Entries by Daniela

Xcerra™ to present at Semicon Europa 2014

The new brand in the electronics supply chain dedicated to your success Xcerra Corporation announces that Peter Cockburn, Senior Product Manager of Test Cell Innovation, will give a presentation at the upcoming Semicon Europa trade show, scheduled to take place October 7-9 in Grenoble, France. Peter will present “Using a Test-Cell-Solution Approach to Achieve Device […]

Everett Charles Technologies Releases HyperCore™ Material to Full ZIP™ Probe Product Line

Premium Performance for Semiconductor Test Based on Superior Probe Material Everett Charles Technologies (ECT) releases the HyperCore™ material to the full ZIP™ product line. ZIP™ is an ECT single probe family that is dedicated to semiconductor test applications. HyperCore™ is an innovative, non-plated and homogenous probe material optimized for longer probe life, longer cleaning cycles […]

Cost-efficient Fine Pitch Load Boards Meet Market Needs

Multitest PCBs are leading the way for 0.3 mm pitch array applications Multitest has again increased its lead over the competition for fine pitch load boards. Advancements in proprietary plating processes along with new technology in drilling and registration techniques ensure reliability, short cycle times and low cost. Multitest has responded to the needs of […]

Strip Test for Automotive Applications

European IDM selected Multitest InStrip for high parallel test in automotive production Multitest InStrip® test handler has been already well-established at a number of different customers in Asia, Europe and US. Recently, Multitest received a multiple order from European IDM that will leverage the high-parallel test capability for standard SOCs for the automotive market. In […]

Everett Charles Technologies Expands Line of Battery Probes

CP-2 probe family combines best volume production qualities and cost with design flexibility and fast prototype Everett Charles Technologies (ECT) recently launched the next generation of Battery Interconnect Probes. The versatile CP-2 probe family is highly flexible and designed to match any performance, cost and assembly requirements. CP-2 probes support many charging and docking applications […]

“Seeking Growth” the topic of the panel discussion at Semicon West:

Xcerra Meets Current Trends in the Semiconductor Business with a Most Comprehensive Approach The semiconductor test and packaging industry segment is being driven by adoption of increased integration, advanced packaging, and adaptive test. Well-balanced and innovative strategies will be needed to ensure further productivity gains at the semiconductor manufacturers. Equipment suppliers have to reconsider both […]

Internet of Things: Are new test strategies needed?

The Internet of Things (loT) seems to be on a good growth trajectory. Novel sensor devices for the end nodes, combinations thereof are launched every month. Successful test strategies need to ensure that the new sensors devices will be tested and calibrated efficiently. Sensor test typically includes providing a defined stimulus signal while the device […]

Fastest Availability Guaranteed – Spring Probe Supply for Today’s Fast Pace Business

Everett Charles Technologies establishes advanced inventory stocking program for standard spring probes Everett Charles Technologies (ECT) has established an advanced inventory stocking program for standard spring probes to ensure supply chain reliability and flexibility. ECT fully recognized their customers need to shorten product development times and to react promptly to changing demand. With this new […]

Xcerra™ CTO, Dr. Reinhart Richter to Present at Test Vision 2020

“Does the Internet of Things force us to rethink our test strategies?” Xcerra™ Corporation today announced that Dr. Reinhart Richter will present at the upcoming Test Vision 2020 conference, scheduled to take place July 9 and 10 in San Francisco. The presentation will be held in the “loT Related Subjects” session on Thursday, July 10 […]