor to Its Interface Products Portfolio Multitest has launched the new Link Contactor product line for analog, mixed signal, and RF applications. The innovative vertical probe design combines advantageous mechanical features – such as self-cleaning and scrub – with superior electrical performance and an architecture that eliminates wear on test interface board […]

Multitest Adds Link Contactors to Its Interface Products Portfolio

Offset Vertical Probe with Scrub Design for Best Yield and Lowest Cost of Test Multitest has launched the new Link Contactor product line for analog, mixed signal, and RF applications. The innovative vertical probe design combines advantageous mechanical features – such as self-cleaning and scrub – with superior electrical performance and an architecture that eliminates […]

InCarrier plus Dedicated to High Volume Production

Multitest launches the next generation loader for test in carriers Multitest is launching the first InCarrierplus with the shipment to a major IDM with high volume production in Europe and Asia. The InCarrierplus is the new state-of-the art loading solution for test in carriers. It is designed to optimize the back-end process at high volume […]

High Volume Test and Calibration of Barometric Sensors

Multitest InBaro confirmed as platform of choice Multitest successfully introduced a new solution to their MEMS test and calibration portfolio: Multitest InBaro for high parallel test of barometric sensors. During a benchmark evaluation at a major European semiconductor manufacturer the InBaro specification outperformed the competition and was selected as the standard platform for test and […]