Entries by Daniela

Xcerra Test Cell Qualified for Barometric Test at Major European IDM

Optimized for high yield, low cost and greatest flexibility Xcerra continues to expand its TCI (Test Cell Innovation) customer base after completing a qualification at a major European IDM for a fully integrated and prevalidated test cell for barometric sensor test. The solution consists of a Multitest InStrip handler with InBaro module, an LTX-Credence Diamondx […]

Increasing Test Cell Throughput:

Multitest adds “Super-Sharp” option to Quad Tech probes Multitest’s Super-Sharp Option for Quad Tech probes provides an increase in test cell throughput and maintains the fidelity of the test signal over longer uninterrupted run times for higher yields. Multitest makes these advantages available to customers at no additional cost.

ECT Introduces New Tools to Its Robust E-Commerce Website

Search Competitor Parts, Download Specs, CAD drawings, ISO and Order Probes In the past 12 months ECT has provided multiple new tools to its e-commerce website (shop.ect-cpg.com) including: a competitor cross reference tool; revamped search functionality; the ability to download ISO, mechanical, CAD drawings, and probe/tip replacement instructions; and a new shopping cart to make […]

ECT’s Switch Probes: Cost-Efficient Solutions for Testing Electronic Assemblies

ECT switch probes are cost effective and reliable solutions for non-destructive testing to verify the presence of components or contact leads within a connector assembly. ECT offers proven off-the-shelf options and a large portfolio of custom switch probes. ECT’s experience and design standards combined with its knowledge of materials and platings allows for the quick […]

Multitest’s Unique Interface Solution for Ultra-High Frequency Testing Delivers Unprecedented Life-Time in Volume Production

mmWave customer case presented at Test Vision Multitest’s mmWave contactor is a proven broadband production solution for RF applications up to 100 GHz. In a presentation by Jeffrey Finder, Senior Product and Test Engineering Manager at NXP, named “Building a Test Ecosystem for High Volume Manufacturing of 76-81 GHz Semiconductor Radar Sensors” the repeatable and […]

WLCSP Test: Efficient High Volume Solution for Post-Saw Testing

Multitest InWaferX for final test of singulated WLCSPs Multitest’s new InWaferX final test solution for singulated WLCSPs addresses the increased quality demand for automotive applications as these quality requirements are expanding to cost sensitive, high volume consumer applications. Based on the production proven InCarrier technology, InWaferX ensures highest efficiency and yield for lowest cost of […]

ECT’s Comprehensive Portfolio of Receptacles Offer Flexibility in PCB Test Fixture Design

ECT receptacles combine industry proven technical features with optimized cost ECT leverages its industry leading experience in probe and receptacle design and manufacture to provide cost-effective and reliable customer-focused solutions for the most challenging ICT and FT applications. ECT receptacles allow for rapid replacement of spring probes without disrupting wiring. ECT’s comprehensive offering of receptacles […]