Entries by Daniela

LFRE Plated Probes: Substantial Improvement of Test Cell Uptime on PCBA In-circuit Test Applications

ECTs proprietary LFRE plating has been proven to significantly extend probe life and time between cleaning cylces Everett Charles Technologies (ECT) has proven the exceptional performance of LFRE spring probe products in a challenging evaluation at a major automotive electronics supplier with global manufacturing facilities. The ECT LFRE probes, which were used in an in-circuit […]

New ECT Accordion™ Technology Provides Reliable Contact in Harsh Environments

Patented interconnect solution offers unprecedented cost and reliability advantages for high insertion count applications Everett Charles Technologies (ECT) has been supplying spring probes for over 50 years. ECT leverages this industry leading experience for unique, customer focused solutions to the most challenging connector requirements. Accordion™ is a patented contact technology from ECT that targets high […]

Bringing MEMS Testing to the Next Level

Installation of first complete Xcerra turn-key test cell for MEMS in Asia Xcerra finalized the installation of a complete test cell for 3/6DOF inertial and navigation MEMS applications at an Asian customer. The test cell leverages proven Xcerra expertise in highly parallel test of sensor devices, delivered through the LTX-Credence and Multitest semiconductor test brands. […]

Meeting the Challenges of Cost-Efficient Testing High-End Digital Devices

Everett Charles Technologies introduces new member of the ZIP probes family: Z-080YHJ Everett Charles Technologies (ECT) launched a new member of the versatile ZIP™ semiconductor test probe family. The Z-080YHJ is designed to meet the many challenges associated with testing High End Digital (HED) devices. ZIP probes are a cost effective solution that provide excellent […]

Bringing MEMS Testing to the Next Level

Installation of first complete Xcerra turn key test cell for MEMS in Asia Xcerra finalized the installation of a complete test cell for 3/6DOF inertial and navigation MEMS applications at an Asian customer. The test cell leverages proven Xcerra expertise in highly parallel test of sensor devices, delivered through the LTX-Credence and Multitest semiconductor test […]

High Current meets Strip Test: Multitest launches HC Contactor for high parallel test

Multitest announces that its new high power Kelvin contactor for strip test successfully passed a long term evaluation for a high volume automotive application at an Asian manufacturing site of a global IDM. The outstanding yield and contactor pin lifespan enable extraordinary OEE (overall equipment efficiency) and a lower overall cost of test. The evaluation […]

Enabling Test for High Voltage Applications

MT9510 pick and place handler for testing up to 10 kV Rosenheim (Germany), August 2015: Multitest has shipped the first MT9510 pick and place handler for testing high voltage applications up to 10 kV (peak). A complete solution can be provided through Multitest’s Plug & Yield program which includes a Multitest high power contactor. The […]

Reliable Probes for Most Challenging High Current Testing

Everett Charles Technologies Introduces HC500F High Current Probe Everett Charles Technologies (ECT) introduces the latest addition to our versatile family of high current probes; the HC500F. The HC500F is rated at 150 Amps DC and is designed for the most challenging applications in a broad range of industrial test applications including transportation, automotive, power grid, […]

Lowering Cost of Test by Reuse of Test Interfaces

Multitest’s MT9510 offers new contact site layouts Multitest’s well-established MT9510 tri-temp pick and place handler is now available with various site pitch layouts, which are compatible with major standard handlers in the market. The new site pitch layouts enable to customer to re-use existing loadboards from other handling equipment for applications on the MT9510. The […]