Entries by Daniela

LTX-Credence – Supplier of Choice for Testing IoT Devices

Nordic Semiconductor Selects the Diamondx for IoT Device Testing LTX-Credence today announced that Nordic Semiconductor, a company that specializes in ultra-low power (ULP) 2.4GHz transceivers, notably for the Bluetooth Smart and wearables segments, has selected Xcerra’s LTX-Credence Diamondx for high volume production test of their Internet of Things (IoT) products. Nordic will use the Diamondx […]

Combining Speed with Automation:

atg Luther & Maelzer launches the A8-16a – a new automation version of the ultra fast A7/A8 linear motor technology atg Luther & Maelzer releases the A8-16a, which combines the speed of the 16 probe system A8-16 with the well-known and market established automation of the A7a. The A8-16a addresses the test and productivity requirements […]

One Insertion for Testing at Multiple Set Temperatures

Multitest MT2168 Pick-and-Place Handler offers multi-temperature testing within one plunger cycle The Multitest MT2168 pick-and-place handler now offers multi-temperature test with only one insertion. The highly dynamic temperature control allows for testing at multiple set temperatures within one plunger cycle. This new feature particularly addresses the requirements in design and engineering sites. The fast and […]

Conversion Kit Design Makes a Difference

Multitest launches local kit design team in the Philippines Multitest makes a significant step to expand customer support. Starting May 2015 an additional design team for conversion kits will be supporting the needs of Asian customers. The local design team based in the Philippines will be the expert contact for kit related requests of customers […]

ECT’s Launches New Probe Family for RF Signal Testing of PCBAs and Industrial Applications

CSP-40 significantly reduces cost per insertion with best best electrical performance at competitive pricing Everett Charles Technologies (ECT) recently launched a new line of high frequency test probes for the PCBA and industrial test markets. The CSP-40 high frequency probe family offers high reliability and excellent electrical performance at competitive pricing and significantly reduces the […]

ECT’s ZIP™ Probe for Semiconductor Test Exceeds Customer Expectations

ZIP probes built from HyperCore™ base material proved superior performance in high volume production Everett Charles Technologies (ECT) successfully passed a two month evaluation of ZIP probes using the HyperCore material option in a high volume production environment at a large OSAT in Singapore. The ZIP probe exceeded the critical first pass yield expectations and […]

Offset Vertical Probe with Scrub Design for Best Test Yield and Lowest Cost of Test

Multitest Adds Link Contactor to Its Interface Products Portfolio Multitest has launched the new Link Contactor product line for analog, mixed signal, and RF applications. The innovative vertical probe design combines advantageous mechanical features – such as self-cleaning and scrub – with superior electrical performance and an architecture that eliminates wear on test interface board […]

Multitest Adds Link Contactors to Its Interface Products Portfolio

Offset Vertical Probe with Scrub Design for Best Yield and Lowest Cost of Test Multitest has launched the new Link Contactor product line for analog, mixed signal, and RF applications. The innovative vertical probe design combines advantageous mechanical features – such as self-cleaning and scrub – with superior electrical performance and an architecture that eliminates […]