Optimized for high yield, low cost and greatest flexibility Xcerra continues to expand its TCI (Test Cell Innovation) customer base after completing a qualification at a major European IDM for a fully integrated and prevalidated test cell for barometric sensor test. The solution consists of a Multitest InStrip handler with InBaro module, an LTX-Credence Diamondx […]
This author has yet to write their bio.Meanwhile lets just say that we are proud Daniela contributed a whooping 139 entries.
Entries by Daniela
Multitest adds “Super-Sharp” option to Quad Tech probes Multitest’s Super-Sharp Option for Quad Tech probes provides an increase in test cell throughput and maintains the fidelity of the test signal over longer uninterrupted run times for higher yields. Multitest makes these advantages available to customers at no additional cost.
Search Competitor Parts, Download Specs, CAD drawings, ISO and Order Probes In the past 12 months ECT has provided multiple new tools to its e-commerce website (shop.ect-cpg.com) including: a competitor cross reference tool; revamped search functionality; the ability to download ISO, mechanical, CAD drawings, and probe/tip replacement instructions; and a new shopping cart to make […]
ECT switch probes are cost effective and reliable solutions for non-destructive testing to verify the presence of components or contact leads within a connector assembly. ECT offers proven off-the-shelf options and a large portfolio of custom switch probes. ECT’s experience and design standards combined with its knowledge of materials and platings allows for the quick […]
New Generation Flying Probe Test and Innovative Grid Test Equipment atg Luther & Maelzer will exhibit its leading test solutions for PCBs at the upcoming HKPCA & IPC 2017 show scheduled to take place on December 6 – 8, 2017 at the Shenzhen Convention & Exhibition Center, China.
mmWave customer case presented at Test Vision Multitest’s mmWave contactor is a proven broadband production solution for RF applications up to 100 GHz. In a presentation by Jeffrey Finder, Senior Product and Test Engineering Manager at NXP, named “Building a Test Ecosystem for High Volume Manufacturing of 76-81 GHz Semiconductor Radar Sensors” the repeatable and […]
Multitest InWaferX for final test of singulated WLCSPs Multitest’s new InWaferX final test solution for singulated WLCSPs addresses the increased quality demand for automotive applications as these quality requirements are expanding to cost sensitive, high volume consumer applications. Based on the production proven InCarrier technology, InWaferX ensures highest efficiency and yield for lowest cost of […]
Leading solutions fully automated test of bare boards atg Luther & Maelzer will exhibit the new fully automated A8a flying probe test solution at the upcoming Productronica Show scheduled to take place November 14 – 17, 2017 in Munich, Germany.
ECT receptacles combine industry proven technical features with optimized cost ECT leverages its industry leading experience in probe and receptacle design and manufacture to provide cost-effective and reliable customer-focused solutions for the most challenging ICT and FT applications. ECT receptacles allow for rapid replacement of spring probes without disrupting wiring. ECT’s comprehensive offering of receptacles […]
Leading test solutions for bare boards and substrates atg Luther & Maelzer will exhibit the new A8a flying probe test solution as well as, the high speed substrate test solution, S3-8, at the upcoming TPCA Show scheduled to take place October 25 – 27, 2017 at the Nangang Exhibition Center in Taipei, Taiwan.