Multitest’s Unique Interface Solution for Ultra-High Frequency Testing Delivers Unprecedented Life-Time in Volume Production

mmWave customer case presented at Test Vision

Multitest’s mmWave contactor is a proven broadband production solution for RF applications up to 100 GHz. In a presentation by Jeffrey Finder, Senior Product and Test Engineering Manager at NXP, named “Building a Test Ecosystem for High Volume Manufacturing of 76-81 GHz Semiconductor Radar Sensors” the repeatable and stable performance of mmWave contactor was highlighted for an Automotive Radar Sensor Chipset application. This presentation was given at the Test Vision 2020 workshop at Semicon West in July 2017.
(Download the full presentation here: Download)

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WLCSP Test: Efficient High Volume Solution for Post-Saw Testing

Multitest InWaferX for final test of singulated WLCSPs

Multitest’s new InWaferX final test solution for singulated WLCSPs addresses the increased quality demand for automotive applications as these quality requirements are expanding to cost sensitive, high volume consumer applications. Based on the production proven InCarrier technology, InWaferX ensures highest efficiency and yield for lowest cost of test.

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atg Luther & Maelzer to exhibit at Productronica 2017

Leading solutions fully automated test of bare boards

atg Luther & Maelzer will exhibit the new fully automated A8a flying probe test solution at the upcoming Productronica Show scheduled to take place November 14 – 17, 2017 in Munich, Germany.

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ECT’s Comprehensive Portfolio of Receptacles Offer Flexibility in PCB Test Fixture Design

ECT receptacles combine industry proven technical features with optimized cost

ECT leverages its industry leading experience in probe and receptacle design and manufacture to provide cost-effective and reliable customer-focused solutions for the most challenging ICT and FT applications. ECT receptacles allow for rapid replacement of spring probes without disrupting wiring. ECT’s comprehensive offering of receptacles provides customers with fixture design flexibility that results in an optimal product for their customers.

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atg Luther & Maelzer to exhibit at TPCA Show 2017

Leading test solutions for bare boards and substrates

atg Luther & Maelzer will exhibit the new A8a flying probe test solution as well as, the high speed substrate test solution, S3-8, at the upcoming TPCA Show scheduled to take place October 25 – 27, 2017 at the Nangang Exhibition Center in Taipei, Taiwan.

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